Angularly offset and recessed stacked die multichip device and method of manufacture

Claim 2

An electronic circuit assembly, comprising: a circuit board defining a recess therein sized and shaped to receive a die; a lower die attached to said circuit board at least partially within said recess, said lower die having a longitudinal center line; and a plurality of dies over said lower die, wherein each die of said plurality of dies is dimensioned and oriented, at an angle with respect to an immediately adjacent die within said plurality, sufficient to ensure that no portion of any die interferes with an orthogonal line of sight of any wire bonding site on another die of said plurality, and wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 3

A die assembly configured to be supported by a substrate, comprising a plurality of stacked dies including a first die mounted in said substrate, wherein each die of said plurality has a bond pad, and said each die of said plurality except said first die has a pad-revealing orientation rotationally offset from an orientation of an immediately underlying die, and wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 4

A die assembly configured to be supported by a substrate, comprising a plurality of stacked dies including a first die mounted in said substrate, wherein each die of said plurality has a bond pad, and said each die of said plurality except said first die has a pad-revealing orientation rotationally offset from an orientation of an immediately underlying die, and wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 5

A die-stacking arrangement, comprising: a pile of inter-adhered chips including a bottom chip, wherein each chip comprises: a perimeter, and bond pads lining opposing sides of said perimeter; wherein a given chip in said pile, except for said bottom chip: reveals all bond pads on a lower chip directly under said given chip, and covers only a portion of said perimeter of said lower chip; wherein said pile is configured to partially reside within a support surface; and wherein any chip in said pile has a longitudinal center line, and wherein each chip of said pile having at least two adjacent chips is rotated in an angle of offset between said longitudinal center lines of two adjacent chips.

Claim 6

A die-stacking arrangement, comprising: a pile of inter-adhered chips including a bottom chip, wherein each chip comprises: a perimeter, and bond pads lining opposing sides of said perimeter; wherein a given chip in said pile, except for said bottom chip: reveals all bond pads on a lower chip directly under said given chip, and covers only a portion of said perimeter of said lower chip; wherein said pile is configured to partially reside within a support surface; and wherein any chip in said pile has a longitudinal center line, and wherein each chip of said pile having at least two adjacent chips is rotated in an angle of offset between said longitudinal center lines of two adjacent chips.

Claim 7

An electronic circuit assembly, comprising: a circuit board defining a recess therein sized and shaped to receive a die; a lower die attached to the circuit board and at least partially within the recess, the lower die having a die attachment area width located separate from any wire bonding sites on said lower die, and said lower die having a longitudinal center line; and a plurality of dies over said lower die, wherein each die of said plurality of dies has a die attachment area width separate from any wire bonding sites on said each die, and wherein each die of said plurality of dies has a width dimension less than said die attachment area width on any lower dies of said plurality; and wherein each die of said plurality of dies is oriented, through an angle, sufficient to ensure that no portion of any die interferes with an orthogonal line of sight of any wire bonding site on any underlying dies, wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 8

An electronic circuit assembly, comprising: a circuit board defining a recess therein sized and shaped to receive a die; a lower die attached to the circuit board and at least partially within the recess, the lower die having a die attachment area width located separate from any wire bonding sites on said lower die, and said lower die having a longitudinal center line; and a plurality of dies over said lower die, wherein each die of said plurality of dies has a die attachment area width separate from any wire bonding sites on said each die, and wherein each die of said plurality of dies has a width dimension less than said die attachment area width on any lower dies of said plurality; and wherein each die of said plurality of dies is oriented, through an angle, sufficient to ensure that no portion of any die interferes with an orthogonal line of sight of any wire bonding site on any underlying dies, wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 9

A die assembly configured to be supported by a substrate, comprising a plurality of stacked dies including a first die mounted in said substrate, wherein each die of said plurality has a bond pad, and said each die of said plurality except said first die has a pad-revealing orientation offset from an orientation of an immediately underlying die, and wherein each die (if said plurality has a longitudinal center line, and wherein each die of said plurality having at (east two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 10

A die assembly configured to be supported by a substrate, comprising a plurality of stacked dies including a first die mounted in said substrate, wherein each die of said plurality has a bond pad, and said each die of said plurality except said first die has a pad-revealing orientation offset from an orientation of an immediately underlying die, and wherein each die (if said plurality has a longitudinal center line, and wherein each die of said plurality having at (east two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 11

The die assembly in claim 5 , wherein said each die of said plurality except said first die has a pad-revealing orientation offset from an orientation of any underlying die.

Claim 12

A die-stacking arrangement, comprising: a pile of inter-adhered chips including a bottom chip, wherein each chip comprises: a perimeter, and bond pads on said perimeter; wherein a given chip in said pile, except for said bottom chip: reveals all bond pads on a lower chip directly under said given chip, and covers only a portion of said perimeter of said lower chip; wherein said pile is configured to partially reside within a support surface; and wherein each chip of said pile has a longitudinal center line, and wherein each chip of said pile having at least two adjacent chips is rotated in an angle of offset between said longitudinal center lines of two adjacent chips.

Claim 13

A die-stacking arrangement, comprising: a pile of inter-adhered chips including a bottom chip, wherein each chip comprises: a perimeter, and bond pads on said perimeter; wherein a given chip in said pile, except for said bottom chip: reveals all bond pads on a lower chip directly under said given chip, and covers only a portion of said perimeter of said lower chip; wherein said pile is configured to partially reside within a support surface; and wherein each chip of said pile has a longitudinal center line, and wherein each chip of said pile having at least two adjacent chips is rotated in an angle of offset between said longitudinal center lines of two adjacent chips.

Claim 14

The die-stacking arrangement in claim 7 , wherein a given chip in said pile, except for said bottom chip, reveals all bond pads under said given chip.

Claim 15

The die-stacking arrangement in claim 8 , wherein said bottom chip is configured to partially reside within said support surface.

Claim 16

A circuit assembly, comprising: a substrate defining a recess; and a plurality of serially stacked and rotated die, including: an underlying die at least partially within said recess, and an overlying die above said underlying die, at least as large as said underlying die, centered with said underlying die along an axis running perpendicular to said underlying die and said overlying die, and having a continuous configuration, wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 17

A circuit assembly, comprising: a substrate defining a recess; and a plurality of serially stacked and rotated die, including: an underlying die at least partially within said recess, and an overlying die above said underlying die, at least as large as said underlying die, centered with said underlying die along an axis running perpendicular to said underlying die and said overlying die, and having a continuous configuration, wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 18

The circuit assembly in claim 10 , wherein said overlying die has a depth dimension parallel to said axis and has a configuration that is free of holes running through said depth dimension.

Claim 19

The circuit assembly in claim 11 , wherein said overlying die has a non-cutaway configuration.

Claim 20

The circuit assembly within claim 12 , wherein said recess has a depth, and wherein said underlying die has a depth dimension equal to said depth.

Claim 21

The circuit assembly in claim 12 , wherein said recess has a depth, and wherein said underlying die has a depth dimension greater than said depth.

Claim 22

A multichip device, comprising: a first die having a bonding site and configured to fit within a surface recess, said first die having a longitudinal center line; and a plurality of dies stacked over said first die, wherein each die of said plurality is unobstructedly rotated with respect to a bonding site of an immediately underlying die, and wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 23

A multichip device, comprising: a first die having a bonding site and configured to fit within a surface recess, said first die having a longitudinal center line; and a plurality of dies stacked over said first die, wherein each die of said plurality is unobstructedly rotated with respect to a bonding site of an immediately underlying die, and wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 24

The multichip device in claim 15 , wherein one die in said plurality has an orientation similar to said first die and is unobstructedly stacked over said first die.

Claim 25

The multichip device in claim 15 , wherein an intermediate die is interposed between said first die and said one die having an orientation similar to said first die.

Claim 26

A multichip arrangement, comprising a plurality of semiconductor devices stacked one on top of the other in a helix formation, wherein a bond pad in each semiconductor device is exposed, and wherein at least a portion of said arrangement is configured to extend beneath a support surface, and wherein each device of said plurality has a longitudinal center line, and wherein each device of said plurality having at least two adjacent devices is rotated in an angle of offset between said longitudinal center lines of two adjacent devices.

Claim 27

A multichip arrangement, comprising a plurality of semiconductor devices stacked one on top of the other in a helix formation, wherein a bond pad in each semiconductor device is exposed, and wherein at least a portion of said arrangement is configured to extend beneath a support surface, and wherein each device of said plurality has a longitudinal center line, and wherein each device of said plurality having at least two adjacent devices is rotated in an angle of offset between said longitudinal center lines of two adjacent devices.

Claim 28

The multichip arrangement in claim 18 , wherein every bond pad in said each semiconductor device is exposed.

Claim 29

A multichip arrangement, comprising a plurality of semiconductor devices stacked in series in a spiral formation, wherein said spiral formation reveals a bond pad in at least one semiconductor device, and wherein at least a portion of said spiral formation is configured to embed into a substrate, and wherein each device of said plurality has a longitudinal center line, and wherein each device of said plurality having at least two adjacent devices is rotated in an angle of offset between said longitudinal center lines of two adjacent devices.

Claim 30

A multichip arrangement, comprising a plurality of semiconductor devices stacked in series in a spiral formation, wherein said spiral formation reveals a bond pad in at least one semiconductor device, and wherein at least a portion of said spiral formation is configured to embed into a substrate, and wherein each device of said plurality has a longitudinal center line, and wherein each device of said plurality having at least two adjacent devices is rotated in an angle of offset between said longitudinal center lines of two adjacent devices.

Claim 31

The multichip arrangement in claim 20 , wherein said spiral formation reveals a bond pad in every semiconductor device.

Claim 32

A multichip device, comprising: a substrate defining a die-shaped and die-sized recess; and a stack of angularly offset dies, wherein a bottom die of said stack is within said recess, and wherein each die of said stack has a longitudinal center line, and wherein each die of said stack having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 33

A multichip device, comprising: a substrate defining a die-shaped and die-sized recess; and a stack of angularly offset dies, wherein a bottom die of said stack is within said recess, and wherein each die of said stack has a longitudinal center line, and wherein each die of said stack having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 34

A die assembly, comprising: a plurality of stacked die, wherein each die of said plurality has a unique orientation, and wherein said plurality includes a bottom die, said bottom die comprising: a bottom, and a side that is generally perpendicular to said bottom, wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies; and a substrate supporting said plurality and abutting said side of said bottom die.

Claim 35

A die assembly, comprising: a plurality of stacked die, wherein each die of said plurality has a unique orientation, and wherein said plurality includes a bottom die, said bottom die comprising: a bottom, and a side that is generally perpendicular to said bottom, wherein each die of said plurality has a longitudinal center line, and wherein each die of said plurality having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies; and a substrate supporting said plurality and abutting said side of said bottom die.

Claim 36

A multichip device, comprising: a substrate having at least one sidewall defining a hole within said substrate; and a die stack, wherein each die in said stack has a bond pad-clearing orientation with respect to other dies in said stack, and wherein one die in said stack contacts said sidewall, and wherein each die of said stack has a longitudinal center line, and wherein each die of said stack having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 37

A multichip device, comprising: a substrate having at least one sidewall defining a hole within said substrate; and a die stack, wherein each die in said stack has a bond pad-clearing orientation with respect to other dies in said stack, and wherein one die in said stack contacts said sidewall, and wherein each die of said stack has a longitudinal center line, and wherein each die of said stack having at least two adjacent dies is rotated in an angle of offset between said longitudinal center lines of two adjacent dies.

Claim 38

The multichip device in claim 24 , wherein only one die in said stack contacts said sidewall.