Patent US3975252A successfully refreshed from Google Patents.
US3975252A
Expired / Lapsed
US
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High-resolution sputter etching
Assignee: AT&T Inc
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Filing: 1975-03-14
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Granted: 1976-08-17
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Expires: 1995-03-14
Abstract
Abstract High-resolution sputter etching of a relatively thick layer (of, for example, gold) by directly utilizing a relatively thin layer of resist as a sputter-etching mask is often not feasible. In such a case, it is known to use a sputter-etching mask made of an etch-resistant material such as titanium interposed between the resist and the relatively thick layer. In accordance with the invention, patterning of the titanium is achieved by a technique of sputter etching in a halocarbon atmosphere.
Inventors
- 👤 David Bruce Fraser
- 👤 David Yuan Kong Lou
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 13:54
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/22; G03F7/00; G03F7/004; G03F7/09; G03F7/094; H; H10; H10P; H10P50/00; H10P50/71
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
117 words
A method adapted for patterning a layer on which is disposed an intermediate masking layer, said intermediate masking layer having disposed thereon a pattern of resist material that exposes selected surface portions of said intermediate masking layer, said method comprising the step of sputter etching said intermediate masking layer in a halocarbon atmosphere to form in said intermediate layer a pattern corresponding to that defined by said resist material, said method comprising the additional step of sputter etching said layer to be patterned through said intermediate mask to form in said layer to be patterned a pattern corresponding to that defined by said resist material, wherein said second-mentioned sputter-etching step is carried out in an oxidizing atmosphere.
Claim 2
Independent Claim
117 words
A method adapted for patterning a layer on which is disposed an intermediate masking layer, said intermediate masking layer having disposed thereon a pattern of resist material that exposes selected surface portions of said intermediate masking layer, said method comprising the step of sputter etching said intermediate masking layer in a halocarbon atmosphere to form in said intermediate layer a pattern corresponding to that defined by said resist material, said method comprising the additional step of sputter etching said layer to be patterned through said intermediate mask to form in said layer to be patterned a pattern corresponding to that defined by said resist material, wherein said second-mentioned sputter-etching step is carried out in an oxidizing atmosphere.
Claim 3
Dependent Claim
44 words
A method as in claim 1 wherein said halocarbon atmosphere consists of an essentially pure halocarbon atmosphere that is capable of ionic dissociation in said chamber and of chemically reacting with material of the intermediate masking layer to form volatile compounds in said chamber.
Claim 4
Dependent Claim
45 words
A method as in claim 2 wherein said halocarbon atmosphere consists of a halocarbon selected from the group consisting of C m Cl n F 2m +2 -n and C m HCl n F 2m +1 -n , where m and n are positive integers.
Claim 5
Dependent Claim
15 words
A method as in claim 2 wherein said haocarbon atmosphere consists of CCl 4 .
Claim 6
Dependent Claim
22 words
A method as in claim 4 wherein said CCl 4 is established at a pressure in the range of approximately 0.1-50 milliTorr.
Claim 7
Dependent Claim
24 words
A method as in claim 1 wherein said halocarbon atmosphere comprises a gaseous mixture of a halocarbon and an inert or substantially inert gas.
Claim 8
Dependent Claim
27 words
A method as in claim 6 wherein said inert or substantially inert gas is selected from the group consisting of argon, helium, krypton, neon, xenon and nitrogen.
Claim 9
Dependent Claim
41 words
A method as in claim 1 wherein said halocarbon atmosphere consists of an essentially pure halocarbon atmosphere that is capable of ionic dissociation and of chemically combining with species from said intermediate masking layer to form volatile compounds in said chamber.
Claim 10
Dependent Claim
45 words
A method as in claim 8 wherein said halocargon atmosphere consists of a halocarbon selected from the group consisting of C m Cl n F 2m +2 -n and C m HCl n F 2m +1 - , where m and n are positive integers.
Claim 11
Dependent Claim
15 words
A method as in claim 8 wherein said halocarbon atmosphere consists of CCl 4 .
Claim 12
Dependent Claim
23 words
A method as in claim 10 wherein said CCl 4 atmosphere is established at a pressure in the range of approximately 0.1-50 milliTorr.
Claim 13
Dependent Claim
24 words
A method as in claim 1 wherein said halocarbon atmosphere comprises a gaseous mixture of a halocarbon and an inert or substantially inert gas.
Claim 14
Dependent Claim
27 words
A method as in claim 12 wherein said inert or substantially inert gas is selected from the group consisting of argon, helium, krypton, neon, xenon and nitrogen.
Claim 15
Independent Claim
127 words
A method for defining a high-resolution pattern in a relatively thick layer of a multilayer structure that comprises a substrate, the relatively thick layer being deposited on said substrate, a relatively thin intermediate masking layer deposited on said relatively thick layer, and a relatively thin layer of resist material deposited on said intermediate masking layer, said method comprising the steps of defining a pattern in said resist material to expose selected surface portions of said intermediate masking layer, sputter etching the exposed portions of said intermediate masking layer in a halocarbon atmosphere to expose selected surface portions of said relatively thick layer, and sputter etching the exposed portions of said relatively thick layer in an oxidizing atmosphere to form a high-resolution pattern in said relatively thick layer.
Claim 16
Independent Claim
127 words
A method for defining a high-resolution pattern in a relatively thick layer of a multilayer structure that comprises a substrate, the relatively thick layer being deposited on said substrate, a relatively thin intermediate masking layer deposited on said relatively thick layer, and a relatively thin layer of resist material deposited on said intermediate masking layer, said method comprising the steps of defining a pattern in said resist material to expose selected surface portions of said intermediate masking layer, sputter etching the exposed portions of said intermediate masking layer in a halocarbon atmosphere to expose selected surface portions of said relatively thick layer, and sputter etching the exposed portions of said relatively thick layer in an oxidizing atmosphere to form a high-resolution pattern in said relatively thick layer.
Claim 17
Dependent Claim
31 words
A method as in claim 14 wherein said resist material comprises an electron resist material and wherein said defining step comprises defining a pattern in said resist material by electron lithography.
Claim 18
Dependent Claim
54 words
A method as in claim 15 wherein said intermediate masking layer comprises a material which, when sputtered in said halocarbon atmosphere, combines with the halocarbon atmosphere to form a volatile halide compound and which, when sputterd in said oxidizing atmosphere, forms an etch-resistant oxide film on the surface portions of said intermediate masking layer.
Claim 19
Dependent Claim
63 words
A method as in claim 16 wherein said intermediate masking layer comprises a material selected from the group consisting of titanium, nickel, chromium, silicon, germanium and aluminum, and wherein a relatively thin layer of this same material is interposed between said relatively thick layer and said substrate, said method comprising the further step of sputter etching said interposed layer in a halocarbon atmosphere.
Claim 20
Dependent Claim
44 words
A method as in claim 14 wherein said halocarbon atmosphere comprises a gas selected from the group consisting of C m Cl n F 2m +2 - and C m HCl n F 2m +1 -n , where m and n are positive integers.
Claim 21
Independent Claim
137 words
A method for fabricating an x-ray mask structure by defining a high-resolution pattern in a relatively thick x-ray transparent substrate, the relatively thick layer being deposited on said substrate, a relatively thin masking layer deposited on said relatively thick layer, and a relatively thin layer of electron resist material deposited on said x-ray absorptive layer, said method comprising the steps of defining a pattern in said electron resist material to expose selected surface portions of said intermediate masking layer, sputter etching the exposed portions of said intermediate masking layer in a carbon tetrachloride atmosphere to expose selected surface portions of said relatively thick x-ray-absorptive layer, and sputter etching the exposed portions of said relatively thick x-ray-absorptive layer in an oxidizing atmosphere to form a high-resolution x-ray-absorptive pattern in said relatively thick layer deposited on said x-ray-transparent substrate.
Claim 22
Independent Claim
137 words
A method for fabricating an x-ray mask structure by defining a high-resolution pattern in a relatively thick x-ray transparent substrate, the relatively thick layer being deposited on said substrate, a relatively thin masking layer deposited on said relatively thick layer, and a relatively thin layer of electron resist material deposited on said x-ray absorptive layer, said method comprising the steps of defining a pattern in said electron resist material to expose selected surface portions of said intermediate masking layer, sputter etching the exposed portions of said intermediate masking layer in a carbon tetrachloride atmosphere to expose selected surface portions of said relatively thick x-ray-absorptive layer, and sputter etching the exposed portions of said relatively thick x-ray-absorptive layer in an oxidizing atmosphere to form a high-resolution x-ray-absorptive pattern in said relatively thick layer deposited on said x-ray-transparent substrate.
Claim 23
Dependent Claim
13 words
A method as in claim 19 wherein said intermediate masking layer comprises titanium.
References Cited (Backward Citations)
US3477936A
Cited
US3615956A
Cited
US3649503A
Cited
US3836446A
Cited
US3795557A
Cited
US3940506A
Cited
US3880684A
Cited
US3923568A
Cited
US3918149A
Cited
US3930913A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-08-17 | 1980-02-16 | 1980-08-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-08-17 | 1984-02-16 | 1984-08-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-08-17 | 1988-02-16 | 1988-08-17 | $7700.00 | Window Closed / Lapsed |