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US6127097A Expired / Lapsed US ⏱️ 0.0 years remaining

Photoresist develop and strip solvent compositions and method for their use

Assignee: International Business Machines Corp
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Filing: 1997-03-18
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Granted: 2000-10-03
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Expires: 2017-03-18
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Abstract

Abstract Simple, environmentally friendly developers and strippers are disclosed for free radical-initiated, addition polymerizable resists, cationically cured resists and solder masks and photoresists. Both the developers and the strippers include benzyl alcohol, optionally also including a minor amount of methanol, ethanol, isopropyl alcohol, propylene glycol monomethylacetate, ethylene glycol monomethyl ether, formamide, nitromethane, propylene oxide, or methyl ethyl ketone, acetone and water.

Inventors

  • 👤 Nageshwer Rao Bantu
  • 👤 Anilkumar Chinuprasad Bhatt
  • 👤 Ashwinkumar Chinuprasad Bhatt
  • 👤 Joseph Alphonse Kotylo
  • 👤 Gerald Walter Jones
  • 👤 Robert John Owen
  • 👤 Kostas Papathomas
  • 👤 Anaya Kumar Vardya

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 13:49
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/26; G03F7/42; G03F7/422; G03F7/30; G03F7/32; G03F7/325

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 148 words
A method of stripping free radical, addition polymerizable photoresist, comprising: providing a film of the photoresist on a substrate; selectively exposing at least one predetermined area of the photoresist film to radiation to which it is sensitive for a time sufficient to effect a contrast in the extent of crosslinking in exposed and unexposed regions; developing the photoresist film in a developer containing benzyl alcohol; forming a desired circuit pattern on the substrate by plating copper thereon; and stripping the at least one predetermined area of photoresist exposed to radiation in a solution consisting of benzyl alcohol and about 0.1% up to about 10% by weight of an additive selected from the group consisting of methanol, ethanol, isopropyl alcohol, propylene glycol monomethyl acetate, ethylene glycol monomethyl ether, formamide, nitromethane, propylene oxide, methyl ethyl ketone, acetone and water at a temperature of about 50 to about 100 degrees C.
Claim 2
Independent Claim 148 words
A method of stripping free radical, addition polymerizable photoresist, comprising: providing a film of the photoresist on a substrate; selectively exposing at least one predetermined area of the photoresist film to radiation to which it is sensitive for a time sufficient to effect a contrast in the extent of crosslinking in exposed and unexposed regions; developing the photoresist film in a developer containing benzyl alcohol; forming a desired circuit pattern on the substrate by plating copper thereon; and stripping the at least one predetermined area of photoresist exposed to radiation in a solution consisting of benzyl alcohol and about 0.1% up to about 10% by weight of an additive selected from the group consisting of methanol, ethanol, isopropyl alcohol, propylene glycol monomethyl acetate, ethylene glycol monomethyl ether, formamide, nitromethane, propylene oxide, methyl ethyl ketone, acetone and water at a temperature of about 50 to about 100 degrees C.
Claim 3
Dependent Claim 53 words
The method recited in claim 1 wherein the stripping step is followed by a rinsing step in water at a water rinse pressure between about 15 to about 60 psi, in a rinse temperature between about 20 to about 60 degrees C. and a rinse time between about 5 to about 20 minutes.
Claim 4
Dependent Claim 34 words
The method recited in claim 1 wherein the stripping solution is maintained during the stripping step at a temperature of about 50 to about 100 degrees C. for about 6 to about 12 minutes.
Claim 5
Dependent Claim 87 words
The method recited in claim 1 wherein the stripping solution is maintained during the stripping step at a temperature of about 50 to about 100 degrees C., and a spray pressure of about 15 to about 90 psi, for about 6 to about 12 minutes, and the stripping step is followed by rinsing with water at a water rinse pressure between about 15 to about 60 psi, rinse temperature between about 20 to about 60 degrees C. and rinse time between about 5 to about 20 minutes.
Claim 6
Independent Claim 156 words
A method of manufacturing a printed circuit device comprising: providing a film of free radical, addition polymerizable photoresist on a printed circuit board substrate; selectively exposing at least one predetermined area of the photoresist film to radiation to which it is sensitive for a time sufficient to effect a contrast in the extent of crosslinking in exposed and unexposed regions; developing the photoresist film in a developer containing benzyl alcohol; forming a desired circuit pattern on the printed circuit board substrate by plating copper thereon; and stripping the at least one predetermined area of photoresist exposed to radiation in a solution consisting of benzyl alcohol and about 0.1% up to about 10% by weight of an additive selected from the group consisting of methanol, ethanol, isopropyl alcohol, propylene glycol monomethyl acetate, ethylene glycol monomethyl ether, formamide, nitromethane, propylene oxide, methyl ethyl ketone, acetone and water at a temperature of about 50 to about 100 degrees C.
Claim 7
Independent Claim 156 words
A method of manufacturing a printed circuit device comprising: providing a film of free radical, addition polymerizable photoresist on a printed circuit board substrate; selectively exposing at least one predetermined area of the photoresist film to radiation to which it is sensitive for a time sufficient to effect a contrast in the extent of crosslinking in exposed and unexposed regions; developing the photoresist film in a developer containing benzyl alcohol; forming a desired circuit pattern on the printed circuit board substrate by plating copper thereon; and stripping the at least one predetermined area of photoresist exposed to radiation in a solution consisting of benzyl alcohol and about 0.1% up to about 10% by weight of an additive selected from the group consisting of methanol, ethanol, isopropyl alcohol, propylene glycol monomethyl acetate, ethylene glycol monomethyl ether, formamide, nitromethane, propylene oxide, methyl ethyl ketone, acetone and water at a temperature of about 50 to about 100 degrees C.

References Cited (Backward Citations)

US3619285A Cited
US4500629A Cited
US4615763A Cited
US4786578A Cited
US5185235A Cited
US4846929A Cited
US4857143A Cited
US5268260A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-10-03 2004-04-03 2004-10-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-10-03 2008-04-03 2008-10-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-10-03 2012-04-03 2012-10-03 $7700.00 Window Closed / Lapsed

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