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US6740928B2 Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Panasonic Holdings Corp
•
Filing: 2003-01-24
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Granted: 2004-05-25
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Expires: 2023-01-24
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Abstract

Abstract The semiconductor device of the present invention includes: particles or interface states for passing charge formed on a p-type silicon substrate via a barrier layer; and particles for holding charge formed above the charge-passing particles via another barrier layer. The charge-holding particles are different from the charge-passing particles in parameters such as the particle diameter, the capacitance, the electron affinity, and the sum of electron affinity and forbidden bandwidth, to attain swift charge injection and release as well as stable charge holding in the charge-holding particles.

Inventors

  • 👤 Shigeo Yoshii
  • 👤 Kiyoshi Morimoto
  • 👤 Kiyoyuki Morita
  • 👤 Haruyuki Sorada

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 00:53
CPC Classifications
B; B82; B82Y; B82Y10/00; G; G11; G11C; G11C13/00; G11C13/02; G11C13/025; H; H10; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/683; H10D30/6891; H10D30/6893; G11C16/00; G11C16/02; G11C16/04; G11C16/0408; G11C16/0466; G11C2216/00; G11C2216/02; G11C2216/06

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 81 words
A semiconductor device comprising: a substrate having a conductive layer; a first barrier layer formed on the conductive layer for functioning as a barrier for charge transfer; quantized first particles formed on the first barrier layer; a second barrier layer formed on the first particles for functioning as a barrier for charge transfer; and second particles formed on the second barrier layer for holding charge; wherein the diameter of the second particles is larger than the diameter of the first particles.
Claim 2
Dependent Claim 81 words
A semiconductor device comprising: a substrate having a conductive layer; a first barrier layer formed on the conductive layer for functioning as a barrier for charge transfer; quantized first particles formed on the first barrier layer; a second barrier layer formed on the first particles for functioning as a barrier for charge transfer; and second particles formed on the second barrier layer for holding charge; wherein the diameter of the second particles is larger than the diameter of the first particles.
Claim 3
Dependent Claim 31 words
The semiconductor device of claim 1 , wherein the ratio of the diameter of the second particles to the first particles is not less than 1.8 and not more than 300.
Claim 4
Dependent Claim 26 words
The semiconductor device of claim 1 , wherein the diameter of the first particles is not less than 0.1 nm and not more than 5 nm.
Claim 5
Dependent Claim 26 words
The semiconductor device of claim 1 , wherein the diameter of the second particles is not less than 1 nm and not more than 30 nm.
Claim 6
Dependent Claim 52 words
The semiconductor device of claim 1 , further comprising: an insulating layer formed on the second particles; a gate electrode formed on the insulating layer; and source/drain regions formed in regions of the conductive layer located below both sides of the gate electrode, wherein the semiconductor device functions as a MIS transistor.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2007-05-25 2007-11-24 2008-05-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2011-05-25 2011-11-24 2012-05-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2015-05-25 2015-11-24 2016-05-25 $7700.00 Window Closed / Lapsed

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