US5907791A
Expired / Lapsed
US
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Method of making semiconductor devices by patterning a wafer having a non-planar surface
Assignee: Avago Technologies International Sales Pte Ltd
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Filing: 1996-04-25
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Granted: 1999-05-25
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Expires: 2016-04-25
Abstract
Abstract In accordance with a specific deposition/etching sequence, a multi-layer metallization system is formed on the non-planar top surface of a semiconductor wafer. In an electrophoretic deposition step, a conformal uniform-thickness layer of a resist material is then formed on the top surface of the metallization system. In turn, the layer of resist material is lithographically patterned to provide an etch-mask for defining features in the underlying metallization system.
Inventors
- 👤 Mark Anthony Cappuzzo
- 👤 Casey Francis Kane
- 👤 Joseph Shmulovich
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 22:14
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10P; H10P76/00; H10P76/20; H10P76/204; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
117 words
A method for making devices on a substrate having a non-planar top surface, said method comprising the steps of forming a layer of silicon dioxide on the entire top surface of said substrate, partially etching the entirety of said layer of silicon dioxide thereby leaving a reduced-thickness etched layer of silicon dioxide covering the entire surface of said substrate, forming a metallization system on the entire top surface of said partially etched layer of silicon dioxide, in an electrophoretic deposition step, forming a conformal uniform-thickness layer of a resist material on said metallization system, lithographically patterning said layer of resist material to form an etch-mask, and, utilizing said etch-mask made of resist material, patterning said metallization system.
Claim 2
Independent Claim
117 words
A method for making devices on a substrate having a non-planar top surface, said method comprising the steps of forming a layer of silicon dioxide on the entire top surface of said substrate, partially etching the entirety of said layer of silicon dioxide thereby leaving a reduced-thickness etched layer of silicon dioxide covering the entire surface of said substrate, forming a metallization system on the entire top surface of said partially etched layer of silicon dioxide, in an electrophoretic deposition step, forming a conformal uniform-thickness layer of a resist material on said metallization system, lithographically patterning said layer of resist material to form an etch-mask, and, utilizing said etch-mask made of resist material, patterning said metallization system.
Claim 3
Dependent Claim
44 words
A method as in claim 1 wherein said metallization system formed on the top surface of said substrate comprises, from bottom to top, continuous layers of titanium, titanium nitride, platinum, titanium nitride and a material selected from the group consisting of titanium and chromium.
Claim 4
Dependent Claim
42 words
A method as in claim 2 wherein said material selected from the group consisting of titanium and chromium is patterned in a wet-etching step utilizing said layer made of resist material as an etch-mask therefor to form a correspondingly patterned metallic etch-mask.
Claim 5
Dependent Claim
27 words
A method as in claim 3 wherein, utilizing said metallic etch-mask, the underlying layers of titanium nitride, platinum and titanium nitride are patterned in a wet-etching step.
Claim 6
Dependent Claim
50 words
A method as in claim 4 wherein said patterned layers of titanium and titanium nitride and unmasked portions of said continuous layer of titanium are removed in a wet-etching step, thereby leaving on said substrate defined patterns each comprising, from bottom to top, layers of titanium, titanium nitride and platinum.
Claim 7
Dependent Claim
19 words
A method as in claim 5 wherein a continuous conformal layer of gold is deposited overlying said defined patterns.
Claim 8
Dependent Claim
31 words
A method as in claim 6 wherein, in a second electrophoretic deposition step, a second uniform-thickness layer of a resist material is formed on the entire top surface of said substrate.
Claim 9
Dependent Claim
26 words
A method as in claim 7 wherein said second layer of resist material is lithographically patterned to form an etch-mask for the underlying layer of gold.
Claim 10
Dependent Claim
65 words
A method as in claim 8 wherein, utilizing the etch-mask formed from said second layer of resist material, said layer of gold is patterned in a wet-etching step, and wherein the etch-mask formed from said second layer of resist material is then removed, thereby leaving on said substrate defined conductive patterns each comprising, from bottom to top, layers of titanium, titanium nitride, platinum and gold.
Claim 11
Dependent Claim
37 words
A method as in claim 1 wherein said metallization system formed on the top surface of said partially etched layer of silicon dioxide comprises, from bottom to top, continuous layers of titanium, titanium nitride, platinum and gold.
Claim 12
Dependent Claim
26 words
A method as in claim 10 wherein, utilizing said patterned layer of resist material as an etch-mask, said gold layer is patterned in a wet-etching step.
Claim 13
Dependent Claim
30 words
A method as in claim 11 wherein, again utilizing said patterned layer of resist material as an etch-mask, said titanium nitride and platinum layers are patterned in a dry-etching step.
Claim 14
Dependent Claim
63 words
A method as in claim 12 wherein, still utilizing said patterned layer of resist material as an etch-mask, said continuous layer of titanium is then patterned in a wetetching step, and wherein the patterned layer of resist material is then removed, thereby leaving on said substrate defined conductive patterns each comprising, from bottom to top, layers of titanium, titanium nitride, platinum and gold.
Claim 15
Dependent Claim
39 words
A method as in claim 1 wherein said substrate includes a non-planar v-grooved top surface, and wherein the bottoms of v-grooves in said top surface are rounded and widened during the partial etching of said layer of silicon dioxide.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2002-05-24 | 2002-11-23 | 2003-05-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-05-24 | 2006-11-23 | 2007-05-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-05-24 | 2010-11-23 | 2011-05-25 | $7700.00 | Window Closed / Lapsed |