US6134685A
Expired / Lapsed
US
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Package parallel test method and apparatus
Assignee: Advanced Micro Devices Inc
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Filing: 1998-03-16
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Granted: 2000-10-17
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Expires: 2018-03-16
Abstract
Abstract A method for partial parallel testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets. Each socket is used for testing an integrated circuit package. A first one of the sockets has a full complement of signal channels, and the other sockets have exclusive subsets of the full complement of signal channels. The first socket and the other sockets support parallel testing of the integrated circuit packages according to a first type of test. Only the first socket, with its full complement of signal channels, supports a second type of test. To test a plurality of integrated circuit packages, a group of packages are inserted in the sockets. A first-pass test is then performed, in parallel, on the packages in the sockets. Then, for packages that passed the first-pass test, second-pass testing is performed sequentially using the first socket.
Inventors
- 👤 John D. Spano
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 11:33
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
127 words
A method for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising the steps of: inserting a plurality of packages in respective ones of the sockets; performing a first-pass test in parallel on the packages present in the sockets; performing a second-pass test on a package using the first socket; and moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the second-pass test for each of the packages.
Claim 2
Independent Claim
127 words
A method for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising the steps of: inserting a plurality of packages in respective ones of the sockets; performing a first-pass test in parallel on the packages present in the sockets; performing a second-pass test on a package using the first socket; and moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the second-pass test for each of the packages.
Claim 3
Dependent Claim
18 words
The method of claim 1, wherein the second-pass test is only performed on packages passing the first-pass test.
Claim 4
Dependent Claim
14 words
The method of claim 1, wherein the first-pass test includes a sequential chain test.
Claim 5
Dependent Claim
13 words
The method of claim 3, wherein the first-pass test includes a built-in self-test.
Claim 6
Dependent Claim
13 words
The method of claim 4, wherein the second-pass test is a performance test.
Claim 7
Dependent Claim
13 words
The method of claim 1, wherein the first-pass test includes a built-in self-test.
Claim 8
Dependent Claim
13 words
The method of claim 6, wherein the second-pass test is a performance test.
Claim 9
Dependent Claim
13 words
The method of claim 1, wherein the second-pass test is a performance test.
Claim 10
Independent Claim
140 words
A method for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising the steps of: inserting for a first time the packages in the plurality of sockets; performing a first-pass test on a package using the first socket; moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the first-pass test for each of the packages; inserting for a second time the packages in the plurality of sockets; and performing a second-pass test in parallel on the packages present in the sockets.
Claim 11
Independent Claim
140 words
A method for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising the steps of: inserting for a first time the packages in the plurality of sockets; performing a first-pass test on a package using the first socket; moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the first-pass test for each of the packages; inserting for a second time the packages in the plurality of sockets; and performing a second-pass test in parallel on the packages present in the sockets.
Claim 12
Dependent Claim
14 words
The method of claim 9, wherein the second-pass test includes a sequential chain test.
Claim 13
Dependent Claim
13 words
The method of claim 10, wherein the second-pass test includes a built-in self-test.
Claim 14
Dependent Claim
13 words
The method of claim 11, wherein the first-pass test is a performance test.
Claim 15
Dependent Claim
13 words
The method of claim 12, wherein the first-pass test is a performance test.
Claim 16
Dependent Claim
13 words
The method of claim 9, wherein the first-pass test is a performance test.
Claim 17
Independent Claim
132 words
An apparatus for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: means for inserting a plurality of packages in respective ones of the sockets; means for performing a first-pass test in parallel on the packages present in the sockets; means for performing a second-pass test on a package using the first socket; and means for moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the second-pass test for each of the packages.
Claim 18
Independent Claim
132 words
An apparatus for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: means for inserting a plurality of packages in respective ones of the sockets; means for performing a first-pass test in parallel on the packages present in the sockets; means for performing a second-pass test on a package using the first socket; and means for moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the second-pass test for each of the packages.
Claim 19
Independent Claim
147 words
An apparatus for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: means for inserting for a first time the packages in the plurality of sockets; means for performing a first-pass test on a package using the first socket; means for moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the first-pass test for each of the packages; means for inserting for a second time the packages in the plurality of sockets; and means for performing a second-pass test in parallel on the packages present in the sockets.
Claim 20
Independent Claim
147 words
An apparatus for testing a plurality of integrated circuit packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: means for inserting for a first time the packages in the plurality of sockets; means for performing a first-pass test on a package using the first socket; means for moving, successively, remaining ones of the packages to the first socket and repeating the step of performing the first-pass test for each of the packages; means for inserting for a second time the packages in the plurality of sockets; and means for performing a second-pass test in parallel on the packages present in the sockets.
Claim 21
Independent Claim
174 words
An apparatus for testing a plurality of integrated circuit (IC) packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: an IC package test arrangement including a package test controller and an automated package handler adapted to move IC packages in and out of ones of the sockets in response to commands from the package test controller, the IC package test arrangement being adapted to test the plurality of IC packages by inserting a plurality of packages in respective ones of the sockets; performing a first-pass test in parallel on the packages present in the sockets; performing a second-pass test on a package using the first socket; and moving, successively, remaining ones of the packages to the first socket and again performing the second-pass test for each of the packages.
Claim 22
Independent Claim
174 words
An apparatus for testing a plurality of integrated circuit (IC) packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: an IC package test arrangement including a package test controller and an automated package handler adapted to move IC packages in and out of ones of the sockets in response to commands from the package test controller, the IC package test arrangement being adapted to test the plurality of IC packages by inserting a plurality of packages in respective ones of the sockets; performing a first-pass test in parallel on the packages present in the sockets; performing a second-pass test on a package using the first socket; and moving, successively, remaining ones of the packages to the first socket and again performing the second-pass test for each of the packages.
Claim 23
Dependent Claim
39 words
The apparatus of claim 17, wherein the IC package test arrangement is further adapted to test the plurality of IC packages by including, in the first-pass test, at least one of a sequential chain test and a built-in self-test.
Claim 24
Dependent Claim
30 words
The apparatus of claim 17, wherein the IC package test arrangement is further adapted to test the plurality of IC packages by including, in the second-pass test, a performance test.
Claim 25
Independent Claim
187 words
An apparatus for testing a plurality of integrated circuit (IC) packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: an IC package test arrangement including a package test controller and an automated package handler adapted to move IC packages in and out of ones of the sockets in response to commands from the package test controller, the IC package test arrangement being adapted to test the plurality of IC packages by inserting for a first time the packages in the plurality of sockets; performing a first-pass test on a package using the first socket; moving, successively, remaining ones of the packages to the first socket and again performing the first-pass test for each of the packages; inserting for a second time the packages in the plurality of sockets; and performing a second-pass test in parallel on the packages present in the sockets.
Claim 26
Independent Claim
187 words
An apparatus for testing a plurality of integrated circuit (IC) packages using a multi-package tester head having a plurality of sockets, wherein a first one of the sockets has a predetermined number of signal channels and each of the other sockets has a plurality of signal channels that is a functional subset of the predetermined number of signal channels of the first socket, comprising: an IC package test arrangement including a package test controller and an automated package handler adapted to move IC packages in and out of ones of the sockets in response to commands from the package test controller, the IC package test arrangement being adapted to test the plurality of IC packages by inserting for a first time the packages in the plurality of sockets; performing a first-pass test on a package using the first socket; moving, successively, remaining ones of the packages to the first socket and again performing the first-pass test for each of the packages; inserting for a second time the packages in the plurality of sockets; and performing a second-pass test in parallel on the packages present in the sockets.
Claim 27
Dependent Claim
39 words
The apparatus of claim 20, wherein the IC package test arrangement is further adapted to test the plurality of IC packages by including, in the first-pass test, at least one of a sequential chain test and a built-in self-test.
Claim 28
Dependent Claim
30 words
The apparatus of claim 21, wherein the IC package test arrangement is further adapted to test the plurality of IC packages by including, in the second-pass test, a performance test.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-10-17 | 2004-04-17 | 2004-10-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-10-17 | 2008-04-17 | 2008-10-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-10-17 | 2012-04-17 | 2012-10-17 | $7700.00 | Window Closed / Lapsed |