Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
98 words
A semiconductor device comprising: (i) a semiconductor substrate; (ii) an insulating film formed on the semiconductor substrate; and (iii) a capacitor including, (a) a lower electrode formed on the insulating film and made of a refractory metal whose face orientation (111) appears on an upper surface thereof, (b) a capacitor insulating film formed on the lower electrode and made of at least two layers consisting of a ferroelectrics film including Pb having a face orientation (111) and a ferroelectrics film including Pb having a face orientation (100), and (c) an upper electrode formed on the capacitor insulating film.
Claim 2
Dependent Claim
98 words
A semiconductor device comprising: (i) a semiconductor substrate; (ii) an insulating film formed on the semiconductor substrate; and (iii) a capacitor including, (a) a lower electrode formed on the insulating film and made of a refractory metal whose face orientation (111) appears on an upper surface thereof, (b) a capacitor insulating film formed on the lower electrode and made of at least two layers consisting of a ferroelectrics film including Pb having a face orientation (111) and a ferroelectrics film including Pb having a face orientation (100), and (c) an upper electrode formed on the capacitor insulating film.
Claim 3
Dependent Claim
46 words
A semiconductor device according to claim 1, wherein a ratio of one or more elements including Pb oriented at A sites of a perovskite crystal structure, which are constituent elements of the ferroelectrics film, to other constituent elements is in a range of 0.9 to 1.4.
Claim 4
Dependent Claim
74 words
A semiconductor device according to claim 2, wherein a ratio of one or more elements including Pb oriented at the A sites relative to other constituent elements is more than one in the ferroelectrics film including Pb having the face orientation (100), and a ratio of elements including Pb oriented at the A sites relative to other constituent elements is less than one in the ferroelectrics film including Pb having the face orientation (111).
Claim 5
Dependent Claim
20 words
A semiconductor device according to claim 1, wherein material of the ferroelectrics film is Pb(Zr,Ti)O 3 or (Pb,La)(Zr,Ti)O 3 .
Claim 6
Dependent Claim
28 words
A semiconductor device according to claim 1, wherein material of the lower electrode and the upper electrode provided in contact with the ferroelectrics film is a Pt film.
Claim 7
Dependent Claim
47 words
A semiconductor device according to claim 1, wherein the ferroelectrics film including Pb having the face orientation (111) is a lowermost layer in the capacitor insulating film, and the ferroelectrics film including Pb having the face orientation (100) is an uppermost layer in the capacitor insulating film.