Illumination optimization for specific mask patterns

Claim 3

A method as in claim 1 , wherein the determining further comprises: determining a characteristic pitch of the selected mask pattern.

Claim 4

A method as in claim 2 , further comprising: identifying a critical region of the selected pattern prior to determining the characteristic pitch, wherein determining the characteristic pitch for the selected pattern is performed by determining the characteristic pitch for the critical region.

Claim 5

A method as in claim 3 , wherein the identifying further comprises identifying a plurality of critical regions and wherein determining the characteristic pitch for the critical region includes: comparing a pitch of each identified critical region; and if the pitch of each identified region is substantially equal, determining the characteristic pitch for the critical region to be equal to the characteristic pitch of one of the identified regions.

Claim 6

A method as in claim 1 , further comprising weighting regions of the illuminator configuration based on a selected optimized metric selected from the group consisting of depth of focus, end-of-line, image log slope (ILS), image slope (IS), and aberration sensitivity.

Claim 7

A method as in claim 1 , further comprising: identifying a plurality of critical regions; determining a pitch of each of the identified critical regions; and calculating optimized illumination configurations from the transmission cross coefficient function, weighing orders based on relevance to imaging of diffraction orders for each critical region, and wherein calculating an optimized illumination configuration further comprises calculating a composite optimized illumination configuration based on the calculated optimized illumination configuration for each critical region.

Claim 8

A method as in claim 1 , further comprising: modifying the selected pattern by optical proximity correction techniques to reduce a total number of different pitches in the mask pattern.

Claim 9

A method as in claim 7 , wherein the modifying further comprises addition of sub-resolution features to the selected mask pattern.

Claim 10

A method as in claim 7 , wherein the modifying and calculating are iterated.

Claim 11

A device manufacturing method comprising: projecting a patterned beam of radiation onto a target portion of a layer of radiation-sensitive material on a substrate, wherein, prior to impinging the substrate, the cross-sectional intensity distribution in the projection beam optimized using a method according to claim 1 .

Claim 12

A method as in claim 10 wherein the optical proximity correction further comprises addition of sub-resolution features selected to modify a continuous probability density function of the space width of the selected mask design such that the modified probability density function has an increased discretization.

Claim 13

A machine readable medium encoded with machine executable instructions for optimizing an illumination profile according to a method comprising: defining a transmission cross coefficient function for an optical system including an illuminator and the selected patterning structure pattern; determining relative relevance to imaging of diffraction orders based on the selected pattern; and calculating an optimized illumination configuration from the transmission cross coefficient function, weighting regions of the illumination configuration based on the relative relevance to imaging of the diffraction orders.

Claim 14

A machine readable medium encoded with machine executable instructions for optimizing an illumination profile according to a method comprising: defining a transmission cross coefficient function for an optical system including an illuminator and the selected patterning structure pattern; determining relative relevance to imaging of diffraction orders based on the selected pattern; and calculating an optimized illumination configuration from the transmission cross coefficient function, weighting regions of the illumination configuration based on the relative relevance to imaging of the diffraction orders.

Claim 15

A lithographic projection apparatus comprising: an illumination system to provide a projection beam of radiation; a support structure to support patterning structure which can be used to pattern the projection beam according to a desired pattern; a substrate table to hold a substrate; a projection system to project the patterned beam onto a target portion of the substrate, wherein the apparatus additionally comprises: a processor to define a transmission cross coefficient function for the illuminator and the patterning structure, to determine relative relevance to imaging of diffraction orders based on the pattern produced by the patterning structure, and to calculate an optimized illumination configuration from the transmission cross coefficient function, to weigh regions of the illumination configuration based on the relative relevance to imaging of the diffraction orders; and a selectably variable beam controller that is adapted to modify the cross-sectional intensity distribution in the projection beam exiting the illumination system in accordance with the illumination configuration calculated by the processor.

Claim 16

A lithographic projection apparatus comprising: an illumination system to provide a projection beam of radiation; a support structure to support patterning structure which can be used to pattern the projection beam according to a desired pattern; a substrate table to hold a substrate; a projection system to project the patterned beam onto a target portion of the substrate, wherein the apparatus additionally comprises: a processor to define a transmission cross coefficient function for the illuminator and the patterning structure, to determine relative relevance to imaging of diffraction orders based on the pattern produced by the patterning structure, and to calculate an optimized illumination configuration from the transmission cross coefficient function, to weigh regions of the illumination configuration based on the relative relevance to imaging of the diffraction orders; and a selectably variable beam controller that is adapted to modify the cross-sectional intensity distribution in the projection beam exiting the illumination system in accordance with the illumination configuration calculated by the processor.

Claim 19

A method as in claim 14 wherein said determining an optimized illumination profile further comprises: defining a transmission cross coefficient function for an optical system including an illuminator and the selected mask design; determining relative relevance to imaging of diffraction orders based on the selected mask design; and calculating an optimized illumination configuration from the transmission cross coefficient function, weighting regions of the illumination configuration based on the relative relevance to imaging of the diffraction orders.

Claim 20

A machine readable medium encoded with machine executable instructions for optimizing an illumination profile according to a method comprising: identifying critical features of the selected mask design; determining an optimized illumination profile based on diffraction orders of the critical features; and modifying the selected mask design by use of optical proximity correction techniques which are selected to reduce a number of pitches present in the selected mask design.

Claim 21

A machine readable medium encoded with machine executable instructions for optimizing an illumination profile according to a method comprising: identifying critical features of the selected mask design; determining an optimized illumination profile based on diffraction orders of the critical features; and modifying the selected mask design by use of optical proximity correction techniques which are selected to reduce a number of pitches present in the selected mask design.