Patent US5764072A successfully refreshed from Google Patents.
US5764072A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dual contact probe assembly for testing integrated circuits
Assignee: Nidec SV Probe Pte Ltd
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Filing: 1996-12-20
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Granted: 1998-06-09
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Expires: 2016-12-20
Abstract
Abstract An assembly for making electrical connections to unpackaged integrated circuits using dual contact probes. The probes are said to be dual contact because they contact both the integrated device under test and the testing circuit. The probes have two tips. One tip is located at the end of each leg of the "U"-shaped probe. In operation, the probes are oriented with the legs of the probes extending horizontally and the tips pointing up and down, contacting the IC under test and the testing circuit. The probes are each made of a single piece of metal, and so provide an electrical connection between the IC and testing circuit. Flexing in the legs provides springiness for assuring good contact. The probes are mounted on a rigid block that is rigidly connected to the testing circuit and IC under test. Alignment plates are used to accurately position the probes. The plates can be horizontal or vertical and they have holes or slots that engage parts of the probes. The holes and slots are placed to provide proper positioning of the probes.
Inventors
- 👤 January Kister
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 07:43
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2886
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
168 words
A circuit testing mechanism for simultaneously contacting contact pads of a DUT and maintaining contact with contact pads of a testing circuit by using dual-contact probes, said dual-contact probes having a mounting section from which extends a first beam terminating in a first tip portion and a second beam terminating in a second tip portion, said circuit testing mechanism comprising: a) a mounting block for fixedly mounting said dual-contact probes by said mounting section such that said first beam and said second beam experience independent flexure under the application of a contact force to said tip portions, and such that said first beam and said second beam extend away from said mounting block; b) a means for positioning said testing circuit such that said the contact pads of said testing circuit maintain contact with said first tip of said dual-contact probes; and c) a means for driving said DUT such that the contact pads of said DUT come in contact with said second tip of said dual-contact probes.
Claim 2
Dependent Claim
168 words
A circuit testing mechanism for simultaneously contacting contact pads of a DUT and maintaining contact with contact pads of a testing circuit by using dual-contact probes, said dual-contact probes having a mounting section from which extends a first beam terminating in a first tip portion and a second beam terminating in a second tip portion, said circuit testing mechanism comprising: a) a mounting block for fixedly mounting said dual-contact probes by said mounting section such that said first beam and said second beam experience independent flexure under the application of a contact force to said tip portions, and such that said first beam and said second beam extend away from said mounting block; b) a means for positioning said testing circuit such that said the contact pads of said testing circuit maintain contact with said first tip of said dual-contact probes; and c) a means for driving said DUT such that the contact pads of said DUT come in contact with said second tip of said dual-contact probes.
Claim 3
Dependent Claim
27 words
The circuit testing mechanism of claim 1 wherein said dual-contact probes are substantially U-shaped, said first beam and said second beam constituting the legs of the U-shape.
Claim 4
Dependent Claim
13 words
The circuit testing mechanism of claim 1 further comprising a mounting block tongue.
Claim 5
Dependent Claim
14 words
The circuit testing mechanism of claim 1 further comprising at least one alignment plate.
Claim 6
Dependent Claim
18 words
The circuit testing mechanism of claim 1 wherein at least one of said alignment plates is oriented vertically.
Claim 7
Dependent Claim
18 words
The circuit testing mechanism of claim 1 wherein at least one of said alignment plates is oriented horizontally.
Claim 8
Dependent Claim
17 words
The circuit testing mechanism of claim 1 wherein at least one of said alignment plates is removable.
Claim 9
Dependent Claim
32 words
The circuit testing mechanism of claim 1 wherein said alignment plate has vertical slots and said first tip portion and said second tip portion have heels for placing into said vertical slots.
Claim 10
Dependent Claim
20 words
The circuit testing mechanism of claim 8 wherein said heels have a sloped edge for wedging into said vertical slots.
Claim 11
Dependent Claim
19 words
The circuit testing mechanism of claim 1 wherein said alignment plate has horizontal slots for receiving lateral locator plates.
Claim 12
Dependent Claim
24 words
The circuit testing mechanism of claim 10 wherein said mounting section of said dual-contact probes has a slit for engaging said lateral locator plates.
Claim 13
Dependent Claim
20 words
The circuit testing mechanism of claim 10 wherein said lateral locator plates extend in-between mounting sections of said dual-contact probes.
Claim 14
Dependent Claim
27 words
The circuit testing mechanism of claim 1 wherein said dual-contact probes have a through-hole in said mounting section for receiving a pin to stabilize said dual-contact probes.
Claim 15
Dependent Claim
19 words
The circuit testing mechanism of claim 1 further comprising epoxy for mounting said dual-contact probes on said support block.
Claim 16
Dependent Claim
18 words
The circuit testing mechanism of claim 1 further comprising a clamping device for removably securing said testing circuit.
Claim 17
Dependent Claim
17 words
The circuit testing mechanism of claim 15 wherein said clamping device is affixed on said mounting block.
Claim 18
Dependent Claim
21 words
The circuit testing mechanism of claim 1 wherein at least one of said alignment plates is a dual layer alignment plate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-06-08 | 2001-12-08 | 2002-06-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-06-08 | 2005-12-08 | 2006-06-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-06-08 | 2009-12-08 | 2010-06-09 | $7700.00 | Window Closed / Lapsed |