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US6765825B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Differential nor memory cell having two floating gate transistors

Assignee: AMI Semiconductor Inc
•
Filing: 2003-03-12
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Granted: 2004-07-20
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Expires: 2023-03-12
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Abstract

Abstract An EEPROM memory cell that includes two floating gate transistors. Each of the drain terminals of the transistors is coupled to a corresponding differential bit line. The source terminal of both transistors are coupled to a common current source or sink. Each of the control gate terminals are coupled to a corresponding word line, which may be the same as or different than the corresponding word line that the other control terminal is connected to. The floating gate transistor may be five-terminal devices that include an additional well terminal. In that case, a different set of bit lines is used to program the EEPROM memory cell as are used to read the EEPROM memory cell. While the drain terminals are coupled to the differential read bit lines, each of the well terminals is coupled to a corresponding differential program bit line.

Inventors

  • 👤 Greg Scott

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 07:23
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/04; G11C16/0408; G11C16/0441; G11C16/06; G11C16/26; G11C16/28

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 167 words
A differential Electrically-Erasable and Programmable Read-Only Memory (EEPROM) memory in which a memory cell comprises: a first floating gate transistor comprising a first control gate terminal, a first floating gate, a first source terminal, and a first drain terminal, the first drain terminal coupled to a first differential bit line, the first control gate terminal coupled to a first word line, the first source terminal coupled to a current source or sink; and a second floating gate transistor comprising a second control gate terminal, a second floating gate, a second source terminal, and a second drain terminal, the second drain terminal coupled to a second differential bit line, the second control gate terminal coupled to a second word line, the second source terminal coupled to the current source or sink, wherein the memory further comprises a circuit component configured to identify a binary bit stored by the memory cell depending on which of the first or second floating gate transistors draws more current during a read operation.
Claim 2
Dependent Claim 167 words
A differential Electrically-Erasable and Programmable Read-Only Memory (EEPROM) memory in which a memory cell comprises: a first floating gate transistor comprising a first control gate terminal, a first floating gate, a first source terminal, and a first drain terminal, the first drain terminal coupled to a first differential bit line, the first control gate terminal coupled to a first word line, the first source terminal coupled to a current source or sink; and a second floating gate transistor comprising a second control gate terminal, a second floating gate, a second source terminal, and a second drain terminal, the second drain terminal coupled to a second differential bit line, the second control gate terminal coupled to a second word line, the second source terminal coupled to the current source or sink, wherein the memory further comprises a circuit component configured to identify a binary bit stored by the memory cell depending on which of the first or second floating gate transistors draws more current during a read operation.
Claim 3
Dependent Claim 21 words
An EEPROM memory in accordance with claim 1 , wherein the first and second word lines are the same word line.
Claim 4
Dependent Claim 20 words
An EEPROM memory in accordance with claim 1 , wherein the first and second word lines are different word lines.
Claim 5
Dependent Claim 29 words
An EEPROM memory in accordance with claim 1 , wherein the first and second floating gate transistors are n-type and the current source or sink is a current sink.
Claim 6
Dependent Claim 29 words
An EEPROM memory in accordance with claim 1 , wherein the first and second floating gate transistors are p-type and the current source or sink is a current source.
Claim 7
Dependent Claim 164 words
A differential Electrically-Erasable and Programmable Read-Only Memory EEPROM memory cell comprising the following: a first five-terminal floating gate transistor comprising a first control gate terminal, a first floating gate, a first source terminal, a first drain terminal, and a first well terminal, the first drain terminal coupled to a first differential read bit line, the first well terminal coupled to a first differential program bit line, the first control gate terminal coupled to a first word line, the first source terminal coupled to a current source or sink; and a second five-terminal floating gate transistor comprising a second control gate terminal, a second floating gate, a second source terminal, a second drain terminal, and a second well terminal, the second drain terminal coupled to a second differential read bit line, the second well terminal coupled to a second differential program bit line, the second control gate terminal coupled to a second word line, the second source terminal coupled to the current source or sink.
Claim 8
Dependent Claim 164 words
A differential Electrically-Erasable and Programmable Read-Only Memory EEPROM memory cell comprising the following: a first five-terminal floating gate transistor comprising a first control gate terminal, a first floating gate, a first source terminal, a first drain terminal, and a first well terminal, the first drain terminal coupled to a first differential read bit line, the first well terminal coupled to a first differential program bit line, the first control gate terminal coupled to a first word line, the first source terminal coupled to a current source or sink; and a second five-terminal floating gate transistor comprising a second control gate terminal, a second floating gate, a second source terminal, a second drain terminal, and a second well terminal, the second drain terminal coupled to a second differential read bit line, the second well terminal coupled to a second differential program bit line, the second control gate terminal coupled to a second word line, the second source terminal coupled to the current source or sink.
Claim 9
Dependent Claim 22 words
An EEPROM memory cell in accordance with claim 6 , wherein the first and second word lines are the same word line.
Claim 10
Dependent Claim 21 words
An EEPROM memory cell in accordance with claim 6 , wherein the first and second word lines are different word lines.
Claim 11
Dependent Claim 30 words
An EEPROM memory cell in accordance with claim 6 , wherein the first and second floating gate transistors are n-type and the current source or sink is a current sink.
Claim 12
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 9 , wherein the first well terminal is n-type.
Claim 13
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 10 , wherein the second well terminal is n-type.
Claim 14
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 9 , wherein the first well terminal is p-type.
Claim 15
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 12 , wherein the second well terminal is n-type.
Claim 16
Dependent Claim 19 words
An EEPROM memory cell in accordance with claim 9 , wherein the first and second well terminals are p-type.
Claim 17
Dependent Claim 30 words
An EEPROM memory cell in accordance with claim 6 , wherein the first and second floating gate transistors are n-type and the current source or sink is a current sink.
Claim 18
Dependent Claim 30 words
An EEPROM memory cell in accordance with claim 6 , wherein the first and second floating gate transistors are p-type and the current source or sink is a current source.
Claim 19
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 6 , wherein the first well terminal is p-type.
Claim 20
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 16 , wherein the second well terminal is p-type.
Claim 21
Dependent Claim 17 words
An EEPROM memory cell in accordance with claim 16 , wherein the second well terminal is n-type.
Claim 22
Dependent Claim 19 words
An EEPROM memory cell in accordance with claim 16 , wherein the first and second well terminals are p-type.

References Cited (Backward Citations)

US5028810A Cited
US6317364B1 Cited
US6358799B2 Cited
US6385108B2 Cited
US6384448B1 Cited
US6384664B1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2007-07-20 2008-01-19 2008-07-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2011-07-20 2012-01-19 2012-07-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2015-07-20 2016-01-19 2016-07-20 $7700.00 Window Closed / Lapsed

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