Semiconductor substrate

Claim 2

A semiconductor substrate, comprising a single-crystal semiconductor material having a planar surface and an island of the semiconductor material projecting from the surface forming a projecting region at an edge of said semiconductor material and an insulating film having an opening for cooperating with the projecting region to form a smooth surface with the top of the projecting semiconductor material at substantially the same level as the surface of the remainder of the insulating film and a single-crystal semiconductor film across the top of the projecting region and the insulating film.

Claim 3

The semiconductor substrate of claim 1, wherein the projecting region is integrally formed from the semiconductor material.

Claim 4

The semiconductor substrate of claim 1, further including a base, the projecting region formed on the base and the insulating film formed .[.on.]. .Iadd.over .Iaddend.the base.

Claim 5

The semiconductor substrate of claim 3, wherein the base is a single-crystal semiconductor material in contact with the projecting region of a single-crystal semiconductor material.

Claim 6

The semiconductor substrate of claim 3, wherein the base is an insulating substrate and the projection region of single-crystal semiconductor material is a seed material.

Claim 7

The semiconductor substrate of claims 4 or 5, wherein the projecting semiconductor material is a single-crystal silicon and the insulating film is one of an SiO 2 film an Si 3 N 4 film and a combination of one layer of SiO 2 and one layer of Si 3 N 4 .

Claim 8

A semiconductor substrate, comprising an insulating plate, a projecting region of single-crystal semiconductor material disposed on the plate at the edge thereof a single-crystal semiconductor film across the surface of the projecting region and the insulating substrate, and an insulating film on the single-crystal semiconductor film.

Claim 9

A semiconductor substrate, comprising an insulating plate, a projecting region of single-crystal semiconductor material disposed on the plate at the edge thereof a single-crystal semiconductor film across the surface of the projecting region and the insulating substrate, and an insulating film on the single-crystal semiconductor film.

Claim 10

The semiconductor substrate of claim 7, wherein the projecting semiconductor material is a single-crystal silicon and the insulating film is one of an SiO 2 film an Si 3 N 4 film and a combination of one layer of SiO 2 and one layer of Si 3 N 4 . .Iadd.

Claim 11

A semiconductor substrate, comprising a single-crystal semiconductor material having a planar surface and an island of the semiconductor material projecting from the surface forming a projecting region and an insulating film having an opening for cooperating with the projecting region to form a smooth surface with the top of the projecting semiconductor material at substantially the same level as the surface of the remainder of the insulating film and a single-crystal semiconductor film across the top of the projecting region and the insulating film, the projecting region disposed at an edge of said single-crystal semiconductor film. .Iaddend. .Iadd.10. The semiconductor substrate of claim 9, wherein the projecting region is integrally formed from the semiconductor material. .Iaddend. .Iadd.11. The semiconductor substrate of claim 9, further including a base, the projecting region formed on the base and the insulating film formed over the base. .Iaddend. .Iadd.12. The semiconductor substrate of claim 11, wherein the base is a single-crystal semiconductor material in contact with the projecting region of a single-crystal semiconductor material. .Iaddend. .Iadd.13. The semiconductor substrate of claim 11, wherein the base is an insulating substrate and the projection region of single-crystal semiconductor material is a seed material. .Iaddend. .Iadd.14. The semiconductor substrate of claims 12 or 13, wherein the projecting semiconductor material is a single-crystal silicon and the insulating film is one of an SiO 2 film an Si 3 N 4 film and a combination of one layer of SiO 2 and one layer of Si 3 N 4 . .Iaddend. .Iadd.15. A semiconductor substrate, comprising an insulating material a projecting region of single-crystal semiconductor material, a single-crystal semiconductor film across the surface of the projecting region and the insulating material, and an insulating film on the single-crystal semiconductor film, said projecting region disposed at an edge of the single-crystal semiconductor film. .Iaddend. .Iadd.16. The semiconductor substrate of claim 15, wherein the projecting semiconductor material is a single-crystal silicon and the insulating film is one of an SiO 2 film an Si 3 N 4 film and a combination of one layer of SiO 2 and one layer of Si 3 N 4 . .Iaddend.