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US6310387B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuit inductor with high self-resonance frequency

Assignee: Qualcomm Inc
•
Filing: 1999-05-03
•
Granted: 2001-10-30
•
Expires: 2019-05-03
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Abstract

Abstract An integrated circuit inductor structure that includes a shielding pattern that induces a plurality of small eddy currents to shield the magnetic energy generated by the inductor from the substrate of the IC. The IC inductor structure is formed on a Silicon on Insulator (SOI) substrate where the substrate of the SOI has high resistivity. The shielding pattern forms a checkerboard pattern that includes a plurality of conducting regions completely isolated from each other by oxide material. The inductor has a high quality factor and a high self-resonance frequency due to the effective shielding of electromagnetic energy from the substrate of the IC while not reducing the effective inductance of the inductor.

Inventors

  • 👤 James Douglas Seefeldt
  • 👤 Christopher D. Hull

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 03:05
CPC Classifications
H; H10; H10W; H10W44/00; H10W44/501; H10W20/00; H10W20/40; H10W20/41; H10W20/43; H10W20/497

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 85 words
An integrated circuit comprising: a) a substrate; b) a first dielectric layer contacting the substrate at an interface; c) a second dielectric layer contacting the first dielectric layer at an interface, the second dielectric layer including a plurality of conducting regions d) a third dielectric layer contacting the second dielectric layer at an interface; and e) an inductor fabricated above the second dielectric layer, f) wherein the plurality of conducting regions induce small eddy currents that do not significantly reduce the inductance of the inductor.
Claim 2
Dependent Claim 85 words
An integrated circuit comprising: a) a substrate; b) a first dielectric layer contacting the substrate at an interface; c) a second dielectric layer contacting the first dielectric layer at an interface, the second dielectric layer including a plurality of conducting regions d) a third dielectric layer contacting the second dielectric layer at an interface; and e) an inductor fabricated above the second dielectric layer, f) wherein the plurality of conducting regions induce small eddy currents that do not significantly reduce the inductance of the inductor.
Claim 3
Dependent Claim 16 words
The integrated circuit according to claim 1 , wherein the substrate is a high resistivity substrate.
Claim 4
Dependent Claim 18 words
The integrated circuit according to claim 2 , wherein the resistivity of the substrate is about 1 kohm-cm.
Claim 5
Dependent Claim 17 words
The integrated circuit according to claim 1 , wherein the first dielectric layer consists of silicon oxide.
Claim 6
Dependent Claim 19 words
The integrated circuit according to claim 4 , wherein the third dielectric layer includes at least one oxide layer.

References Cited (Backward Citations)

US5070317A Cited
US5431987A Cited
US5539241A Cited
US5694030A Cited
US5747870A Cited
JPH09132498A Cited
WO1998005149A1 Cited
US5884990A Cited
US6160303A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2004-10-29 2005-04-30 2005-10-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2008-10-29 2009-04-30 2009-10-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2012-10-29 2013-04-30 2013-10-30 $7700.00 Window Closed / Lapsed

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