Controlling impedances of an integrated circuit

Claim 2

A semiconductor assembly comprising: a first lead; a second lead; a primary die comprising: a first bond pad located a first distance from the first lead; a second bond pad located a second distance from the second lead, the second distance being substantially different from the first distance; and a secondary support structure comprising: a first impedance matching network establishing a first impedance between the first lead and the first bond pad; and impedance between the first lead and the first bond pad; and a second impedance matching network establishing a second impedance between the second lead and the second bond pad and wherein said impedance matching networks establish matching impedances between each of said first and second bond pads and each of said first and second leads have differing first and second distances and wherein said first and second leads, said primary die and said secondary support structure being arranged such that they may be electrically coupled to one another.

Claim 3

The semiconductor assembly of claim 1, wherein the first network comprises a conductive trace.

Claim 4

The semiconductor assembly of claim 1, wherein the first network comprises a capacitor.

Claim 5

The semiconductor assembly of claim 1, further comprising: a first lead finger electrically connected to the third bond pad; and a second lead finger electrically connected to the fourth bond pad.

Claim 6

The semiconductor assembly of claim 1, wherein the first die is mounted on the second die.

Claim 7

The semiconductor assembly of claim 1, further comprising a lead frame and wherein the first and second dies are mounted beside one another on the lead frame.

Claim 8

The semiconductor assembly of claim 1, wherein the secondary support structure comprises a semiconductor die.

Claim 9

The semiconductor assembly of claim 1, wherein the secondary support structure comprises a printed circuit board.

Claim 10

A semiconductor assembly comprising: a first circuit; a second circuit; a primary die comprising: a first bond pad, a first impedance existing between the first bond pad and the first circuit; a second bond pad, a second impedance existing between the second bond pad and the second circuit, the second impedance being different from the first impedance; and a a secondary support structure comprising: a third bond pad; a fourth bond pad; a first network electrically connected to the first bond pad and configured to establish a first overall impedance between the third bond pad and the first circuit; and a second impedance matching network electrically connected to the second bond pad and configured to establish a second overall impedance between the fourth bond pad and the second circuit wherein said impedance matching networks establish matching impedances between said bond pads and said circuits, and wherein said first and second circuits and said primary die and said secondary support structure being arranged such that they may be electrically coupled to one another.

Claim 11

A semiconductor assembly comprising: a first circuit; a second circuit; a primary die comprising: a first bond pad, a first impedance existing between the first bond pad and the first circuit; a second bond pad, a second impedance existing between the second bond pad and the second circuit, the second impedance being different from the first impedance; and a a secondary support structure comprising: a third bond pad; a fourth bond pad; a first network electrically connected to the first bond pad and configured to establish a first overall impedance between the third bond pad and the first circuit; and a second impedance matching network electrically connected to the second bond pad and configured to establish a second overall impedance between the fourth bond pad and the second circuit wherein said impedance matching networks establish matching impedances between said bond pads and said circuits, and wherein said first and second circuits and said primary die and said secondary support structure being arranged such that they may be electrically coupled to one another.

Claim 12

The semiconductor assembly of claim 9, further comprising: a first lead electrically connected to the third bond pad, the first lead located a first distance from the first bond pad; and a second lead electrically connected to the fourth bond pad, the second lead located a second distance from the second bond pad, the first and second distances being substantially different.

Claim 13

The semiconductor assembly of claim 9, wherein the first die is mounted on the second die.

Claim 14

The semiconductor assembly of claim 9, further comprising a lead frame and wherein the first and second dies are mounted beside one another on the lead frame.

Claim 15

The semiconductor assembly of claim 9, wherein the secondary support structure comprises a semiconductor die.

Claim 16

The semiconductor assembly of claim 9, wherein the secondary support structure comprises a printed circuit board.

Claim 17

A semiconductor assembly comprising: a primary die, the primary die including a bond pad; and a secondary support structure including at least two bond pads, such that one of said bond pads on said secondary support structure may be electrically coupled to the bond pad on said primary die; wherein the secondary support structure has an additional bond pad and wherein an impedance matching network is located between each of said at least two bond pads of the secondary support structure and said additional bond pad wherein said impedance matching network allows for selectable impedance paths between each of said bond pads and additional bond pad.

Claim 18

A semiconductor assembly comprising: a primary die, the primary die including a bond pad; and a secondary support structure including at least two bond pads, such that one of said bond pads on said secondary support structure may be electrically coupled to the bond pad on said primary die; wherein the secondary support structure has an additional bond pad and wherein an impedance matching network is located between each of said at least two bond pads of the secondary support structure and said additional bond pad wherein said impedance matching network allows for selectable impedance paths between each of said bond pads and additional bond pad.

Claim 19

The semiconductor assembly of claim 15, wherein the primary die is mounted on the secondary support structure.

Claim 20

The semiconductor assembly of claim 15, wherein the primary die is mounted beside of the secondary support structure.

Claim 21

The semiconductor assembly of claim 15, wherein the secondary support structure comprises a semiconductor die.

Claim 22

The semiconductor assembly of claim 15, wherein the secondary support structure comprises a printed circuit board.

Claim 23

A semiconductor assembly comprising; a primary die having a bond pad; and a secondary support structure comprising: a first bond pad for forming a connection with a lead; at least two second bond pads located neat the bond pad of the primary die; and impedance matching networks between said first bond pads and each of a different one of the second bond pads wherein said impedance matching networks establish matching impedances between each of said first and second bond pads.

Claim 24

A semiconductor assembly comprising; a primary die having a bond pad; and a secondary support structure comprising: a first bond pad for forming a connection with a lead; at least two second bond pads located neat the bond pad of the primary die; and impedance matching networks between said first bond pads and each of a different one of the second bond pads wherein said impedance matching networks establish matching impedances between each of said first and second bond pads.

Claim 25

The semiconductor assembly of claim 20, wherein the primary die is mounted on the secondary support structure.

Claim 26

The semiconductor assembly of claim 20, wherein the primary die is mounted beside of the secondary support structure.

Claim 27

The semiconductor assembly of claim 20, further comprising a bond wire connecting the bond of the primary die and one of the second bond pads.

Claim 28

The semiconductor assembly of claim 20, wherein the secondary support structure comprises a semiconductor die.

Claim 29

The semiconductor assembly of claim 20, wherein the secondary support structure comprises a printed circuit board.