Patent US6208567B1 successfully refreshed from Google Patents.
US6208567B1
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Semiconductor device capable of cutting off a leakage current in a defective array section
Assignee: Panasonic Corp
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Filing: 1998-01-28
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Granted: 2001-03-27
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Expires: 2018-01-28
Abstract
Abstract The semiconductor device of this invention includes: an array section including a plurality of circuit blocks; a leakage current cutoff section for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section for controlling the leakage current cutoff section in accordance with leakage current cutoff information.
Inventors
- 👤 Hiroyuki Yamauchi
- 👤 Hironori Akamatsu
- 👤 Toru Iwata
- 👤 Keiichi Kusumoto
- 👤 Satoshi Takahashi
- 👤 Yutaka Terada
- 👤 Takashi Hirata
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 07:48
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/04; G11C29/08; G01; G01R; G01R31/00; G01R31/28; G01R31/30; G01R31/3004
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
136 words
A semiconductor device comprising: an array section including a plurality of circuit blocks; a leakage current cutoff section, coupled to the array section, for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section, coupled to the leakage current cutoff section, for controlling the leakage current cutoff section in accordance with leakage current cutoff information; wherein the leakage current cutoff section includes: a switching element disposed between a power source which supplies electric power to the array section and one of the plurality of circuit blocks; and a programmable logic element connected to the switching element, and the control section controls an ON/OFF state of the switching element by programming the programmable logic element in accordance with the leakage current cutoff information.
Claim 2
Dependent Claim
136 words
A semiconductor device comprising: an array section including a plurality of circuit blocks; a leakage current cutoff section, coupled to the array section, for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section, coupled to the leakage current cutoff section, for controlling the leakage current cutoff section in accordance with leakage current cutoff information; wherein the leakage current cutoff section includes: a switching element disposed between a power source which supplies electric power to the array section and one of the plurality of circuit blocks; and a programmable logic element connected to the switching element, and the control section controls an ON/OFF state of the switching element by programming the programmable logic element in accordance with the leakage current cutoff information.
Claim 3
Dependent Claim
43 words
A semiconductor device according to claim 3 , wherein the leakage current cutoff section cuts off the leakage current by electrically insulating at least one of the plurality of circuit blocks from the power source which supplies electric power to the array section.
Claim 4
Dependent Claim
32 words
A semiconductor device according to claim 1 , wherein the leakage current cutoff information includes identification information for identifying at least one circuit block to be electrically insulated from the power source.
Claim 5
Dependent Claim
24 words
A semiconductor device according to claim 1 , further comprising a leakage current cutoff information storage section for storing the leakage current cutoff information.
Claim 6
Dependent Claim
43 words
A semiconductor device according to claim 1 , further comprising a leakage current detection section for detecting whether a leakage current has occurred in at least one circuit block and producing the leakage current cutoff information based on a result of the detection.
Claim 7
Dependent Claim
87 words
A semiconductor device according to claim 1 , wherein at least one of the plurality of circuit blocks includes a defective element having a defect of failing to execute a predetermined operation, the semiconductor device further comprises a redundant circuit section for prohibiting an access to the defective element and allowing for an access to a redundant element, and the control section controls the leakage current cutoff section in accordance with at least one of an address of the defective element and the leakage current cutoff information.
Claim 8
Dependent Claim
28 words
A semiconductor device according to claim 1 , wherein at least one of the plurality of circuit blocks is a memory block including a plurality of memory cells.
Claim 9
Dependent Claim
134 words
A semiconductor device comprising: an array section including a plurality of circuit blocks; a leakage current cutoff section, coupled to the array section, for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section, coupled to the leakage current cutoff section, for controlling the leakage current cutoff section in accordance with leakage current cutoff information; wherein the leakage current cutoff section includes a fuse disposed between a power source which supplies electric power to the array section and one of the plurality of circuit blocks, and the control section produces position information indicating a position of the fuse to be cut off in accordance with the leakage current cutoff information, and outputs the position information to a laser irradiation device.
Claim 10
Dependent Claim
134 words
A semiconductor device comprising: an array section including a plurality of circuit blocks; a leakage current cutoff section, coupled to the array section, for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section, coupled to the leakage current cutoff section, for controlling the leakage current cutoff section in accordance with leakage current cutoff information; wherein the leakage current cutoff section includes a fuse disposed between a power source which supplies electric power to the array section and one of the plurality of circuit blocks, and the control section produces position information indicating a position of the fuse to be cut off in accordance with the leakage current cutoff information, and outputs the position information to a laser irradiation device.
Claim 11
Dependent Claim
43 words
A semiconductor device according to claim 8 , wherein the leakage current cutoff information includes information indicating the position of the fuse with respect to a predetermined point on a semiconductor chip on which the semiconductor device is formed as a reference point.
Claim 12
Dependent Claim
18 words
A semiconductor device according to claim 8 , wherein the semiconductor device is mounted on a system LSI.
Claim 13
Dependent Claim
43 words
A semiconductor device according to claim 5 , wherein the leakage current cutoff section cuts off the leakage current by electrically insulating at least one of the plurality of circuit blocks from the power source which supplies electric power to the array section.
Claim 14
Dependent Claim
24 words
A semiconductor device according to claim 8 , further comprising a leakage current cutoff information storage section for storing the leakage current cutoff information.
Claim 15
Dependent Claim
43 words
A semiconductor device according to claim 8 , further comprising a leakage current detection section for detecting whether a leakage current has occurred in at least one circuit block and producing the leakage current cutoff information based on a result of the detection.
Claim 16
Dependent Claim
87 words
A semiconductor device according to claim 8 , wherein at least one of the plurality of circuit blocks includes a defective element having a defect of failing to execute a predetermined operation, the semiconductor device further comprises a redundant circuit section for prohibiting an access to the defective element and allowing for an access to a redundant element, and the control section controls the leakage current cutoff section in accordance with at least one of an address of the defective element and the leakage current cutoff information.
Claim 17
Dependent Claim
28 words
A semiconductor device according to claim 8 , wherein at least one of the plurality of circuit blocks is a memory block including a plurality of memory cells.
Claim 18
Dependent Claim
117 words
A semiconductor device comprising: an array section including a plurality of circuit blocks; a leakage current cutoff section, coupled to the array section, for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section, coupled to the leakage current cutoff section, for controlling the leakage current cutoff section in accordance with leakage current cutoff information; further comprising a system controller which receives mode information indicating either a first mode or a second mode, wherein the semiconductor device operates in the second mode with a lower power consumption than in the first mode, and controls the control section in accordance with the mode information.
Claim 19
Dependent Claim
117 words
A semiconductor device comprising: an array section including a plurality of circuit blocks; a leakage current cutoff section, coupled to the array section, for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section, coupled to the leakage current cutoff section, for controlling the leakage current cutoff section in accordance with leakage current cutoff information; further comprising a system controller which receives mode information indicating either a first mode or a second mode, wherein the semiconductor device operates in the second mode with a lower power consumption than in the first mode, and controls the control section in accordance with the mode information.
Claim 20
Dependent Claim
43 words
A semiconductor device according to claim 16 , wherein the leakage current cutoff section cuts off the leakage current by electrically insulating at least one of the plurality of circuit blocks from a power source which supplies electric power to the array section.
Claim 21
Dependent Claim
24 words
A semiconductor device according to claim 16 , further comprising a leakage current cutoff information storage section for storing the leakage current cutoff information.
Claim 22
Dependent Claim
43 words
A semiconductor device according to claim 16 , further comprising a leakage current detection section for detecting whether a leakage current has occurred in at least one circuit block and producing the leakage current cutoff information based on a result of the detection.
Claim 23
Dependent Claim
87 words
A semiconductor device according to claim 16 , wherein at least one of the plurality of circuit blocks includes a defective element having a defect of failing to execute a predetermined operation, the semiconductor device further comprises a redundant circuit section for prohibiting an access to the defective element and allowing for an access to a redundant element, and the control section controls the leakage current cutoff section in accordance with at least one of an address of the defective element and the leakage current cutoff information.
Claim 24
Dependent Claim
28 words
A semiconductor device according to claim 16 , wherein at least one of the plurality of circuit blocks is a memory block including a plurality of memory cells.
References Cited (Backward Citations)
US5355331A
Cited
US5843799A
Cited
JPH0668694A
Cited
JPH0676593A
Cited
US5473573A
Cited
US5666315A
Cited
JPH08297993A
Cited
US5673231A
Cited
US5724297A
Cited
US5926430A
Cited
US5896334A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2004-03-26 | 2004-09-25 | 2005-03-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2008-03-26 | 2008-09-25 | 2009-03-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2012-03-26 | 2012-09-25 | 2013-03-27 | $7700.00 | Window Closed / Lapsed |