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US6747361B2 Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device and packaging method thereof

Assignee: NEC Electronics Corp
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Filing: 2001-07-24
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Granted: 2004-06-08
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Expires: 2021-07-24
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Abstract

Abstract A semiconductor chip semiconductor device of the present invention is capable of obtaining a high-quality bare chip (HQC) easily and can retain quality without being affected by the surrounding environment. Electrodes formed on the surface of a first resin sealed package for sealing a semiconductor chip are connected to the electrodes of the semiconductor chip and each electrode comprises a mounting area to be connected to an object to be mounted and a testing area for connecting testing equipment.

Inventors

  • 👤 Michihiko Ichinose

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 11:54
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/27; H10P74/273; H10W; H10W72/00; H10W72/071; H10W70/00; H10W70/40; H10W70/411; H10W70/415; H10W74/00; H10W74/10; H10W74/111; H10W74/121; H10W90/00; H10W90/811; H10W72/01; H10W72/015; H10W72/01515; H10W72/073; H10W72/075; H10W72/07551; H10W72/07552; H10W72/07553; H10W72/50; H10W72/521; H10W72/527; H10W72/531; H10W72/537; H10W72/541; H10W72/5445; H10W72/5449; H10W72/851; H10W72/874; H10W72/884

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 131 words
A semiconductor device comprising: a first resin package comprising: a semiconductor chip; a chip electrode on a surface of said semiconductor chip; a first resin sealing said semiconductor chip; and a first package electrode on a surface of said first resin being electrically connected to said chip electrode, said first package electrode comprising a mounting pad and a testing pad provided apart from said mounting pad and said testing pad enabling electrical measurement of said semiconductor chip without using said mounting pad; a mounted object connected to said mounting pad, and a wiring connecting said mounting pad to said mounting object, wherein said mounting pad is arranged along an edge of said first resin package, and wherein said testing pad is arranged at inner position with respect to said mounting pad.
Claim 2
Dependent Claim 131 words
A semiconductor device comprising: a first resin package comprising: a semiconductor chip; a chip electrode on a surface of said semiconductor chip; a first resin sealing said semiconductor chip; and a first package electrode on a surface of said first resin being electrically connected to said chip electrode, said first package electrode comprising a mounting pad and a testing pad provided apart from said mounting pad and said testing pad enabling electrical measurement of said semiconductor chip without using said mounting pad; a mounted object connected to said mounting pad, and a wiring connecting said mounting pad to said mounting object, wherein said mounting pad is arranged along an edge of said first resin package, and wherein said testing pad is arranged at inner position with respect to said mounting pad.
Claim 3
Dependent Claim 27 words
The semiconductor device as claimed in claim 1 , further comprising: a second resin sealing said first resin package and a first surface of said mounted object.
Claim 4
Dependent Claim 22 words
The semiconductor device as claimed in claim 2 , further comprising: an inner wiring connecting said chip electrode to said mounting pad.
Claim 5
Dependent Claim 17 words
The semiconductor device as claimed in claim 1 , wherein said mounted object is a mounting substrate.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2007-06-08 2007-12-08 2008-06-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2011-06-08 2011-12-08 2012-06-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2015-06-08 2015-12-08 2016-06-08 $7700.00 Window Closed / Lapsed

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