US5795823A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Self aligned via dual damascene
Assignee: GlobalFoundries Inc
•
Filing: 1996-11-20
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Granted: 1998-08-18
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Expires: 2016-11-20
Abstract
Abstract A method of fabricating an interconnection level of conductive lines and connecting vias separated by insulation for integrated circuits and substrate carriers for semiconductor devices using dual damascene with only one mask pattern for the formation of both the conductive lines and vias. The mask pattern of conductive lines contains laterally enlarged areas where the via openings are to formed in the insulating material. After the conductive line openings with laterally enlarged areas are created, the openings are filled with a conformal material whose etch selectivity is substantially less than the etch selectivity of the insulating material to the enchant for etching the insulating material and whose etch selectivity is substantially greater than the insulating material to its enchant. The conformal material is anisotropically etched to form sidewalls in the enlarged area and remove the material between the sidewalls but leave material remaining in the parts of the conductive lines openings. The sidewalls serve as self aligned mask for etching via openings. The conformal material is either a conductive material which is left in place after the via openings are formed or an insulating material which is removed. In the former, the partially filled conductive line openings are filled with additional conductive material along with the via, which is either the same or different conductive material. In the latter, the conductive line openings and vias are filled with the same conductive material.
Inventors
- 👤 Steven Avanzino
- 👤 Subhash Gupta
- 👤 Rich Klein
- 👤 Scott D. Luning
- 👤 Ming-Ren Lin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 20:10
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/074; H10W20/076; H10W20/031; H10W20/056; H10W20/069; H10W20/0693; H10W20/081; H10W20/084; H10W20/085; H10W20/40; H10W20/41; H10W20/42; H10W20/0888
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
164 words
A method of fabricating interconnecting conductive lines and conductive vias in a layer of insulating material comprising the steps of: creating a pattern for a conductive line opening having enlarged regions at sections in the line opening to be via openings and about half of the width of the width of the conductive line; etching said pattern partially through the insulating layer so that a conductive line opening is formed in the upper half of the layer; depositing a material having etch selectivity different from the material of the insulating layer; etching said deposited material to form sidewalls in the enlarged regions and to expose the insulating layer between the sidewalls; etching said exposed insulating layer between the sidewalls with the sidewalls and the deposited material at each end of the sidewalls serving as an etch mask so that a via opening is formed in the lower half of the insulating layer; and filling said conductive line opening and via opening with conductive material.
Claim 2
Independent Claim
164 words
A method of fabricating interconnecting conductive lines and conductive vias in a layer of insulating material comprising the steps of: creating a pattern for a conductive line opening having enlarged regions at sections in the line opening to be via openings and about half of the width of the width of the conductive line; etching said pattern partially through the insulating layer so that a conductive line opening is formed in the upper half of the layer; depositing a material having etch selectivity different from the material of the insulating layer; etching said deposited material to form sidewalls in the enlarged regions and to expose the insulating layer between the sidewalls; etching said exposed insulating layer between the sidewalls with the sidewalls and the deposited material at each end of the sidewalls serving as an etch mask so that a via opening is formed in the lower half of the insulating layer; and filling said conductive line opening and via opening with conductive material.
Claim 3
Dependent Claim
23 words
The method of claim 1 wherein said insulating layer is two layers, one for the via and the other for the conductive line.
Claim 4
Dependent Claim
19 words
The method of claim 2 wherein said two layers of insulating material are separated by a thin etch stop.
Claim 5
Dependent Claim
36 words
The method of claim 2 wherein said two layers of insulating material are of different materials with different etch selectivity to the same etchant, with the lower of the two layer serving as an etch stop.
Claim 6
Dependent Claim
21 words
The method of claim 1 wherein said deposited material is a nonmetal and is removed after the via opening is formed.
Claim 7
Dependent Claim
177 words
In the method of fabricating a multilevel interconnection structure with at least one level of interconnection, said level of interconnection having at least one conductive line and at least one conductive via with the via in contact with the conductive line comprising: providing an insulating material of essentially the thickness of an interconnection level and having an upper layer and a lower layer; forming an opening in said upper layer for a conductive line having substantially parallel sides and with at least one enlarged region laterally extending from at least one side of the conductive line opening; depositing in said opening a conformal material having an removal selectivity different from the removal selectivity of said insulating material; removing said deposited material to form a sidewall of the deposited material in said laterally extending region and an opening in the deposited material adjacent to said sidewall; using said sidewall as a mask to remove the insulating material in said lower layer and form a via opening; and filling said conductive line opening and via opening with conductive material.
Claim 8
Dependent Claim
177 words
In the method of fabricating a multilevel interconnection structure with at least one level of interconnection, said level of interconnection having at least one conductive line and at least one conductive via with the via in contact with the conductive line comprising: providing an insulating material of essentially the thickness of an interconnection level and having an upper layer and a lower layer; forming an opening in said upper layer for a conductive line having substantially parallel sides and with at least one enlarged region laterally extending from at least one side of the conductive line opening; depositing in said opening a conformal material having an removal selectivity different from the removal selectivity of said insulating material; removing said deposited material to form a sidewall of the deposited material in said laterally extending region and an opening in the deposited material adjacent to said sidewall; using said sidewall as a mask to remove the insulating material in said lower layer and form a via opening; and filling said conductive line opening and via opening with conductive material.
Claim 9
Dependent Claim
19 words
The method of claim 6 wherein said enlarged region laterally extends from both sides of the conductive line opening.
Claim 10
Dependent Claim
34 words
The method of claim 6 wherein said insulating material of said upper layer is different from insulating material of said lower layer and each insulating material having a different removal selectivity from the other.
Claim 11
Dependent Claim
36 words
The method of claim 6 wherein said insulating material in the upper layer and lower layer are the same and are separated by a thin barrier layer having a removal selectivity different from the insulating material.
Claim 12
Dependent Claim
17 words
The method of claim 6 wherein the removal of the conformal deposited material is by anisotropic etching.
Claim 13
Dependent Claim
13 words
The method of claim 6 wherein the conformal deposited material is a metal.
Claim 14
Dependent Claim
21 words
The method of claim 6 wherein the conformal deposited material is a non-metal and is removed after forming said via opening.
Claim 15
Dependent Claim
21 words
The method of claim 6 wherein said conductive material filling the line opening and the via opening is the same material.
Claim 16
Dependent Claim
24 words
The method of claim 6 wherein said conductive material filling the via opening is different from the conductive material filling the conductive line opening.
Claim 17
Independent Claim
174 words
A method of fabricating interconnecting conductive lines and conductive vias in a layer of insulating material comprising the steps of: creating a pattern for a conductive line opening having enlarged regions at sections in the line opening to be via openings and about half of the width of the width of the conductive line; etching said pattern partially through the insulating layer so that a conductive line opening is formed in the upper half of the layer; depositing a conformal conductive metal having etch selectivity different from the material of the insulating layer, said metal becoming part of the conductive line; etching said deposited material to form sidewalls in the enlarged regions and to expose the insulating layer between the sidewalls; etching said exposed insulating layer between the sidewalls with the sidewalls and the deposited material at each end of the sidewalls serving as an etch mask so that a via opening is formed in the lower half of the insulating layer; and filling said conductive line opening and via opening with conductive material.
Claim 18
Independent Claim
174 words
A method of fabricating interconnecting conductive lines and conductive vias in a layer of insulating material comprising the steps of: creating a pattern for a conductive line opening having enlarged regions at sections in the line opening to be via openings and about half of the width of the width of the conductive line; etching said pattern partially through the insulating layer so that a conductive line opening is formed in the upper half of the layer; depositing a conformal conductive metal having etch selectivity different from the material of the insulating layer, said metal becoming part of the conductive line; etching said deposited material to form sidewalls in the enlarged regions and to expose the insulating layer between the sidewalls; etching said exposed insulating layer between the sidewalls with the sidewalls and the deposited material at each end of the sidewalls serving as an etch mask so that a via opening is formed in the lower half of the insulating layer; and filling said conductive line opening and via opening with conductive material.
Claim 19
Dependent Claim
17 words
The method of claim 15 wherein said conformal metal is either aluminum or an alloy of aluminum.
Claim 20
Dependent Claim
27 words
The method of claim 15 wherein said conductive material for filling said conductive line opening and via opening is a metal different from said conformal deposited metal.
Claim 21
Dependent Claim
35 words
The method of claim 17 wherein said conformal deposited metal is either aluminum or an alloy of aluminum of aluminum and said conductive material is tungsten surrounded by the conformal deposited metal at the via.
Claim 22
Independent Claim
236 words
A method of fabricating interconnecting conductive lines and conductive vias in a layer of insulating material comprising the steps of: creating a pattern for a conductive line opening having enlarged regions at sections in the line opening to be via openings and about half of the width of the width of the conductive line, said width of each enlarged region of the conductive line opening being determined by the following equation: ##EQU3## where W is the width of the enlarged region from one side of the conductive line, b is the width of the conductive line and the enlarged regions on both sides of the conductive line and the enlarged regions on both sides of the conductive line, and y is the width of the via; etching said pattern partially through the insulating layer so that a conductive line opening is formed in the upper half of the layer; depositing a material having etch selectivity different from the material of the insulating layer; etching said deposited material to form sidewalls in the enlarged regions and to expose the insulating layer between the sidewalls; etching said exposed insulating layer between the sidewalls with the sidewalls and the deposited material at each end of the sidewalls serving as an etch mask so that a via opening is formed in the lower half of the insulating layer; and filling said conductive line opening and via opening with conductive material.
Claim 23
Independent Claim
236 words
A method of fabricating interconnecting conductive lines and conductive vias in a layer of insulating material comprising the steps of: creating a pattern for a conductive line opening having enlarged regions at sections in the line opening to be via openings and about half of the width of the width of the conductive line, said width of each enlarged region of the conductive line opening being determined by the following equation: ##EQU3## where W is the width of the enlarged region from one side of the conductive line, b is the width of the conductive line and the enlarged regions on both sides of the conductive line and the enlarged regions on both sides of the conductive line, and y is the width of the via; etching said pattern partially through the insulating layer so that a conductive line opening is formed in the upper half of the layer; depositing a material having etch selectivity different from the material of the insulating layer; etching said deposited material to form sidewalls in the enlarged regions and to expose the insulating layer between the sidewalls; etching said exposed insulating layer between the sidewalls with the sidewalls and the deposited material at each end of the sidewalls serving as an etch mask so that a via opening is formed in the lower half of the insulating layer; and filling said conductive line opening and via opening with conductive material.
Claim 24
Dependent Claim
247 words
In the method of fabricating a multilevel interconnection structure with at least one level of interconnection, said level of interconnection having at least one conductive via with the via in contact with the conductive line comprising: providing an insulating material of essentially the thickness of an interconnection level and having an upper layer and a lower layer; forming an opening in said upper layer for a conductive line having substantially parallel sides and with at least one enlarged region laterally extending from at least one side of the conductive line opening and having a width, said width of each enlarged region of the conductive line opening being determined by the following equation: ##EQU4## where W is the width of the enlarged region from one side of the conductive line, b is the width of the conductive line and the enlarged regions on both sides of the conductive line and the enlarged regions on both sides of the conductive line, and y is the width of the via; depositing in said opening a conformal material having a removal selectivity different from the removal selectivity of said insulating material; removing said deposited material to form a sidewall of the deposited material in said laterally extending region and an opening in the deposited material adjacent to said sidewall; using said sidewall as a mask to remove the insulating material in said lower layer and form a via opening; and filling said conductive line opening and via opening with conductive material.
Claim 25
Dependent Claim
247 words
In the method of fabricating a multilevel interconnection structure with at least one level of interconnection, said level of interconnection having at least one conductive via with the via in contact with the conductive line comprising: providing an insulating material of essentially the thickness of an interconnection level and having an upper layer and a lower layer; forming an opening in said upper layer for a conductive line having substantially parallel sides and with at least one enlarged region laterally extending from at least one side of the conductive line opening and having a width, said width of each enlarged region of the conductive line opening being determined by the following equation: ##EQU4## where W is the width of the enlarged region from one side of the conductive line, b is the width of the conductive line and the enlarged regions on both sides of the conductive line and the enlarged regions on both sides of the conductive line, and y is the width of the via; depositing in said opening a conformal material having a removal selectivity different from the removal selectivity of said insulating material; removing said deposited material to form a sidewall of the deposited material in said laterally extending region and an opening in the deposited material adjacent to said sidewall; using said sidewall as a mask to remove the insulating material in said lower layer and form a via opening; and filling said conductive line opening and via opening with conductive material.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-08-17 | 2002-02-16 | 2002-08-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-08-17 | 2006-02-16 | 2006-08-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-08-17 | 2010-02-16 | 2010-08-18 | $7700.00 | Window Closed / Lapsed |