US5776660A
Expired / Lapsed
US
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Fabrication method for high-capacitance storage node structures
Assignee: GlobalFoundries Inc
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Filing: 1997-02-03
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Granted: 1998-07-07
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Expires: 2017-02-03
Abstract
Abstract A high capacitance storage node structure is created in a substrate by patterning a hybrid resist (12) to produce both negative tone (16) and positive tone (18) areas in the exposed region (14). After removal of the positive tone areas (18), the substrate (12) is etched using the unexposed hybrid resist (12) and negative tone area (16) as a mask. This produces a trench (22) in the substrate (12) with a centrally located, upwardly projecting protrusion (24). The capacitor (26) is then created by coating the sidewalls of the trench (22) and protrusion (24) with dielectric (28) and filling the trench with conductive material (30) such as polysilicon.
Inventors
- 👤 Mark C. Hakey
- 👤 Steven J. Holmes
- 👤 David V. Horak
- 👤 William H. Ma
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 05:19
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692; H10D1/711; G; G03; G03F; G03F7/00; G03F7/004; G03F7/038; G03F7/039; G03F7/09; G03F7/095; H10P; H10P50/00; H10P50/69; H10P50/691; H10P50/693; H10P50/694; H10P76/00; H10P76/20; H10P76/204; H10P76/2041; G03F7/0045; Y; Y10; Y10S; Y10S430/00; Y10S430/167; Y10S430/168; Y10T; Y10T428/00; Y10T428/24; Y10T428/24355; Y10T428/24628
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
194 words
A method for fabricating a high capacitance storage node structure in a substrate, comprising the steps of: coating a substrate with a hybrid resist which functions either as a positive tone resist or a negative tone resist depending upon radiant energy exposure intensity; patterning said hybrid resist with radiant energy of first and second intensities, where said first and second intensities are not equal, to simultaneously produce a pattern with an exposed region having both a positive tone resist area surrounding a negative tone resist area, and an unexposed region; removing hybrid resist from said positive tone resist area of said exposed region to expose said substrate under said positive tone resist area in said exposed region of said pattern; etching said substrate using said hybrid resist in said unexposed region and in said negative tone resist area of said exposed region as a mask, said etching step creating a trench in said substrate which surrounds a projection positioned under said hybrid resist material in said negative tone resist area of said exposed region; coating sidewalls of said trench and said projection with a dielectric material; and filling said trench with a conductive material.
Claim 2
Independent Claim
194 words
A method for fabricating a high capacitance storage node structure in a substrate, comprising the steps of: coating a substrate with a hybrid resist which functions either as a positive tone resist or a negative tone resist depending upon radiant energy exposure intensity; patterning said hybrid resist with radiant energy of first and second intensities, where said first and second intensities are not equal, to simultaneously produce a pattern with an exposed region having both a positive tone resist area surrounding a negative tone resist area, and an unexposed region; removing hybrid resist from said positive tone resist area of said exposed region to expose said substrate under said positive tone resist area in said exposed region of said pattern; etching said substrate using said hybrid resist in said unexposed region and in said negative tone resist area of said exposed region as a mask, said etching step creating a trench in said substrate which surrounds a projection positioned under said hybrid resist material in said negative tone resist area of said exposed region; coating sidewalls of said trench and said projection with a dielectric material; and filling said trench with a conductive material.
Claim 3
Dependent Claim
27 words
The method recited in claim 1 wherein said patterning step is performed using actinic radiation selected from the group consisting of I-line, E-beam, X-ray, and deep ultraviolet.
Claim 4
Dependent Claim
25 words
The method of claim 1 wherein said radiant energy of said second intensity is of greater intensity than said radiant energy of said first intensity.
Claim 5
Dependent Claim
20 words
The method of claim 3 wherein said radiant energy of said second intensity has an intensity ranging from 15-25 mJ.
Claim 6
Dependent Claim
20 words
The method of claim 3 wherein said radiant energy of said first intensity has an intensity ranging from 5-10 mJ.
Claim 7
Dependent Claim
15 words
The method of claim 1 wherein said conductive material in said filling step is polysilicon.
Claim 8
Dependent Claim
15 words
The method of claim 1 wherein said substrate in said first coating step is silicon.
Claim 9
Dependent Claim
16 words
The method of claim 1 wherein said step of etching is performed by reactive ion etching.
Claim 10
Dependent Claim
31 words
The method of claim 1 wherein said step of removing is performed by a process selected from the group consisting of oxygen or ozone plasma stripping and stripping with oxidizing acid.
Claim 11
Dependent Claim
28 words
The method of claim 1 further comprising the step of coating sidewalls of said trench and said projection with a dielectric material prior to said step of filling.
Claim 12
Dependent Claim
14 words
The method of claim 10 wherein said second coating step is performed by deposition.
Claim 13
Dependent Claim
30 words
The method of claim 1 wherein said dielectric material in said second coating step is selected from the group consisting of silicon dioxide, silicon nitride, silicon oxynitride, and tantalum oxide.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-07-06 | 2002-01-05 | 2002-07-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-07-06 | 2006-01-05 | 2006-07-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-07-06 | 2010-01-05 | 2010-07-07 | $7700.00 | Window Closed / Lapsed |