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US3149395A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making a varactor diode by epitaxial growth and diffusion

Assignee: AT&T Inc
•
Filing: 1960-09-20
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Granted: 1964-09-22
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Expires: 1980-09-20
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Abstract

No abstract record available.

Inventors

  • 👤 Anthony R Bray
  • 👤 Kahng Dawon

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 18:15
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/62; H10D1/64; C; C30; C30B; C30B31/00; C30B31/02; H10D62/00; H10D62/10; H10D62/60; H10D99/00; H10F; H10F71/00; H10P; H10P32/00; H10P95/00; Y; Y10; Y10S; Y10S148/00; Y10S148/007; Y10S148/037; Y10S148/115; Y10S148/151; Y10S438/00; Y10S438/914; Y10S438/916

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 130 words
THE PROCESS OF FABRICATING A VARACTOR DIODE COMPRISING THE STEPS OF FORMING ON A SURFACE PORTION OF A SEMICONDUCTIVE WAFER A DIFFUSANT-RICH LAYER, THE DIFFUSANT HAVING A CONDUCTIVITY-TYPE DETERMINING CHARACTERISTIC OPPOSITE THAT OF THE DOPING IMPURITY PREDOMINANT IN THE ADJACENT PORTION OF THE WAFER, THE DIFFUSANT HAVING A DIFFUSION CONSTANT LARGER THANT THAT OF SAID DOPING IMPURITY AND THE CONCENTRATION OF SAI DIFFUSANT IN SAID LAYER BEING LOWER THAN THAT OF SAID DOPING IMPURITY IN SAID ADJACENT PORTION, GROWING A HIGH RESISTIVITY EPITAXIAL FILM OVER SAID DIFFUSANT-RICH SURFACE PORTION, THE DIFFUSANT DIFFUSING FURTHER INTO SAID FILM THAN SAID DOPANT WHEREBY THERE IS FORMED IN THE EPITAXIAL FILM A RETROGRADED JUNCTION CHARACTERIZED BY A SHARPLY DECREASING CONCENTRATION OF THE DIFFUSANT WITH INCREASING DISTANCE AWAY FROM THE JUNCTION INTO THE EPITAXIAL FILM.
Claim 2
Dependent Claim 130 words
THE PROCESS OF FABRICATING A VARACTOR DIODE COMPRISING THE STEPS OF FORMING ON A SURFACE PORTION OF A SEMICONDUCTIVE WAFER A DIFFUSANT-RICH LAYER, THE DIFFUSANT HAVING A CONDUCTIVITY-TYPE DETERMINING CHARACTERISTIC OPPOSITE THAT OF THE DOPING IMPURITY PREDOMINANT IN THE ADJACENT PORTION OF THE WAFER, THE DIFFUSANT HAVING A DIFFUSION CONSTANT LARGER THANT THAT OF SAID DOPING IMPURITY AND THE CONCENTRATION OF SAI DIFFUSANT IN SAID LAYER BEING LOWER THAN THAT OF SAID DOPING IMPURITY IN SAID ADJACENT PORTION, GROWING A HIGH RESISTIVITY EPITAXIAL FILM OVER SAID DIFFUSANT-RICH SURFACE PORTION, THE DIFFUSANT DIFFUSING FURTHER INTO SAID FILM THAN SAID DOPANT WHEREBY THERE IS FORMED IN THE EPITAXIAL FILM A RETROGRADED JUNCTION CHARACTERIZED BY A SHARPLY DECREASING CONCENTRATION OF THE DIFFUSANT WITH INCREASING DISTANCE AWAY FROM THE JUNCTION INTO THE EPITAXIAL FILM.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1967-09-22 1968-03-23 1968-09-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1971-09-22 1972-03-23 1972-09-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1975-09-22 1976-03-23 1976-09-22 $7700.00 Window Closed / Lapsed

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