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Semiconductor integrated circuit with tungston silicide nitride thermal resistor

Assignee: Panasonic Holdings Corp
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Filing: 1997-12-11
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Granted: 2000-02-15
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Expires: 2017-12-11
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Abstract

Abstract A semiconductor integrated circuit includes a thermal resistor which is made of a tungsten silicon nitride containing at least about 5% by weight of silicon and formed on a semiconductor substrate directly or via an insulating film. The semiconductor integrated circuit is produced by a method including the steps of: forming a tungsten silicide nitride film on a semiconductor substrate; patterning the tungsten silicide nitride film in a predetermined pattern to form a thermal resistor; and forming a pair of electrodes to be connected to the thermal resistor. The semiconductor integrated circuit is provided so as to have a predetermined resistance by measuring electric characteristics of the semiconductor integrated circuit; obtaining a difference between the measured electric characteristics and desired electric characteristics to calculate a required adjusting amount of a resistance of the thermal resistor; and adjusting the resistance of the thermal resistor by the adjusting amount through heating of the thermal resistor with electric power.

Inventors

  • 👤 Takeshi Fukuda
  • 👤 Hiroshi Takenaka
  • 👤 Hidetoshi Furukawa
  • 👤 Takeshi Fukui
  • 👤 Daisuke Ueda

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:39
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/60; H10D84/611; H10D84/613; H10D84/615; H10D84/201; H10D84/204; H10D84/209

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 46 words
A semiconductor integrated circuit comprising a thermal resistor having a negative temperature coefficient of resistance which is made of tungsten silicide nitride containing silicon in a range from about 5% to about 30% by weight and formed on a semiconductor substrate directly via an insulating film.
Claim 2
Dependent Claim 46 words
A semiconductor integrated circuit comprising a thermal resistor having a negative temperature coefficient of resistance which is made of tungsten silicide nitride containing silicon in a range from about 5% to about 30% by weight and formed on a semiconductor substrate directly via an insulating film.
Claim 3
Dependent Claim 29 words
A semiconductor integrated circuit according to claim 1, wherein the thermal resistor is a thermistor resistor for compensating for temperature characteristics of a circuit formed on the semiconductor substrate.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-02-14 2003-08-16 2004-02-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-02-14 2007-08-16 2008-02-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-02-14 2011-08-16 2012-02-15 $7700.00 Window Closed / Lapsed

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