Test access port controller and a method of effecting communication using the same

Claim 2

A test access port controller for effecting communications across a chip boundary comprising: i) a mode store for holding data denoting one of a test mode and a diagnostic mode of operation; ii) a data output pin for outputting data serially off-chip; iii) a data input pin for inputting data serially from off-chip; iv) an input for receiving timing signals to control serial transmission of data via the input and output pins; v) a switching circuit operable in response to the mode store for selectively connecting the data output pin to receive from on-chip circuitry test data or diagnostic data; vi) logic circuitry operable to supply to said on-chip circuitry a diagnostic mode control signal to indicate a diagnostic mode of operation, wherein in the test mode of operation the test data is resultant data from a test operation having an expected and time delayed relationship with input test data and in the diagnostic mode of operation diagnostic data is conveyed both on and off chip in the form of respective independent input and output serial bit streams simultaneously through the test access port controller.

Claim 3

A test access port controller according to claim 1, wherein the mode store comprises a register for holding a value in the form of a sequence of bits to denote said one of a test mode and a diagnostic mode of operation.

Claim 4

A test access port controller according to claim 1, which comprises a bypass circuit which allows a continuous data path to be effected between the data input pin and the data output pin, the mode store being capable of holding a value to denote a bypass mode of the test access port controller wherein said continuous data path is effected.

Claim 5

A test access port controller according to claim 1, for use on an integrated circuit comprising a chain of scan latches, wherein in said test mode a scan test operation is performed.

Claim 6

A test access port controller according to claim 1, wherein in a test mode of operation said logic circuitry is operable to supply to on-chip test circuitry a test mode control signal to enable said test circuitry.

Claim 7

A test access port controller according to claim 1, which includes a timing control circuit which alters the timing control between a serial data input stream and a serial data output stream.

Claim 8

A test access port controller according to claim 6, wherein the timing control circuit alters the timing of an incoming serial data stream timed on the positive edges of incoming pulses of that stream to an outgoing serial data stream timed from outgoing negative edges of pulses of that stream.

Claim 9

A test access port controller according to claim 6, wherein the timing control circuit comprises a flip-flop.

Claim 10

A test access port controller according to claim 1, which holds the identification of an integrated circuit on which the test access port controller is provided.

Claim 13

An integrated circuit comprising a test access port controller and on-chip destination/source logic for diagnostic purposes, wherein the test access port controller comprises: i) a mode store for holding data denoting one of a test mode and a diagnostic mode of operation; ii) a data output pin for outputting data serially off-chip; iii) a data input pin for inputting data serially from off-chip; iv) an input for receiving timing signals to control serial transmission of data via the input and output pins; v) a switching circuit operable in response to the mode store for selectively connecting the data output pin to receive from on-chip circuitry test data or diagnostic data; vi) logic circuitry operable to supply to said on-chip destination/source logic a diagnostic mode control signal to indicate a diagnostic mode of operation, wherein in the test mode of operation the test data is resultant data from a test operation having an expected and time delayed relationship with input test data and in the diagnostic mode of operation diagnostic data is conveyed both on and off chip in the form of respective independent input and output serial bit streams simultaneously through the test access port controller.

Claim 14

An integrated circuit comprising a test access port controller and on-chip destination/source logic for diagnostic purposes, wherein the test access port controller comprises: i) a mode store for holding data denoting one of a test mode and a diagnostic mode of operation; ii) a data output pin for outputting data serially off-chip; iii) a data input pin for inputting data serially from off-chip; iv) an input for receiving timing signals to control serial transmission of data via the input and output pins; v) a switching circuit operable in response to the mode store for selectively connecting the data output pin to receive from on-chip circuitry test data or diagnostic data; vi) logic circuitry operable to supply to said on-chip destination/source logic a diagnostic mode control signal to indicate a diagnostic mode of operation, wherein in the test mode of operation the test data is resultant data from a test operation having an expected and time delayed relationship with input test data and in the diagnostic mode of operation diagnostic data is conveyed both on and off chip in the form of respective independent input and output serial bit streams simultaneously through the test access port controller.

Claim 15

An integrated circuit comprising a test access port controller, on-chip destination/source logic and an on-chip message converter for adapting data received from the test access port controller into a message format suited for communication with said on chip destination/source logic and for adapting data in said message format from said destination/source logic into a format suited for communication with said test access port controller, wherein said test access port controller comprises: i) a mode store for holding data denoting one of a test mode and a diagnostic mode of operation; ii) a data output pin for outputting data serially off-chip; iii) a data input pin for inputting data serially from off-chip; iv) an input for receiving timing signals to control serial transmission of data via the input and output pins; v) a switching circuit operable in response to the mode store for selectively connecting the data output pin to receive from on-chip circuitry test data or diagnostic data; vi) logic circuitry operable to supply to said on-chip destination/source logic a diagnostic mode control signal to indicate a diagnostic mode of operation, wherein in the test mode of operation the test data is resultant data from a test operation having an expected and time delayed relationship with input test data and in the diagnostic mode of operation diagnostic data is conveyed both on and off chip in the form of respective independent input and output serial bit streams simultaneously through the test access port controller.

Claim 16

An integrated circuit comprising a test access port controller, on-chip destination/source logic and an on-chip message converter for adapting data received from the test access port controller into a message format suited for communication with said on chip destination/source logic and for adapting data in said message format from said destination/source logic into a format suited for communication with said test access port controller, wherein said test access port controller comprises: i) a mode store for holding data denoting one of a test mode and a diagnostic mode of operation; ii) a data output pin for outputting data serially off-chip; iii) a data input pin for inputting data serially from off-chip; iv) an input for receiving timing signals to control serial transmission of data via the input and output pins; v) a switching circuit operable in response to the mode store for selectively connecting the data output pin to receive from on-chip circuitry test data or diagnostic data; vi) logic circuitry operable to supply to said on-chip destination/source logic a diagnostic mode control signal to indicate a diagnostic mode of operation, wherein in the test mode of operation the test data is resultant data from a test operation having an expected and time delayed relationship with input test data and in the diagnostic mode of operation diagnostic data is conveyed both on and off chip in the form of respective independent input and output serial bit streams simultaneously through the test access port controller.

Claim 17

An integrated circuit according to claim 12 including an on-chip data adaptor disposed between the test access port controller and the message converter.