Electrical interconnection for attachment to a substrate

Claim 2

An electrical interconnection on a substrate comprising: a first metal layer on the substrate, the first metal layer being composed of a first metal; a first diffusion barrier layer on the first metal layer; a second metal layer composed of a second metal and situated on the first diffusion barrier layer; an organometallic layer, composed of a metal azole complex, on the second metal layer; and an electrical interconnect layer on the organometallic layer.

Claim 3

An electrical interconnection on a substrate as recited in claim 1, wherein the first metal layer is upon and in contact with a second diffusion barrier layer, said second diffusion barrier layer being upon and in contact with the substrate and prevents diffusion of either the substrate or the first metal layer therethrough.

Claim 4

An electrical interconnection on a substrate as recited in claim 1, wherein the first metal layer is composed of an electrical conducting metal selected from the group consisting of aluminum, copper, and an aluminum copper alloy.

Claim 5

An electrical interconnection on a substrate as recited in claim 1, wherein the first metal layer is composed of aluminum.

Claim 6

An electrical interconnection on a substrate as recited in claim 1, wherein the first diffusion barrier layer is composed of a metal selected from the group consisting of nickel, a refractory metal nitride and a refractory metal tungsten.

Claim 7

An electrical interconnection on a substrate as recited in claim 1, wherein the first diffusion barrier layer is composed of a metal selected from the group consisting of titanium tungsten, titanium nitride, and nickel.

Claim 8

An electrical interconnection on a substrate as recited in claim 1, wherein the second metal layer is composed of copper.

Claim 9

An electrical interconnection on a substrate as recited in claim 1, wherein the second metal layer has a thickness in a range from about 10 nm to about 10 microns.

Claim 10

An electrical interconnection on a substrate as recited in claim 1, wherein the metal forming the metal azole complex is a portion of the second metal layer.

Claim 11

An electrical interconnection on a substrate as recited in claim 1, wherein the organometallic layer is composed of an organometallic material selected from the group consisting of Cu + (BTA - ) and Cu ++ (BTA - ) 2 .

Claim 12

An electrical interconnection on a substrate as recited in claim 1, wherein the electrical interconnect layer is composed of an electrical conductive material selected from the group consisting of an electrically conductive epoxy and an electrically solder material.

Claim 13

An electrical interconnection on a substrate as recited in claim 1, wherein the electrical interconnect layer is composed of a base resin material having electrical conducting particles selected from the group consisting of silver particles and nickel particles.

Claim 14

An electrical interconnection on a substrate as recited in claim 1, wherein the organometallic layer has a thickness less than about 30 Angstroms.

Claim 15

An electrical interconnection on a substrate as recited in claim 2, wherein the second diffusion barrier layer is composed of titanium, the first metal layer is composed of a material selected from a group consisting of aluminum, copper or an aluminum copper alloy, and the substrate is composed of a silicon-containing material.

Claim 16

An electrical interconnection on a substrate as recited in claim 2, wherein the second diffusion layer is composed of titanium.

Claim 17

An electrical interconnection on a substrate as recited in claim 1, wherein the azole forming the metal azole complex is selected from the group consisting of benzimidazole, 2-methylbenzimidazole, benzotriazole, derivatives and mixtures thereof.

Claim 18

An electrical interconnection on a substrate as recited in claim 9, wherein the second metal layer is composed of copper.

Claim 19

An electrical interconnection on a substrate comprising: a first metal layer on the substrate composed of a first metal; a first diffusion barrier layer on the first metal contact layer; a second diffusion barrier layer upon and in contact with the substrate, wherein the first metal layer is upon and in contact with the second diffusion barrier layer, and wherein the second diffusion barrier layer prevents diffusion of either the substrate or the first metal layer therethrough; a second metal layer composed of a second metal and situated on the first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal or the second metal therethrough; an organometallic layer on the second metal layer; an electrical interconnect layer on the organometallic layer; and a third metal layer on the electrical interconnect layer.

Claim 20

An electrical interconnection on a substrate comprising: a first metal layer on the substrate composed of a first metal; a first diffusion barrier layer on the first metal contact layer; a second diffusion barrier layer upon and in contact with the substrate, wherein the first metal layer is upon and in contact with the second diffusion barrier layer, and wherein the second diffusion barrier layer prevents diffusion of either the substrate or the first metal layer therethrough; a second metal layer composed of a second metal and situated on the first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal or the second metal therethrough; an organometallic layer on the second metal layer; an electrical interconnect layer on the organometallic layer; and a third metal layer on the electrical interconnect layer.

Claim 21

An electrical interconnection on a substrate as recited in claim 18, further comprising a second substrate on the third metal layer.

Claim 22

An electrical interconnection on a substrate as recited in claim 18, wherein the third metal layer is composed of an electrical conducting metal selected from the group consisting of aluminum, copper and an aluminum copper alloy.

Claim 23

An electrical interconnection on a substrate as recited in claim 18, wherein the second diffusion barrier layer is composed of titanium, the first metal layer is composed of a material selected from a group consisting of aluminum, copper or an aluminum copper alloy, and the substrate is composed of a silicon-containing material.

Claim 24

An electrical interconnection on a substrate comprising: a first metal layer on the substrate comprising aluminum; a first diffusion barrier layer on the first metal layer; a second metal layer on the first diffusion barrier layer comprising copper, the first diffusion barrier layer preventing diffusion of either aluminum or copper therethrough; an organometallic layer on the second metal layer comprising a copper azole complex; and an electrical interconnect layer, composed of an electrical conductive material selected from the group consisting of an electrically conductive epoxy and an electrically solder material, on the organometallic layer.

Claim 25

An electrical interconnection on a substrate comprising: a first metal layer on the substrate comprising aluminum; a first diffusion barrier layer on the first metal layer; a second metal layer on the first diffusion barrier layer comprising copper, the first diffusion barrier layer preventing diffusion of either aluminum or copper therethrough; an organometallic layer on the second metal layer comprising a copper azole complex; and an electrical interconnect layer, composed of an electrical conductive material selected from the group consisting of an electrically conductive epoxy and an electrically solder material, on the organometallic layer.

Claim 26

An electrical interconnection on a substrate as recited in claim 22, wherein the first diffusion barrier layer is composed of a metal selected from the group consisting of nickel, titanium tungsten and titanium nitride.

Claim 27

An electrical interconnection on a substrate as recited in claim 22, wherein the first metal layer is upon and in contact with a second diffusion barrier layer that is upon and in contact with the substrate, wherein the second diffusion barrier layer prevents diffusion of either the substrate or the first metal layer therethrough.

Claim 28

An electrical interconnection on a substrate as recited in claim 24, wherein the second diffusion barrier layer is composed of titanium, the first metal layer is composed of a material selected from a group consisting of aluminum, copper or an aluminum copper alloy, and the substrate is composed of a silicon-containing material.

Claim 29

An electronic structure comprising: a first substrate including an electronic circuit; a first metal layer upon the first substrate; a first diffusion barrier layer upon the first metal layer; a second metal layer on said first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal or the second metal therethrough; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer; wherein: said first metal layer is composed of aluminum; said first diffusion barrier layer is composed of a material selected from a group consisting of nickel (Ni), a refractory metal nitride and a refractory metal tungsten; said second metal layer is composed of copper and has a thickness in a range from about 10 nm to about 10 microns: said organometallic layer is composed of a metal azole complex, having the general formula M + (azole - ) or M ++ (azole - ) 2 , wherein M represents the metal and the azole is an organic ligand; and said electrical interconnect layer is composed of electrical conducting particles including at least one of silver particles and nickel particles.

Claim 30

An electronic structure comprising: a first substrate including an electronic circuit; a first metal layer upon the first substrate; a first diffusion barrier layer upon the first metal layer; a second metal layer on said first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal or the second metal therethrough; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer; wherein: said first metal layer is composed of aluminum; said first diffusion barrier layer is composed of a material selected from a group consisting of nickel (Ni), a refractory metal nitride and a refractory metal tungsten; said second metal layer is composed of copper and has a thickness in a range from about 10 nm to about 10 microns: said organometallic layer is composed of a metal azole complex, having the general formula M + (azole - ) or M ++ (azole - ) 2 , wherein M represents the metal and the azole is an organic ligand; and said electrical interconnect layer is composed of electrical conducting particles including at least one of silver particles and nickel particles.

Claim 31

An electronic structure comprising: a first substrate including an electronic circuit; a first metal layer upon the first substrate; a first diffusion barrier layer upon the first metal layer; a second metal layer on said first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal or the second metal therethrough; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer; a third metal layer on the electrical interconnect layer and having a contact area thereon interfacing with the electrical interconnect layer; and a second substrate upon said third metal layer.

Claim 32

An electronic structure comprising: a first substrate including an electronic circuit; a first metal layer upon the first substrate; a first diffusion barrier layer upon the first metal layer; a second metal layer on said first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal or the second metal therethrough; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer; a third metal layer on the electrical interconnect layer and having a contact area thereon interfacing with the electrical interconnect layer; and a second substrate upon said third metal layer.

Claim 33

The electronic structure as defined in claim 26, further comprising a passivation layer on the first substrate.

Claim 34

An electronic structure comprising: a first substrate including an electronic circuit; a second diffusion barrier layer upon the first substrate; a first metal layer upon the second diffusion barrier layer, the second diffusion barrier layer preventing diffusion of either the first substrate or the first metal therethrough; a first diffusion barrier layer upon the first metal layer; a second metal layer on first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal layer or the second metal layer therethrough; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer.

Claim 35

An electronic structure comprising: a first substrate including an electronic circuit; a second diffusion barrier layer upon the first substrate; a first metal layer upon the second diffusion barrier layer, the second diffusion barrier layer preventing diffusion of either the first substrate or the first metal therethrough; a first diffusion barrier layer upon the first metal layer; a second metal layer on first diffusion barrier layer, the first diffusion barrier layer preventing diffusion of either the first metal layer or the second metal layer therethrough; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer.

Claim 36

The electronic structure as defined in claim 29, further comprising a third metal layer on the electrical interconnect layer and having a contact area thereon interfacing with the electrical interconnect layer; and a second substrate upon said third metal layer.

Claim 37

The electronic structure as defined in claim 29, further comprising a passivation layer on the first substrate.

Claim 38

The electronic structure as defined in claim 29, wherein: said first metal layer is composed of aluminum; said second diffusion barrier layer is composed of titanium; said first diffusion barrier layer is composed of a material selected from a group consisting of nickel, a refractory metal nitride, and a refractory metal tungsten; said second metal layer is composed of copper and has a thickness in a range from about 10 nm to about 10 microns; said organometallic layer is composed of a metal azole complex, having the general formula M + (azole - ) or M ++ (azole - ) 2 , wherein M represents the metal and the azole is an organic ligand; and said electrical interconnect layer is composed of electrical conducting particles including at least one of silver particles and nickel particles.

Claim 39

An electrical interconnection on a substrate comprising: a first metal layer on the substrate, the first metal layer being composed of a first metal; a first diffusion barrier layer on the first metal layer; a second diffusion barrier layer upon and in contact with the substrate, wherein the first metal layer is upon and in contact with the second diffusion barrier layer, said second diffusion barrier layer preventing diffusion of either the substrate or the first metal layer therethrough; a second metal layer composed of a second metal and situated on the first diffusion barrier layer; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer.

Claim 40

An electrical interconnection on a substrate comprising: a first metal layer on the substrate, the first metal layer being composed of a first metal; a first diffusion barrier layer on the first metal layer; a second diffusion barrier layer upon and in contact with the substrate, wherein the first metal layer is upon and in contact with the second diffusion barrier layer, said second diffusion barrier layer preventing diffusion of either the substrate or the first metal layer therethrough; a second metal layer composed of a second metal and situated on the first diffusion barrier layer; an organometallic layer on the second metal layer; and an electrical interconnect layer on the organometallic layer.

Claim 41

An electrical interconnection on a substrate as recited in claim 33, wherein the first metal layer is composed of an electrical conducting metal selected from the group consisting of aluminum, copper, and an aluminum copper alloy.

Claim 42

An electrical interconnection on a substrate as recited in claim 33, wherein the first metal layer is composed of aluminum.

Claim 43

An electrical interconnection on a substrate as recited in claim 33, wherein the first diffusion barrier layer is composed of a metal selected from the group consisting of nickel, a refractory metal nitride and a refractory metal tungsten.

Claim 44

An electrical interconnection on a substrate as recited in claim 33, wherein the first diffusion barrier layer is composed of a metal selected from the group consisting of titanium tungsten, titanium nitride, and nickel.

Claim 45

An electrical interconnection on a substrate as recited in claim 33, wherein the second metal layer is composed of copper.

Claim 46

An electrical interconnection on a substrate as recited in claim 33, wherein the second metal layer has a thickness in a range from about 10 nm to about 10 microns.

Claim 47

An electrical interconnection on a substrate as recited in claim 33, wherein the organometallic layer is composed of an organometallic material selected from the group consisting of Cu + (BTA - ) and Cu ++ (BTA - ) 2 .

Claim 48

An electrical interconnection on a substrate as recited in claim 33, wherein the electrical interconnect layer is composed of an electrical conductive material selected from the group consisting of an electrically conductive epoxy and an electrically solder material.

Claim 49

An electrical interconnection on a substrate as recited in claim 33, wherein the electrical interconnect layer is composed of a base resin material having electrical conducting particles selected from the group consisting of silver particles and nickel particles.

Claim 50

An electrical interconnection on a substrate as recited in claim 33, wherein the organometallic layer has a thickness less than about 30 Angstroms.

Claim 51

An electrical interconnection on a substrate comprising: a first metal layer on the substrate comprising aluminum; a first diffusion barrier layer on the first metal layer; a second diffusion barrier layer upon and in contact with the substrate, wherein the first metal layer is upon and in contact with the second diffusion barrier layer, and wherein the second diffusion barrier layer prevents diffusion of either the substrate or the first metal layer therethrough; a second metal layer on the first diffusion barrier layer comprising copper, the first diffusion barrier layer preventing diffusion of either aluminum or copper therethrough; an organometallic layer on the second metal layer comprising a copper azole complex; and an electrical interconnect layer on the organometallic layer.

Claim 52

An electrical interconnection on a substrate comprising: a first metal layer on the substrate comprising aluminum; a first diffusion barrier layer on the first metal layer; a second diffusion barrier layer upon and in contact with the substrate, wherein the first metal layer is upon and in contact with the second diffusion barrier layer, and wherein the second diffusion barrier layer prevents diffusion of either the substrate or the first metal layer therethrough; a second metal layer on the first diffusion barrier layer comprising copper, the first diffusion barrier layer preventing diffusion of either aluminum or copper therethrough; an organometallic layer on the second metal layer comprising a copper azole complex; and an electrical interconnect layer on the organometallic layer.

Claim 53

An electrical interconnection on a substrate as recited in claim 44, wherein the second diffusion barrier layer is composed of titanium, the first metal layer is composed of a material selected from a group consisting of aluminum, copper or an aluminum copper alloy, and the substrate is composed of a silicon-containing material.

Claim 54

An electrical interconnection comprising: a first metal layer on a substrate; a first diffusion barrier layer on the first metal layer; a second diffusion barrier layer in contact with the substrate and the first metal layer; a second metal layer situated on the first diffusion barrier layer; an organometallic layer on the second metal layer; an electrical interconnect layer on the organometallic layer.

Claim 55

An electrical interconnection comprising: a first metal layer on a substrate; a first diffusion barrier layer on the first metal layer; a second diffusion barrier layer in contact with the substrate and the first metal layer; a second metal layer situated on the first diffusion barrier layer; an organometallic layer on the second metal layer; an electrical interconnect layer on the organometallic layer.

Claim 56

An electrical interconnection as recited in claim 46, wherein the organometallic layer is composed of a metal azole complex.