Exposure apparatus

Claim 2

An exposure apparatus comprising: (a) an illumination optical system for illuminating a mask defining a pattern; (b) a projection optical system for forming an erect image of the pattern on a substrate, the mask and substrate being movable together in a prescribed scanning direction relative to the projection optical system to expose and transfer the pattern onto the substrate; (c) a first relative-displacement measuring system for measuring a displacement of the mask relative to the substrate in the scanning direction; (d) a second relative-displacement measuring system, separate from the first relative-displacement measuring system with a predetermined space between the first and second relative-displacement measuring systems in a direction perpendicular to the scanning direction, for measuring a displacement of the mask relative to the substrate in the scanning direction; (e) a first detection system for detecting a displacement of the mask, in the direction perpendicular to the scanning direction, from a first reference surface separate from the mask and extending in the scanning direction; (f) a second detection system for detecting a displacement of the substrate, in the direction perpendicular to the scanning direction, from a second reference surface separate from the substrate and extending in the scanning direction; (g) a position adjustment system for adjusting the position of at least one of the mask and substrate; (h) a calculation system for calculating a position-adjusting amount based on outputs from the first and second relative-displacement measuring systems and on outputs from the first and second detection systems; and (i) a control system for controlling the position adjustment system based on an output from the calculation system.

Claim 3

The exposure apparatus of claim 1, further comprising a first reference member including the first reference surface, and a second reference member including the second reference surface, wherein the first detection system detects displacement of the mask in a direction perpendicular to the scanning direction based on a displacement of the mask relative to the first reference surface; and the second detection system detects displacement of the substrate in the direction perpendicular to the scanning direction based on a displacement of the substrate relative to the second reference surface.

Claim 4

The exposure apparatus of claim 1, further comprising: a driving system for moving the mask and substrate together relative to the projection optical system in the scanning direction to expose and transfer the pattern defined by the mask onto the substrate; a third detection system for detecting a displacement, in the scanning direction, of the mask or substrate relative to the projection optical system; and a second control system for controlling the driving system based on an output from the third measuring system.

Claim 5

The exposure apparatus of claim 3, further comprising a mask stage and a substrate stage, wherein each of the first, second, and third detection systems comprises a range-measuring interferometer, each range-measuring interferometer comprising a corner reflector mounted to the mask stage or the substrate stage, each corner reflector having a vertex situated in a plane defined by the mask or substrate, respectively, held in the mask stage or substrate stage, respectively, to which the corner reflector is mounted.

Claim 6

The exposure apparatus of claim 1, further comprising a mask stage and a substrate stage, wherein each of the first and second relative-displacement measuring systems comprises a differential interferometer comprising a first corner reflector mounted to the mask stage and a second corner reflector mounted to the substrate stage, the first corner reflector including an apex situated in a plane defined by the mask held in the mask stage, and the second corner reflector including an apex situated in a plane defined by the substrate held in the substrate stage.

Claim 7

The exposure apparatus of claim 2, further comprising a source of a light beam, and wherein each of the first and second detection systems comprises: a corner reflector mounted to the mask stage or the substrate stage, the corner reflector serving as a moving mirror; a beam splitter for splitting the light beam into a reference beam directed to the respective reference member and a detection beam directed to the corner reflector; a photodetector for receiving an interference beam produced by interference of the reference beam received from the reference member with the detection beam received from the corner reflector; and a beam-fluctuation correcting unit for correcting any fluctuation in the interference beam caused by a displacement of the respective mask or substrate in a direction perpendicular to the scanning direction.

Claim 8

The exposure apparatus of claim 1, wherein the projection optical system comprises multiple projection optical units for forming an erect image of the pattern defined by the mask on a surface of the substrate at a magnification ratio of one.

Claim 9

A method for forming a pattern, as defined by a mask, on a substrate using an exposure apparatus as recited in claim 1, the method comprising the steps: (a) causing the control system to control the position adjustment system based on respective outputs from the first and second relative-displacement measuring systems and on outputs from the first and second detection systems; and (b) moving the mask and substrate together in a prescribed scanning direction with respect to the projection optical system to expose and transfer the pattern defined by the mask onto the substrate.

Claim 10

An exposure apparatus comprising: (a) an illumination optical system for illuminating a mask defining a pattern; (b) a projection optical system for forming an erect image of the pattern onto a substrate at a magnification ratio of one, the mask and substrate being moved together in a prescribed scanning direction to expose and transfer the pattern onto the substrate; (c) a first relative-displacement measuring system for measuring a displacement of the mask relative to the substrate in the scanning direction; (d) a second relative-displacement measuring system, positioned apart from the first relative-displacement measuring system with a predetermined space therebetween in a direction perpendicular to the scanning direction, for measuring a displacement of the mask relative to the substrate in the scanning direction; (e) a first detection system for detecting a displacement of the mask along the direction perpendicular to the scanning direction from a first reference surface extending substantially parallel to the scanning direction; (f) a second detection system for detecting a displacement of the substrate along the direction perpendicular to the scanning direction from a second reference surface extending substantially parallel to the scanning direction; (g) a third relative-displacement measuring system for measuring a difference between a distance from the first reference surface to the mask along the direction perpendicular to the scanning direction and a distance from the second reference surface to the substrate along the direction perpendicular to the scanning direction; (h) a correction system for determining a correction amount for correcting an influence of a fluctuation in a distance between the first reference surface and the second reference surface along the direction perpendicular to the scanning direction, the fluctuation occurring along the scanning direction; (i) a position adjustment system for adjusting the positions of at least one of the mask and substrate; (j) a calculation system for calculating a position-adjusting amount based on outputs from the first and second relative-displacement measuring systems, outputs from the first and second detection systems, and an output from the correction system; and (k) a control system for controlling the position adjustment system based on an output from the calculation system.

Claim 11

An exposure apparatus comprising: (a) an illumination optical system for illuminating a mask defining a pattern; (b) a projection optical system for forming an erect image of the pattern onto a substrate at a magnification ratio of one, the mask and substrate being moved together in a prescribed scanning direction to expose and transfer the pattern onto the substrate; (c) a first relative-displacement measuring system for measuring a displacement of the mask relative to the substrate in the scanning direction; (d) a second relative-displacement measuring system, positioned apart from the first relative-displacement measuring system with a predetermined space therebetween in a direction perpendicular to the scanning direction, for measuring a displacement of the mask relative to the substrate in the scanning direction; (e) a first detection system for detecting a displacement of the mask along the direction perpendicular to the scanning direction from a first reference surface extending substantially parallel to the scanning direction; (f) a second detection system for detecting a displacement of the substrate along the direction perpendicular to the scanning direction from a second reference surface extending substantially parallel to the scanning direction; (g) a third relative-displacement measuring system for measuring a difference between a distance from the first reference surface to the mask along the direction perpendicular to the scanning direction and a distance from the second reference surface to the substrate along the direction perpendicular to the scanning direction; (h) a correction system for determining a correction amount for correcting an influence of a fluctuation in a distance between the first reference surface and the second reference surface along the direction perpendicular to the scanning direction, the fluctuation occurring along the scanning direction; (i) a position adjustment system for adjusting the positions of at least one of the mask and substrate; (j) a calculation system for calculating a position-adjusting amount based on outputs from the first and second relative-displacement measuring systems, outputs from the first and second detection systems, and an output from the correction system; and (k) a control system for controlling the position adjustment system based on an output from the calculation system.

Claim 12

The exposure apparatus of claim 9, further comprising: a driving system for moving the mask and substrate together relative to the projection optical system along the prescribed scanning direction to expose and transfer the pattern of the mask onto the substrate; a third detection system for detection a displacement of the mask or substrate in the scanning direction relative to the projection optical system; and a second control system for controlling the driving system based on an output from the third measuring system.

Claim 13

The exposure apparatus of claim 9, wherein the first and second reference surfaces comprise respective reflective surfaces of separate respective long mirrors mounted to the projection optical system.

Claim 14

The exposure apparatus of claim 9, further comprising a mask stage and a substrate stage, and wherein the third relative-displacement measuring system comprises a differential interferometer, the exposure apparatus further comprising: a first beam splitter for splitting a light beam, emitted from a light source, into a first beam directed to the first reference surface and a second beam directed to the second reference surface; and a first photodetector for receiving an interference beam produced by interference of the first beam reflected from the first reference surface by a reflective member mounted to the mask stage and the second beam reflected from the second reference surface by a reflective member mounted to the substrate stage.

Claim 15

The exposure apparatus of claim 10, wherein each of the first, second and third detection systems comprises a range-measuring interferometer each including a corner reflector mounted to the mask stage or the substrate stage, each corner reflector having a vertex situated within a plane defined by the mask or substrate held by the mask stage or substrate stage, respectively, to which the corner reflector is mounted.

Claim 16

The exposure apparatus of claim 9, further comprising a mask stage for holding the mask and a substrate stage for holding the substrate, wherein each of the first and second relative-displacement measuring systems comprises a differential interferometer including a first corner reflector mounted to the mask stage, and a second corner reflector mounted to the substrate stage, respectively, the first corner reflector having an apex situated substantially within a pattern plane of the mask as the mask is held in the mask stage, and the second corner reflector having an apex situated substantially within a plane defined by the substrate on which the image is exposed.

Claim 17

The exposure apparatus according to claim 9, further comprising a mask stage for holding the mask and a substrate stage for holding the substrate, wherein each of the first and second detection systems comprises: a fixed mirror mounted to the projection optical system; a corner reflector fixed to a respective stage, the corner reflector serving as a moving mirror; a second beam splitter for splitting a beam emitted from a light source into a reference beam directed to the fixed mirror and a detection beam directed toward the corner reflector; a second photodetector for receiving an interference beam produced by interference between the reference beam and the detection beam reflected from the corner reflector; and a beam-fluctuation correcting unit for correcting a fluctuation in the interference beam caused by a displacement of the mask or substrate in the direction perpendicular to the scanning direction.

Claim 18

The exposure apparatus of claim 9, wherein the projection optical system comprises a plurality of projection optical units for forming an erect image of the pattern onto the substrate at a magnification ratio of one. (a) causing the control system to control the position adjustment system based on respective outputs from the first and second relative-displacement measuring systems and on outputs from the first and second detection systems; and (b) moving the mask and substrate together in a prescribed scanning direction with respect to the projection optical system to expose and transfer the pattern defined by the mask onto the substrate.

Claim 19

A method for forming a pattern, as defined by a mask, on a substrate using an exposure apparatus as recited in claim 9, the method comprising the steps: (a) calculating a correction amount for correcting an influence of a fluctuation in the distance between the first reference surface and the second reference surface in the scanning direction based on outputs from the first and second detection systems and an output from the third relative-displacement measuring system, the distance between the first reference surface and the second reference surface being perpendicular to the scanning direction; and (b) moving the mask and substrate together in the scanning direction relative to the projection optical system while causing the control system to control the position adjustment system based on outputs from the first and second relative-displacement measuring systems and an output from the correction system, thereby exposing and transferring the pattern onto the substrate.

Claim 20

An exposure apparatus comprising: (a) an illumination system for illuminating a mask defining a pattern; (b) a projection system for forming an image of the pattern on a substrate; (c) a first stage for supporting the mask, the first stage being movable in a scanning direction relative to the projection system; (d) a second stage for supporting the substrate, the second stage being movable in the scanning direction relative to the projection system; (e) a first fixed member disposed along the scanning direction for measuring a first displacement of the first stage relative to the first fixed member; and (f) a second fixed member disposed along the scanning direction for measuring a second displacement of the second stage with respect to the second fixed member.

Claim 21

An exposure apparatus comprising: (a) an illumination system for illuminating a mask defining a pattern; (b) a projection system for forming an image of the pattern on a substrate; (c) a first stage for supporting the mask, the first stage being movable in a scanning direction relative to the projection system; (d) a second stage for supporting the substrate, the second stage being movable in the scanning direction relative to the projection system; (e) a first fixed member disposed along the scanning direction for measuring a first displacement of the first stage relative to the first fixed member; and (f) a second fixed member disposed along the scanning direction for measuring a second displacement of the second stage with respect to the second fixed member.

Claim 22

The exposure apparatus of claim 18, further comprising a first detection system for detecting the first displacement and a second detection system for detecting the second displacement.

Claim 23

The exposure apparatus of claim 18, wherein the projection system comprises multiple projection units.

Claim 24

The exposure apparatus of claim 19, further comprising an adjusting system for adjusting at least one of the first displacement and the second displacement.

Claim 25

The exposure apparatus of claim 20, further comprising a first detection system for detecting the first displacement and a second detection system for detecting the second displacement.

Claim 26

The exposure apparatus of claim 22, further comprising an adjusting system for adjusting at least one of the first placement and the second placement.

Claim 27

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 18; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 28

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 19; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 29

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 20; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 30

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 21; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 31

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 22; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 32

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 23; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 33

An exposure apparatus comprising: (a) an illumination system for illuminating a mask defining a pattern; (b) a projection system for projecting an image of the pattern onto a substrate; (c) a first stage for supporting the mask, the first stage being movable in a scanning direction relative to the projection system; (d) a second stage for supporting the substrate, the second stage being movable in the scanning direction relative to the projection system; (e) a first fixed area formed along the scanning direction for measuring a first displacement of the first stage; (f) a second fixed area formed along the scanning direction for measuring a second displacement of the second stage; (g) a first detection system for detecting the first displacement with respect to the first fixed area; and (h) a second detection system for detecting the second displacement with respect to the second fixed area.

Claim 34

An exposure apparatus comprising: (a) an illumination system for illuminating a mask defining a pattern; (b) a projection system for projecting an image of the pattern onto a substrate; (c) a first stage for supporting the mask, the first stage being movable in a scanning direction relative to the projection system; (d) a second stage for supporting the substrate, the second stage being movable in the scanning direction relative to the projection system; (e) a first fixed area formed along the scanning direction for measuring a first displacement of the first stage; (f) a second fixed area formed along the scanning direction for measuring a second displacement of the second stage; (g) a first detection system for detecting the first displacement with respect to the first fixed area; and (h) a second detection system for detecting the second displacement with respect to the second fixed area.

Claim 35

The exposure apparatus of claim 30, wherein the projection system comprises multiple projection units.

Claim 36

The exposure apparatus of claim 30, further comprising an adjustment system for adjusting at least one of the first displacement and the second displacement.

Claim 37

The exposure apparatus of claim 31, further comprising an adjustment system for adjusting at least one of the first placement and the second displacement.

Claim 38

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 30; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 39

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 31; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 40

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 32; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern onto the substrate using the projection system.

Claim 41

A method for exposing a pattern, defined by a mask, onto a substrate, the method comprising the steps: (a) providing an exposure apparatus according to claim 33; (b) illuminating the mask using the illumination system; and (c) moving the mask and the substrate in the scanning direction relative to the projection system so as to expose an image of the pattern on the substrate using the projection system.