US5821771A — Method and apparatus for monitoring or forcing an…

Claim 1

Independent Claim 87 words

A method of designing and manufacturing integrated circuits comprising the steps of: designing an integrated circuit with a voltage boost circuit, said integrated circuit comprising a select circuit; and if said boost circuit provides an acceptable boosted voltage, operating said select circuit in a first mode to utilize voltage input from a first pin in said boost circuit; and if said boost circuit does not provide an acceptable boosted voltage, operating said select circuit in a second mode to utilize a voltage input from a second pin.

Claim 2

Independent Claim 87 words

A method of designing and manufacturing integrated circuits comprising the steps of: designing an integrated circuit with a voltage boost circuit, said integrated circuit comprising a select circuit; and if said boost circuit provides an acceptable boosted voltage, operating said select circuit in a first mode to utilize voltage input from a first pin in said boost circuit; and if said boost circuit does not provide an acceptable boosted voltage, operating said select circuit in a second mode to utilize a voltage input from a second pin.

Claim 3

Dependent Claim 30 words

The method as recited in claim 1 wherein said first pin is a V cc pin, said V cc pin providing power to low voltage elements in said integrated circuit.

Claim 4

Dependent Claim 29 words

The method as recited in claim 1 wherein, in said second mode of operation, said select circuit provides input directly to a high voltage bus from said second pin.

Claim 5

Dependent Claim 30 words

The method as recited in claim 1 wherein, in said second mode of operation, said select circuit provides a higher voltage input to said boost circuit from said second pin.

Claim 6

Dependent Claim 22 words

The method as recited in claim 1 wherein said select circuit selectively connects said second pin to a boosted voltage test circuit.

Claim 7

Dependent Claim 20 words

The method as recited in claim 1 wherein said select circuit operates under the control of selective metal mask connections.

Claim 8

Dependent Claim 20 words

The method as recited in claim 1 wherein said select circuit operates under control of an EPROM or EEPROM cell.

Claim 9

Dependent Claim 19 words

The method as recited in claim 1 wherein said select circuit operates under control of a fuse or antifuse.

Claim 10

Dependent Claim 53 words

The method as recited in claim 1 further comprising the steps of: modifying circuit or manufacturing process parameters for said integrated circuit when said boost circuit does not provide said acceptable voltage; and making later versions of said integrated circuit wherein said first pin is utilized as an input to said boost circuit.

Claim 11

Dependent Claim 16 words

The method as recited in claim 1 wherein said integrated circuit is a programmable logic device.

Claim 12

Dependent Claim 21 words

The method as recited in claim 1 wherein said voltage boost circuit is utilized to program EEPROM, EPROM, or antifuse transistors.

Claim 13

Dependent Claim 29 words

The method as recited in claim 1 wherein it is determined if said boost circuit provides an acceptable boosted voltage by determining a current output of said boost circuit.

Claim 14

Dependent Claim 49 words

The method as recited in claim 1 wherein said integrated circuit is used in single voltage supply systems if said boost circuit provides said acceptable boosted voltage, and utilizing said integrated circuit in a dual voltage supply system if said boost circuit does not provide said acceptable boosted voltage.

Claim 15

Independent Claim 65 words

A method of manufacturing integrated circuits comprising the steps of: designing an integrated circuit with a voltage boost circuit; selectively connecting an output of said voltage boost circuit to a pin or other test point of said integrated circuit; and monitoring operation of said voltage boost circuit when said pin or other test point is selectively connected to said output of said voltage boost circuit.

Claim 16

Independent Claim 65 words

A method of manufacturing integrated circuits comprising the steps of: designing an integrated circuit with a voltage boost circuit; selectively connecting an output of said voltage boost circuit to a pin or other test point of said integrated circuit; and monitoring operation of said voltage boost circuit when said pin or other test point is selectively connected to said output of said voltage boost circuit.

Claim 17

Dependent Claim 25 words

The method as recited in claim 14 wherein said monitoring step is a step of identifying an output current capacity of said voltage boost circuit.

Claim 18

Dependent Claim 26 words

The method as recited in claim 14 wherein said step of selectively connecting comprises the step of connecting said pin with a metal mask or EEPROM.

Claim 19

Dependent Claim 16 words

The method as recited in claim 14 wherein said integrated circuit is a programmable logic device.

Claim 20

Dependent Claim 81 words

An integrated circuit comprising: a) programmable elements; b) at least one power supply pin; c) a high voltage internal power generation circuit; and d) a programmable switch in said integrated circuit, said programmable switch selectively i) coupling a power supply pin to a high voltage program supply line, or ii) causing said integrated circuit to use said high voltage internal power generation circuit to program said programmable elements if said high voltage internal power generation circuit provides an acceptable boosted voltage.

Claim 21

Dependent Claim 81 words

An integrated circuit comprising: a) programmable elements; b) at least one power supply pin; c) a high voltage internal power generation circuit; and d) a programmable switch in said integrated circuit, said programmable switch selectively i) coupling a power supply pin to a high voltage program supply line, or ii) causing said integrated circuit to use said high voltage internal power generation circuit to program said programmable elements if said high voltage internal power generation circuit provides an acceptable boosted voltage.

Claim 22

Dependent Claim 15 words

The integrated circuit as recited in claim 18 wherein said programmable elements are EEPROM devices.

Claim 23

Dependent Claim 26 words

The integrated circuit as recited in claim 18 wherein said programmable switch selectively connects said high voltage internal power generation circuit to program said programmable elements.

Claim 24

Dependent Claim 20 words

The integrated circuit as recited in claim 20 wherein said programmable elements control logic operations in a programmable logic device.

Claim 25

Dependent Claim 44 words

The integrated circuit as recited in claim 18 wherein said integrated circuit further comprising a pumped node for generating a voltage at a gate of a transistor, said transistor selectively passing or not passing said high voltage from one of said power supply pins.

Claim 26

Dependent Claim 44 words

The integrated circuit as recited in claim 18 in a system comprising only voltage supply below a voltage required to program said programmable elements, wherein said programmable switch is programmed to utilize said high voltage internal power generation circuit to program said programmable elements.

Claim 27

Dependent Claim 28 words

The integrated circuit as recited in claim 18 wherein said programmable switch is programmed to permit monitoring of a voltage or current needed to program said programmable elements.

Claim 28

Independent Claim 66 words

A method of operating an integrated circuit comprising: selecting between an internal and an external supply for a programming voltage, wherein said internal supply is selected if said internal supply provides an acceptable boosted voltage; programming at least one programmable element in said integrated circuit with a high voltage, from said selected internal or external supply; and using said integrated circuit to perform a desired operation.

Claim 29

Independent Claim 66 words

A method of operating an integrated circuit comprising: selecting between an internal and an external supply for a programming voltage, wherein said internal supply is selected if said internal supply provides an acceptable boosted voltage; programming at least one programmable element in said integrated circuit with a high voltage, from said selected internal or external supply; and using said integrated circuit to perform a desired operation.

Claim 30

Dependent Claim 16 words

The method as recited in claim 25 wherein said desired operation is a programmable logic operation.

Claim 31

Dependent Claim 14 words

The method as recited in claim 25 wherein said programmable element is an EEPROM.

Claim 32

Dependent Claim 30 words

The method as recited in claim 25 further comprising the step of testing said integrated circuit to determine if said programmable element is programmed with a selected voltage or current.

Claim 33

Dependent Claim 39 words

The method as recited in claim 25 wherein said method is carried out in a system with a supply voltage less than a voltage required for programming said programmable element, and wherein said programming step selects said internal supply.

Claim 34

Dependent Claim 68 words

A programmable logic integrated circuit device comprising: a plurality of EEPROM transistors, said EEPROM transistors selecting a desired logic function in said programmable logic device; and a program voltage supply select switch, said program voltage select switch selecting between the use of an internal and an external supply for programming said EEPROM transistors, wherein said internal supply is used if said internal supply provides an acceptable boosted voltage.

Claim 35

Dependent Claim 68 words

A programmable logic integrated circuit device comprising: a plurality of EEPROM transistors, said EEPROM transistors selecting a desired logic function in said programmable logic device; and a program voltage supply select switch, said program voltage select switch selecting between the use of an internal and an external supply for programming said EEPROM transistors, wherein said internal supply is used if said internal supply provides an acceptable boosted voltage.

Claim 36

Dependent Claim 25 words

The programmable logic device recited in claim 30 wherein said EEPROM transistors are placed in an array of logic blocks in said programmable logic device.

Claim 37

Dependent Claim 45 words

The programmable logic device recited in claim 30 wherein said programmable logic device is utilized in a system comprising a voltage supply below a voltage required to program said EEPROM transistors, and wherein said program voltage select switch is programmed to select said internal supply.

Claim 38

Dependent Claim 30 words

The integrated circuit device as recited in claims 18 or 30 further comprising a metal region selectively connected for internal supply generation from a lower of two possible voltage levels.

Claim 39

Dependent Claim 28 words

The programmable logic device as recited in claim 30 wherein said supply select switch further selects for monitoring of a voltage or current needed to program said device.

Claim 40

Dependent Claim 85 words

An integrated circuit comprising: a) programmable elements; b) at least one power supply pin; c) a high voltage internal power generation circuit; and d) a programmable switch in said integrated circuit, said programmable switch selectively i) coupling a power supply pin to a high program voltage supply line, or ii) causing said integrated circuit to use said high voltage internal power generation circuit to program said programmable elements and is programmed to permit monitoring of a voltage or current needed to program said programmable elements.

Claim 41

Dependent Claim 85 words

An integrated circuit comprising: a) programmable elements; b) at least one power supply pin; c) a high voltage internal power generation circuit; and d) a programmable switch in said integrated circuit, said programmable switch selectively i) coupling a power supply pin to a high program voltage supply line, or ii) causing said integrated circuit to use said high voltage internal power generation circuit to program said programmable elements and is programmed to permit monitoring of a voltage or current needed to program said programmable elements.

Claim 42

Independent Claim 69 words

A method of operating an integrated circuit comprising: selecting between an internal and an external supply for a programming voltage; programming at least one programmable element in said integrated circuit with a high voltage, from said selected internal or external supply; testing said integrated circuit to determine if said programmable element is programmed with a selected voltage or current; and using said integrated circuit to perform a desired operation.

Claim 43

Independent Claim 69 words

A method of operating an integrated circuit comprising: selecting between an internal and an external supply for a programming voltage; programming at least one programmable element in said integrated circuit with a high voltage, from said selected internal or external supply; testing said integrated circuit to determine if said programmable element is programmed with a selected voltage or current; and using said integrated circuit to perform a desired operation.

Claim 44

Dependent Claim 86 words

An integrated circuit comprising: a) programmable elements; b) at least one power supply pin; c) a high voltage internal power generation circuit; d) a metal region selectively connected for internal supply generation from a lower of two possible voltage levels; and e) a programmable switch in said integrated circuit, said programmable switch selectively i) coupling a power supply pin to a high program voltage supply line, or ii) causing said integrated circuit to use said high voltage internal power generation circuit to program said programmable elements.

Claim 45

Dependent Claim 86 words

An integrated circuit comprising: a) programmable elements; b) at least one power supply pin; c) a high voltage internal power generation circuit; d) a metal region selectively connected for internal supply generation from a lower of two possible voltage levels; and e) a programmable switch in said integrated circuit, said programmable switch selectively i) coupling a power supply pin to a high program voltage supply line, or ii) causing said integrated circuit to use said high voltage internal power generation circuit to program said programmable elements.

Claim 46

Dependent Claim 68 words

A programmable logic integrated circuit device comprising: a plurality of EEPROM transistors, said EEPROM transistors selecting a desired logic function in said programmable logic device; and a program voltage supply select switch, said program voltage select switch selecting between the use of an internal and an external supply for programming said EEPROM transistors, and further selects for monitoring of a voltage or current needed to program said device.

Claim 47

Dependent Claim 68 words

A programmable logic integrated circuit device comprising: a plurality of EEPROM transistors, said EEPROM transistors selecting a desired logic function in said programmable logic device; and a program voltage supply select switch, said program voltage select switch selecting between the use of an internal and an external supply for programming said EEPROM transistors, and further selects for monitoring of a voltage or current needed to program said device.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	2001-10-12	2002-04-13	2002-10-13	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	2005-10-12	2006-04-13	2006-10-13	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	2009-10-12	2010-04-13	2010-10-13	$7700.00	Window Closed / Lapsed

Method and apparatus for monitoring or forcing an internal node in a programmable device

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