IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing

Claim 2

The linear feedback shift register comprising cascaded input boundary-scan cells of an IEEE std. 1149.1 boundary scan circuit, said input boundary-scan cells forming an input boundary-scan register that is adapted to be connected to input nodes of a logic circuit of the boundary scan circuit, said input boundary-scan register being reconfigurable to operate as a test pattern generator that is adapted to provide test patterns to the logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of the boundary scan circuit, wherein: each of said input boundary-scan cells is one of a first cell, a second cell and a third cell; said first cell includes: a four-channel first multiplexer having a first data input which serves as a signal input, a second data input which serves as a feedback input, third and fourth data inputs which are connected to one another and which serve as a scan input, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output; said second cell includes: a four-channel first multiplexer having a first data input which serves as a signal input, second, third and fourth data inputs which are connected to one another and which serve as a scan input, a pair of channel select inputs which are adapted to receive said first control signal (BIST*) and said second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input which is adapted to receive said clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive said third control signal (Mode), and an output which serves as a signal output; and said third cell includes: a two-input XOR gate having a first input which serves as a feedback input, a second input which serves as a scan input, and an output; a four-channel first multiplexer having a first data input which serves a signal input, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said XOR gate, a pair of channel select inputs which are adapted to receive said first control signal (BIST*) and said second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input which is adapted to receive said clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive said third control signal (Mode), and an output which serves as a signal output.

Claim 3

The linear feedback shift register according to claim 1, wherein: said linear feedback shift register has a characteristic polynomial p(x)=1+c 1 x+c 2 x 2 +. . . +c n x n ; a first one of said input boundary-scan cells is said first cell and corresponds to a coefficient c 0 of the characteristic polynomial; and a succeeding one of said input boundary-scan cells is said second cell if a coefficient c i of the characteristic polynomial is zero for 1≦i≦n-1, and is said third cell if the coefficient c i of the characteristic polynomial is one for 1≦i≦n-1.

Claim 4

The linear feedback shift register according to claim 2, wherein a previous one of said input boundary-scan cells corresponding to the coefficient c i-1 of the characteristic polynomial is connected to a succeeding one of said input boundary-scan cells corresponding to the coefficient c i of the characteristic polynomial by connecting said scan output of said previous one to said scan input of said succeeding one, said feedback inputs of said first and third cells being connected to said scan output of a final one of said input boundary-scan cells corresponding to the coefficient c n-1 of the characteristic polynomial.

Claim 5

A multiple-input shift register, comprising cascaded output boundary-scan cells of an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cells forming an output boundary-scan register that is adapted to be connected to output nodes of a logic circuit of the boundary scan circuit, said output boundary-scan register being reconfigurable to operate as an output response analyzer driven by the logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of the boundary scan circuit, contents of said output boundary-scan register being scannable for comparison with a predetermined signature to detect presence of a fault after said predetermined number of clock cycles.

Claim 6

A multiple-input shift register, comprising cascaded output boundary-scan cells of an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cells forming an output boundary-scan register that is adapted to be connected to output nodes of a logic circuit of the boundary scan circuit, said output boundary-scan register being reconfigurable to operate as an output response analyzer driven by the logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of the boundary scan circuit, contents of said output boundary-scan register being scannable for comparison with a predetermined signature to detect presence of a fault after said predetermined number of clock cycles.

Claim 7

The multiple-input shift register according to claim 4, wherein: each of said output boundary-scan cells is one of a first cell, a second cell and a third cell; said first cell includes: a two-input XOR gate having a first input which serves as a signal input, a second input which serves as a feedback input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which serve as scan inputs, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output; said second cell includes: a two-input XOR gate having a first input which serves as a signal input, a second input which serves as a scan input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said XOR gate, a pair of channel select inputs which are adapted to receive said first control signal (BIST*) and said second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive said first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive said second clock signal (UpdateDR), and an output; and a two-channel multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive said third control signal (Mode), and an output which serves as a signal output; and said third cell includes: a two-input first XOR gate having a first input which serves as a signal input, a second input which serves as a scan input, and an output; a two-input second XOR gate having a first input which is connected to said output of said first XOR gate, a second input which serves as a feedback input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said first XOR gate, a second data input which is connected to said output of said second XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said first XOR gate, a pair of channel select inputs which are adapted to receive said first control signal (BIST*) and said second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive said first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive said second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said first XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive said third control signal (Mode), and an output which serves as a signal output.

Claim 8

The multiple-input shift register according to claim 5, wherein: said multiple-input shift register has a characteristic polynomial p(x)=1+c 1 x+c 2 x 2 +. . . +c n x n ; a first one of said output boundary-scan cells is said first cell and corresponds to a coefficient c 0 of the characteristic polynomial; and a succeeding one of said output boundary-scan cells is said second cell if a coefficient c i of the characteristic polynomial is zero for 1≦i≦n-1, and is said third cell if the coefficient c i of the characteristic polynomial is one for 1≦i≦n-1.

Claim 9

The multiple-input shift register according to claim 6, wherein a previous one of said output boundary-scan cells corresponding to the coefficient c i-1 of the characteristic polynomial is connected to a succeeding one of said output boundary-scan cells corresponding to the coefficient c i of the characteristic polynomial by connecting said scan output of said previous one to said scan input of said succeeding one, said feedback inputs of said first and third cells being connected to said scan output of a final one of said output boundary-scan cells corresponding to the coefficient c n-1 of the characteristic polynomial.

Claim 10

An input boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said input boundary-scan cell forming a part of an input boundary-scan register that is connected to input nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as a test pattern generator which provides test patterns to said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said input boundary-scan cell comprising: a four-channel first multiplexer having a first data input which serves as a signal input, a second data input which serves as a feedback input, third and fourth data inputs which are connected to one another and which serve as a scan input, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 11

An input boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said input boundary-scan cell forming a part of an input boundary-scan register that is connected to input nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as a test pattern generator which provides test patterns to said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said input boundary-scan cell comprising: a four-channel first multiplexer having a first data input which serves as a signal input, a second data input which serves as a feedback input, third and fourth data inputs which are connected to one another and which serve as a scan input, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 12

An input boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said input boundary-scan cell forming a part of an input boundary-scan register that is connected to input nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as a test pattern generator which provides test patterns to said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said input boundary-scan cell comprising: a four-channel first multiplexer having a first data input which serves as a signal input, second, third and fourth data inputs which are connected to one another and which serve as a scan input, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input which is adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 13

An input boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said input boundary-scan cell forming a part of an input boundary-scan register that is connected to input nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as a test pattern generator which provides test patterns to said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said input boundary-scan cell comprising: a four-channel first multiplexer having a first data input which serves as a signal input, second, third and fourth data inputs which are connected to one another and which serve as a scan input, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input which is adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 14

An input boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said input boundary-scan cell forming a part of an input boundary-scan register that is connected to input nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as a test pattern generator which provides test patterns to said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said input boundary-scan cell comprising: a two-input XOR gate having a first input which serves as a feedback input, a second input which serves as a scan input, and an output; a four-channel first multiplexer having a first data input which serves as a signal input, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said XOR gate, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input which is adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 15

An input boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said input boundary-scan cell forming a part of an input boundary-scan register that is connected to input nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as a test pattern generator which provides test patterns to said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said input boundary-scan cell comprising: a two-input XOR gate having a first input which serves as a feedback input, a second input which serves as a scan input, and an output; a four-channel first multiplexer having a first data input which serves as a signal input, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said XOR gate, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type flip-flop having a data input connected to said output of said first multiplexer, a clock input which is adapted to receive a clock signal (mClockDR), and an output which serves as a scan output; and a two-channel second multiplexer having a first data input which is connected to said first data input of said first multiplexer, a second data input which is connected to said output of said flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 16

An output boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cell forming a part of an output boundary-scan register that is connected to output nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as an output response analyzer which is driven by said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said output boundary-scan cell comprising: a two-input XOR gate having a first input which serves as a signal input, a second input which serves as a feedback input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which serve as scan inputs, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 17

An output boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cell forming a part of an output boundary-scan register that is connected to output nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as an output response analyzer which is driven by said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said output boundary-scan cell comprising: a two-input XOR gate having a first input which serves as a signal input, a second input which serves as a feedback input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which serve as scan inputs, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 18

An output boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cell forming a part of an output boundary-scan register that is connected to output nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as an output response analyzer which is driven by said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said output boundary-scan cell comprising: a two-input XOR gate having a first input which serves as a signal input, a second input which serves as a scan input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said XOR gate, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 19

An output boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cell forming a part of an output boundary-scan register that is connected to output nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as an output response analyzer which is driven by said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said output boundary-scan cell comprising: a two-input XOR gate having a first input which serves as a signal input, a second input which serves as a scan input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said XOR gate, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 20

An output boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cell forming a part of an output boundary-scan register that is connected to output nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as an output response analyzer which is driven by said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said output boundary-scan cell comprising: a two-input first XOR gate having a first input which serves as a signal input, a second input which serves as a scan input, and an output; a two-input second XOR gate having a first input which is connected to said output of said first XOR gate, a second input which serves as a feedback input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said first XOR gate, a second data input which is connected to said output of said second XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said first XOR gate, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said first XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.

Claim 21

An output boundary-scan cell for an IEEE Std. 1149.1 boundary scan circuit, said output boundary-scan cell forming a part of an output boundary-scan register that is connected to output nodes of a logic circuit of said boundary scan circuit and that is reconfigurable so as to operate as an output response analyzer which is driven by said logic circuit for a predetermined number of clock cycles upon receipt of a built-in self-test control signal from a test access port system of said boundary scan circuit when executing built-in self-testing, said output boundary-scan cell comprising: a two-input first XOR gate having a first input which serves as a signal input, a second input which serves as a scan input, and an output; a two-input second XOR gate having a first input which is connected to said output of said first XOR gate, a second input which serves as a feedback input, and an output; a four-channel first multiplexer having a first data input which is connected to said first input of said first XOR gate, a second data input which is connected to said output of said second XOR gate, third and fourth data inputs which are connected to one another and which are further connected to said second input of said first XOR gate, a pair of channel select inputs which are adapted to receive a first control signal (BIST*) and a second control signal (ShiftDR) respectively, and an output; a D-type first flip-flop having a data input connected to said output of said first multiplexer, a clock input adapted to receive a first clock signal (mClockDR), and an output which serves as a scan output; a D-type second flip-flop having a data input connected to said output of said first flip-flop, a clock input adapted to receive a second clock signal (UpdateDR), and an output; and a two-channel second multiplexer having a first data input which is connected to said first input of said first XOR gate, a second data input which is connected to said output of said second flip-flop, a channel select input which is adapted to receive a third control signal (Mode), and an output which serves as a signal output.