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Membrane dielectric isolation IC fabrication

Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1997-03-10
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Granted: 1998-11-24
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Expires: 2017-03-10
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Abstract

Abstract General purpose methods for the fabrication of integrated circuits from flexible membranes formed of very thin low stress dielectric materials, such as silicon dioxide or silicon nitride, and semiconductor layers. Semiconductor devices are formed in a semiconductor layer of the membrane. The semiconductor membrane layer is initially formed from a substrate of standard thickness, and all but a thin surface layer of the substrate is then etched or polished away. In another version, the flexible membrane is used as support and electrical interconnect for conventional integrated circuit die bonded thereto, with the interconnect formed in multiple layers in the membrane. Multiple die can be connected to one such membrane, which is then packaged as a multi-chip module. Other applications are based on (circuit) membrane processing for bipolar and MOSFET transistor fabrication, low impedance conductor interconnecting fabrication, flat panel displays, maskless (direct write) lithography, and 3D IC fabrication.

Inventors

  • 👤 Glenn Joseph Leedy

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 22:41
CPC Classifications
H; H10; H10W; H10W90/00; H10P; H10P95/00; G; G03; G03F; G03F7/00; G03F7/70; G03F7/70483; G03F7/70605; G03F7/70653; G03F7/70658; G11; G11C; G11C29/00; G11C29/006; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W10/00; H10W10/01; H10W10/011; H10W10/021; H10W10/061; H10W10/10; H10W10/181; H10W10/20; H10W70/00; H10W70/60; H10W70/611; H10W70/62; H10W70/65; H10W70/67; H10W70/68; H10W70/685; H10W70/688; G02; G02F; G02F1/00; G02F1/01; G02F1/13; G02F1/133; G02F1/1333; G02F1/1345; G02F1/13452; G02F1/136; G02F1/1362; G02F1/136277; G02F1/136281; H10D; H10D84/00; H10D84/01; H10D84/02; H10D84/03; H10D84/038; H10D88/00; H10D88/01; H10D89/00; H10D89/10; H10W70/682; H10W72/00; H10W72/20; H10W72/221; H10W72/29; H10W72/90; H10W72/941; H10W72/942; H10W90/701; H10W90/721; H10W90/724; Y; Y10; Y10S; Y10S148/00; Y10S148/135; Y10S438/00; Y10S438/928; Y10S438/938; Y10S438/942; Y10S438/967; Y10S438/977; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/49128; Y10T29/49155; Y10T29/49162; Y10T29/49165; Y10T29/49169; Y10T29/49171; Y10T29/49204; Y10T29/49208; Y10T29/4921

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 47 words
A method of fabricating an integrated circuit comprising the steps of: providing a free standing membrane formed of a layer of low stress dielectric and a substrate layer; forming a plurality of transistors in the substrate layer; and forming interconnections on the dielectric layer between the transistors.
Claim 2
Independent Claim 47 words
A method of fabricating an integrated circuit comprising the steps of: providing a free standing membrane formed of a layer of low stress dielectric and a substrate layer; forming a plurality of transistors in the substrate layer; and forming interconnections on the dielectric layer between the transistors.
Claim 3
Independent Claim 46 words
A method of fabricating an integrated circuit comprising the steps of: forming a free standing membrane having a layer of low stress dielectric and a substrate layer; forming a plurality of transistors in the substrate layer; and forming interconnections on the dielectric layer between the transistors.
Claim 4
Independent Claim 46 words
A method of fabricating an integrated circuit comprising the steps of: forming a free standing membrane having a layer of low stress dielectric and a substrate layer; forming a plurality of transistors in the substrate layer; and forming interconnections on the dielectric layer between the transistors.

References Cited (Backward Citations)

US4070230A Cited
US4131985A Cited
US4539068A Cited
US4618397A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-11-23 2002-05-25 2002-11-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-11-23 2006-05-25 2006-11-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-11-23 2010-05-25 2010-11-24 $7700.00 Window Closed / Lapsed

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