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Ferroelectric capacitor with rhodium electrodes

Assignee: Samsung Electronics Co Ltd
•
Filing: 1996-03-19
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Granted: 1998-05-12
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Expires: 2016-03-19
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Abstract

Abstract A ferroelectric capacitor used as a memory cell in a ferroelectric random access memory (FRAM) is provided. The ferroelectric capacitor includes a substrate, an insulating layer formed on the substrate, a Rh lower electrode provided on the insulating layer, an adhesive layer between the insulating layer and the lower electrode, a ferroelectric layer provided on the lower electrode, and a Rh upper electrode provided on the ferroelectric layer. The Rh used as the electrode material is not affected by diffusion of Si due to its fine structure when compared to a Pt electrode, and has excellent electrical properties due to better electrical conductivity and good heat-transfer properties.

Inventors

  • 👤 June-key Lee
  • 👤 Il-sub Chung
  • 👤 Seshu Babu Desu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 04:52
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/62; H10D1/68; H10D1/692; H10D1/696; H10D1/682

Claims Analysis

Total Claims: 18
Claim 1
Independent Claim 54 words
A ferroelectric capacitor comprising: a substrate; an insulating layer formed on said substrate; a Rh lower electrode provided on said insulating layer; a rhodium oxide layer between said insulating layer and said Rh lower electrode; a ferroelectric layer provided on said Rh lower electrode; and a Rh upper electrode provided on said ferroelectric layer.
Claim 2
Dependent Claim 54 words
A ferroelectric capacitor comprising: a substrate; an insulating layer formed on said substrate; a Rh lower electrode provided on said insulating layer; a rhodium oxide layer between said insulating layer and said Rh lower electrode; a ferroelectric layer provided on said Rh lower electrode; and a Rh upper electrode provided on said ferroelectric layer.
Claim 3
Dependent Claim 19 words
A ferroelectric capacitor as claimed in claim 1, wherein the material of said insulating layer is SiO 2 .
Claim 4
Dependent Claim 25 words
A ferroelectric capacitor as claimed in claim 2, wherein said ferroelectric layer is any one selected from the group consisting of PZT, Y1 and BST.
Claim 5
Dependent Claim 16 words
A ferroelectric capacitor as claimed in claim 1, wherein said rhodium oxide is RhO 2 .
Claim 6
Dependent Claim 18 words
A ferroelectric capacitor as claimed in claim 1, wherein said rhodium oxide is Rh 2 O 3 .
Claim 7
Dependent Claim 24 words
A ferroelectric capacitor as claimed in claim 1, wherein said rhodium oxide is a mixture of RhO 2 and Rh 2 O 3 .
Claim 8
Dependent Claim 25 words
A ferroelectric capacitor as claimed in claim 1, wherein said ferroelectric layer is any one selected from the group consisting of PZT, Y1 and BST.
Claim 9
Dependent Claim 29 words
A ferroelectric capacitor as claimed in claim 1, wherein said ferroelectric layer is PZT doped with any one selected from the group consisting of Nb, La, Zn, Ta, Sc.
Claim 10
Dependent Claim 29 words
A ferroelectric capacitor as claimed in claim 1 wherein said ferroelectric layer is PZT doped with any one selected from the group consisting of Nb, Zn, Ta, and Sc.
Claim 11
Dependent Claim 64 words
A ferroelectric capacitor comprising: a substrate; an insulating layer formed on said substrate; a RH lower electrode provided on said substrate; a first rhodium oxide layer between said insulating layer and said Rh lower electrode; a ferroelectric layer provided on said Rh lower electrode; a second rhodium oxide layer formed on said ferroelectric layer; and a Rh upper layer provided on the second layer.
Claim 12
Dependent Claim 64 words
A ferroelectric capacitor comprising: a substrate; an insulating layer formed on said substrate; a RH lower electrode provided on said substrate; a first rhodium oxide layer between said insulating layer and said Rh lower electrode; a ferroelectric layer provided on said Rh lower electrode; a second rhodium oxide layer formed on said ferroelectric layer; and a Rh upper layer provided on the second layer.
Claim 13
Dependent Claim 19 words
A ferroelectric capacitor as claimed in claim 10, wherein the material of said insulating layer is SiO 2 .
Claim 14
Dependent Claim 25 words
A ferroelectric capacitor as claimed in claim 11, wherein said ferroelectric layer is any one selected from the group consisting of PZT, Y1 and BST.
Claim 15
Dependent Claim 25 words
A ferroelectric capacitor as claimed in claim 10, wherein said ferroelectric layer is any one selected from the group consisting of PZT, Y1 and BST.
Claim 16
Dependent Claim 16 words
A ferroelectric capacitor as claimed in claim 10, wherein said rhodium oxide is RhO 2 .
Claim 17
Dependent Claim 18 words
A ferroelectric capacitor as claimed in claim 10, wherein said rhodium oxide is Rh 2 O 3 .
Claim 18
Dependent Claim 24 words
A ferroelectric capacitor as claimed in claim 10, wherein said rhodium oxide is a mixture of RhO 2 and Rh 2 O 3 .

References Cited (Backward Citations)

US4437139A Cited
US4982309A Cited
US5003428A Cited
US5262920A Cited
US5191510A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-05-11 2001-11-10 2002-05-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-05-11 2005-11-10 2006-05-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-05-11 2009-11-10 2010-05-12 $7700.00 Window Closed / Lapsed

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