Multi-chip module

Claim 2

A multi-chip module comprising an insulating board which has a recess portion formed in a central portion of a lower surface and on which a wiring pattern is formed, a semiconductor chip mounted in the recess portion in said insulating board, a plurality of carriers, each mounted on an upper surface of said insulating board and having a leg portion with a side-surface electrode formed on a side surface, and a semiconductor device with accessible leads mounted on each carrier, wherein said carriers are mounted atop one another at least two carriers deep without any separate connection device.

Claim 3

A module according to claim 1, further comprising a plurality of external leads extending vertically from an outer peripheral portion of the recess portion formed in the center of the lower surface of said insulating board.

Claim 4

A module according to claim 1, further comprising a heat sink mounted on a central portion on the upper surface of said insulating board, and wherein said carriers are mounted around said heat sink.

Claim 5

A module according to claim 1, further comprising a semiconductor device with accessible leads directly mounted on the upper surface of said insulating board below at least one of the carriers.

Claim 6

A module according to claim 1, further comprising semiconductor devices with accessible leads mounted on the upper and lower surfaces of said carriers.

Claim 7

A module according to claim 1, wherein each of said carriers has two leg portions formed along two opposing sides, and a recess portion defined by the leg portions is open to two remaining side surfaces opposing each other.

Claim 8

A module according to claim 6, wherein cool air is passed through the recess portion of the carrier.

Claim 9

A module according to claim 1, wherein said semiconductor device mounted on said carriers is a TAB-mounted semiconductor chip.

Claim 10

A module according to claim 1, wherein said carriers, said semiconductor devices, and remaining parts are simultaneously connected to said insulating board with solder.

Claim 11

A multi-chip module comprising: an insulating board having a recess portion formed in a central portion of a lower surface and on which a wiring pattern is formed; a semiconductor chip mounted in the recess portion; a plurality of carriers, each comprising a top and a bottom surface and two leg portions extending downward from the bottom surface; a plurality of electrodes formed on an outer surface of at least one of the leg portions; pads electrically connected to the electrodes disposed upon a peripheral area of the top surface and a base of at least one of the leg portions; and a space between the leg portions being open to allow airflow therethrough; and at least one semiconductor device electrically connected to the top surface of each of the plurality of carriers; wherein at least one first level carrier is directly attached and electrically connected to an upper surface of the insulating board through the pads on the carrier's base; at least one first level carrier is further attached to a second level carrier via the pads disposed on the top surface of the first level carrier and the pads disposed on the base of the second level carrier, without any separate connection device.

Claim 12

A multi-chip module comprising: an insulating board having a recess portion formed in a central portion of a lower surface and on which a wiring pattern is formed; a semiconductor chip mounted in the recess portion; a plurality of carriers, each comprising a top and a bottom surface and two leg portions extending downward from the bottom surface; a plurality of electrodes formed on an outer surface of at least one of the leg portions; pads electrically connected to the electrodes disposed upon a peripheral area of the top surface and a base of at least one of the leg portions; and a space between the leg portions being open to allow airflow therethrough; and at least one semiconductor device electrically connected to the top surface of each of the plurality of carriers; wherein at least one first level carrier is directly attached and electrically connected to an upper surface of the insulating board through the pads on the carrier's base; at least one first level carrier is further attached to a second level carrier via the pads disposed on the top surface of the first level carrier and the pads disposed on the base of the second level carrier, without any separate connection device.

Claim 13

The multi-chip module of claim 10, wherein leads connecting each semiconductor device to the carrier to which it is attached are accessible from above the semiconductor device after it has been connected to the carrier.

Claim 14

The multi-chip module of claim 11, wherein each of the carriers with its connected at least one semiconductor device is testable by contacting the leads of the at least one semiconductor device.

Claim 15

The multi-chip module of claim 12, further comprising at least one additional level of carrier with attached at least one semiconductor device, each additional level of carrier being attached to a previously attached carrier via the pads on the top surface of the previously attached carrier and the pads on the base of the additional level carrier.

Claim 16

The multi-chip module of claim 13, further comprising a heat sink attached to an central portion of the upper surface of the insulating board, the carriers being attached around the heat sink.

Claim 17

The multi-chip module of claim 10, further comprising at least one additional level of carrier with attached at least one semiconductor device, each additional level of carrier being attached to a previously attached carrier via the pads on the top surface of the previously attached carrier and the pads on the base of the additional level carrier.

Claim 18

The multi-chip module of claim 10, further comprising at least one semiconductor device electrically connected to the bottom surface of at least one of the plurality of carriers.

Claim 19

The multi-chip module of claim 16, wherein leads connecting each semiconductor device to the carrier to which it is attached are accessible from above the semiconductor device after it has been connected to the carrier.

Claim 20

The multi-chip module of claim 17, wherein each of the carriers with its connected at least one semiconductor device is testable by contacting the leads of the at least one semiconductor device.

Claim 21

The multi-chip module of claim 18, further comprising at least one additional level of carrier with attached at least one semiconductor device, each additional level of carrier being attached to a previously attached carrier via the pads on the top surface of the previously attached carrier and the pads on the base of the additional level carrier.

Claim 22

The multi-chip module of claim 19, further comprising a heat sink attached to an central portion of the upper surface of the insulating board, the carriers being attached around the heat sink.