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US4539068A Expired / Lapsed US ⏱️ 0.0 years remaining

Vapor phase growth method

Assignee: Fujitsu Ltd
•
Filing: 1982-08-27
•
Granted: 1985-09-03
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Expires: 2002-08-27
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Abstract

Abstract A plasma chemical vapor deposition method for forming a film on a substrate which is placed on one of a pair of electrodes oppositely arranged within the reaction chamber of a reactor. A plurality of power generators of different frequencies are applied to the electrodes to excite reactive gases introduced into the reaction chamber, whereby the reactive gases are transformed into a plasma and a desired film is formed on the substrate. Film with a small number of pinholes was formed at a relatively high deposition rate by combinations of power generator frequencies of, for example, 13.56 MHz and 1 MHz, 13.56 MHz and 50 KHz, and 5 MHz and 400 KHz.

Inventors

  • 👤 Mikio Takagi
  • 👤 Kanetake Takasaki
  • 👤 Kenji Koyama

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 00:43
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/44; C23C16/50; C23C16/505; C23C16/509; C23C16/5096

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 152 words
A method of plasma chemical vapor deposition for forming a film on a substrate, comprising the steps of: disposing the substrate in a reaction chamber having a pair of electrodes; introducing reactive gases into the reaction chamber; and simultaneously applying a plurality of electric power sources of different frequencies to the pair of electrodes to excite the reactive gases which are transformed into a plasma, the plurality of electric power sources of different frequencies including a first electric power source having a first frequency and a second electric power source having a second frequency, the first frequency providing a high deposition rate relative to the second frequency, the second frequency producing a reduced number of pinholes in the film relative to the first frequency; and depositing the film, having the reduced number of pinholes, on the substrate from the plasma generated by simultaneously applying the plurality of electric sources of different frequencies.
Claim 2
Independent Claim 152 words
A method of plasma chemical vapor deposition for forming a film on a substrate, comprising the steps of: disposing the substrate in a reaction chamber having a pair of electrodes; introducing reactive gases into the reaction chamber; and simultaneously applying a plurality of electric power sources of different frequencies to the pair of electrodes to excite the reactive gases which are transformed into a plasma, the plurality of electric power sources of different frequencies including a first electric power source having a first frequency and a second electric power source having a second frequency, the first frequency providing a high deposition rate relative to the second frequency, the second frequency producing a reduced number of pinholes in the film relative to the first frequency; and depositing the film, having the reduced number of pinholes, on the substrate from the plasma generated by simultaneously applying the plurality of electric sources of different frequencies.
Claim 3
Dependent Claim 46 words
The method as set forth in claim 1, wherein the first electric power source comprises a high frequency power source having a frequency higher than 5 MHz and wherein the second electric power source comprises a low frequency power source having a frequency below 1 MHz.
Claim 4
Dependent Claim 57 words
The method as set forth in claim 2, wherein the electric power applying step comprises mixing the outputs of the plurality of electric power sources and applying the mixed power to the pair of electrodes, the power ratio of the high frequency power source to the total power applied being on the order of 8.3 to 33.3%.

References Cited (Backward Citations)

US3472751A Cited
US3600126A Cited
US3876373A Cited
US4173661A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-09-02 1989-03-04 1989-09-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-09-02 1993-03-04 1993-09-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-09-02 1997-03-04 1997-09-03 $7700.00 Window Closed / Lapsed

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