Contact probe assembly having rotatable contacting probe elements

Claim 1

An electrical probe assembly comprising a plurality of elongated probe elements formed of conductive and flexible material, each having a length many times its diameter, spaced upper and lower flat support elements haaving apertures receiving the ends of said probe elements and maintaining said probe elements in generally parallel arrangement with at least the lower ends in a configuration corresponding to the pad configuration to be contacted, and protruding beyond the lower support element, a means to simultaneously rotate said probe element wherein said probe elements are each pre-bent with a central portion displaced laterally from the longitudinal axis through the ends, a flat probe rotating element disposed between said upper and lower support elements, said probe rotating element provided with apertures receiving the central portions of said pre-bent probe elements, cam surfaces on said probe rotating element, cam followers mounted stationery relative to said upper and lower flat support elements and cooperating with said cam surfaces, said cam surfaces and said cam followers adapted to impart an arcuate movement to said probe rotating element which in turn imparts a rotary movement to said probe elements, and a means to impart movement to said probe rotating element.