Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
71 words
A method of forming an integrated circuit capacitor, the method comprising the steps of: forming a patterned base electrode over an insulating region; then reacting patterned material in the patterned base electrode with a nitrogen-bearing agent to form a self-aligned capacitor electrode with a conductive nitride layer; forming a dielectric layer over the self-aligned capacitor electrode containing the conductive nitride layer; and forming a second capacitor electrode over the dielectric layer.
Claim 2
Independent Claim
71 words
A method of forming an integrated circuit capacitor, the method comprising the steps of: forming a patterned base electrode over an insulating region; then reacting patterned material in the patterned base electrode with a nitrogen-bearing agent to form a self-aligned capacitor electrode with a conductive nitride layer; forming a dielectric layer over the self-aligned capacitor electrode containing the conductive nitride layer; and forming a second capacitor electrode over the dielectric layer.
Claim 3
Dependent Claim
82 words
The method of claim 1 wherein the step of forming a patterned base electrode comprises: patterning a layer of polysilicon to form the patterned base electrode over a selected location of the insulating region; depositing a layer of a siliciding metal over the patterned base electrode and insulating region; reacting the silicided metal with silicon in the patterned base electrode to form a silicide layer over the patterned base electrode; and removing portions of the siliciding metal from over the insulating layer.
Claim 4
Dependent Claim
28 words
The method of claim 2 wherein the siliciding material is selected from the group consisting of tantalum, titanium, aluminum, tungsten, molybdenum, platinum, palladium, ruthenium, cobalt, and metal alloys.
Claim 5
Dependent Claim
27 words
The method of claim 2 wherein the step of reacting the silicided metal with silicon in the patterned base electrode comprises heating in an inert gas ambient.
Claim 6
Dependent Claim
15 words
The method of claim 4 wherein said heating step comprises a rapid thermal annealing step.
Claim 7
Dependent Claim
22 words
The method of claim 1 wherein said reacting step comprises performing a rapid thermal anneal in the presence of a nitrogen-bearing gas.
Claim 8
Dependent Claim
35 words
The method of claim 1 wherein the step of forming a patterned base electrode comprises: patterning a layer of a metal to form the patterned base electrode over a selected location of the insulating region.
Claim 9
Dependent Claim
22 words
The method of claim 7 wherein the metal is selected from the group consisting of tungsten, titanium, tantalum, zirconium, ruthenium and molybdenum.
Claim 10
Dependent Claim
22 words
The method of claim 7 wherein said reacting step comprises performing a rapid thermal anneal in the presence of a nitrogen-bearing gas.
Claim 11
Dependent Claim
15 words
The method of claim 1 wherein said dielectric layer comprises a high dielectric constant material.
Claim 12
Dependent Claim
12 words
The method of claim 1 wherein said dielectric layer comprises tantalum pentoxide.
Claim 13
Dependent Claim
13 words
The method of claim 1 wherein said dielectric layer comprises lead zirconium titanate.
Claim 14
Dependent Claim
13 words
The method of claim 1 wherein said dielectric layer comprises barium strontium titanate.
Claim 15
Dependent Claim
12 words
The method of claim 1 wherein said dielectric layer comprises strontium titanate.
Claim 16
Dependent Claim
38 words
The method of claim 1 wherein said second capacitor electrode comprises a material selected from the group consisting of titanium nitride, titanium aluminum nitride, tantalum silicide nitride, tantalum silicon nitride, tungsten silicon nitride, tungsten nitride and molybdenum nitride.