US5930658A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Oxidized oxygen-doped amorphous silicon ultrathin gate oxide structures
Assignee: Advanced Micro Devices Inc
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Filing: 1996-11-26
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Granted: 1999-07-27
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Expires: 2016-11-26
Abstract
Abstract A method of manufacturing a semiconductor device to negate the effects on the device performance caused by defects on the silicon substrate. An oxygen doped amorphous silicon layer is deposited onto the gate region of the semiconductor device and can have a thickness of less than 5 nanometers. The amorphous silicon provides a conformal layer over the defects on the silicon substrate. The oxygen doping of the amorphous silicon maintains the conformality of the amorphous silicon layer during subsequent processing by preventing the formation of large amorphous silicon grains during a crystallization process. The resulting silicon oxide layer has increased uniformity and can have a thickness of less than 10 nanometers.
Inventors
- 👤 Effiong E. Ibok
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:35
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01332; H10D64/01336; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D64/511; H10D64/514; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6322; H10D64/01344; H10D64/60; H10D64/66; H10D64/68; H10D64/693; H10P14/6308; H10P14/6309; Y; Y10; Y10S; Y10S438/00; Y10S438/966
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
143 words
A method of manufacturing a semiconductor device, the method comprising: forming a layer of oxygen doped amorphous silicon directly on a portion of a surface of a silicon substrate that will be the gate region of the semiconductor device, wherein the oxygen doped amorphous silicon is formed by injecting an oxygen containing gas into a silicon containing stream directed at the surface of the silicon substrate, wherein the oxygen containing gas is injected into the silicon containing stream with a concentration that substantially avoids the formation of silicon oxide in the layer of oxygen doped amorphous silicon during the deposition of the oxygen doped amorphous silicon and wherein the layer of oxygen doped amorphous silicon has a thickness of less than 5 nanometers; and oxidizing the amorphous silicon to form a layer of silicon oxide having a thickness of less than 10 nanometers.
Claim 2
Independent Claim
143 words
A method of manufacturing a semiconductor device, the method comprising: forming a layer of oxygen doped amorphous silicon directly on a portion of a surface of a silicon substrate that will be the gate region of the semiconductor device, wherein the oxygen doped amorphous silicon is formed by injecting an oxygen containing gas into a silicon containing stream directed at the surface of the silicon substrate, wherein the oxygen containing gas is injected into the silicon containing stream with a concentration that substantially avoids the formation of silicon oxide in the layer of oxygen doped amorphous silicon during the deposition of the oxygen doped amorphous silicon and wherein the layer of oxygen doped amorphous silicon has a thickness of less than 5 nanometers; and oxidizing the amorphous silicon to form a layer of silicon oxide having a thickness of less than 10 nanometers.
Claim 3
Dependent Claim
27 words
The method of claim 1 wherein the oxygen containing gas is injected into the silicon containing stream with a concentration on the order of parts per thousand.
Claim 4
Dependent Claim
26 words
The method of claim 2, wherein the oxidizing the amorphous silicon is accomplished by forming a layer of silicon oxide in an ambient atmosphere containing oxygen.
Claim 5
Dependent Claim
28 words
The method of claim 2, wherein the oxidizing amorphous silicon is accomplished by forming a layer of silicon oxide in an ambient atmosphere containing an oxide of nitrogen.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-07-26 | 2003-01-25 | 2003-07-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-07-26 | 2007-01-25 | 2007-07-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-07-26 | 2011-01-25 | 2011-07-27 | $7700.00 | Window Closed / Lapsed |