Patent US3141331A successfully refreshed from Google Patents.
Patent US5721174A successfully refreshed from Google Patents.
US5721174A
Expired / Lapsed
US
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Narrow deep trench isolation process with trench filling by oxidation
Assignee: GlobalFoundries Singapore Pte Ltd
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Filing: 1997-02-03
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Granted: 1998-02-24
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Expires: 2017-02-03
Abstract
Abstract The invention is a process for filling narrow isolation trenches with thermal oxide using a nitride spacer and a second trench etch. The method begins by providing forming a pad oxide layer 20 and a first nitride layer 30 over a substrate. A first opening is formed in the pad oxide layer 20 and first nitride layer 30. The substrate is then etched through the first opening forming a first trench 40 in the substrate. A thin oxide film 50 is then grown over the substrate in the bottom and sidewalls of the first trench 40. Nitride spacers 60 are grown over the sidewalls of the first trench and over the thin oxide layer 40 on the sidewalls of the trench. A portion of the thin oxide film 50 on the bottom of the trench is etched. The substrate in the bottom of the first trench is etched forming a second trench 70. The etch exposes portions of the substrate on the bottom of the deeper second trench. The bottom and sidewalls of the second trench is oxidized forming a isolation oxide layer 80 C thereby filling the second trench. The oxide pushes the spacers 60 up till the spacers close off the trench 70 thereby slowing the oxidation rate. The slow oxidation rate reduces stress by the oxide on the trench walls by allowing the viscous oxide to flow.
Inventors
- 👤 Igor V. Peidous
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 17:32
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/61; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/10; H10W10/13; Y; Y10; Y10S; Y10S148/00; Y10S148/05
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
231 words
A method of fabrication of a narrow deep trench isolation on a semiconductor substrate, comprising the steps of: a) forming a pad layer over a semiconductor substrate; b) forming a first barrier layer over said pad layer; c) patterning said first barrier layer and said pad layer forming a first opening; d) etching said substrate through said first opening forming a first trench in said substrate; said first trench having sidewalls and a bottom; e) growing a thin oxide film over said substrate in said bottom and sidewalls of said first trench; f) forming nitride spacers over said sidewalls of said first trench and over said thin oxide layer on said sidewalls of said first trench; said nitride spacers having ends; g) etching a portion of said thin oxide film on said bottom of said trench and etching said substrate in said bottom of said first trench forming a second trench, the etch exposing portions of said substrate on the bottom of said second trench; and h) oxidizing said bottom of said second trench forming a field oxide layer thereby at least partially filling said second trench, and said field oxide layer pushing up said ends of said nitride spacers reducing a rate of oxidation of said substrate at said bottom of said second trench; said spacers having a length greater than 50% of the width of said field oxide region.
Claim 2
Independent Claim
231 words
A method of fabrication of a narrow deep trench isolation on a semiconductor substrate, comprising the steps of: a) forming a pad layer over a semiconductor substrate; b) forming a first barrier layer over said pad layer; c) patterning said first barrier layer and said pad layer forming a first opening; d) etching said substrate through said first opening forming a first trench in said substrate; said first trench having sidewalls and a bottom; e) growing a thin oxide film over said substrate in said bottom and sidewalls of said first trench; f) forming nitride spacers over said sidewalls of said first trench and over said thin oxide layer on said sidewalls of said first trench; said nitride spacers having ends; g) etching a portion of said thin oxide film on said bottom of said trench and etching said substrate in said bottom of said first trench forming a second trench, the etch exposing portions of said substrate on the bottom of said second trench; and h) oxidizing said bottom of said second trench forming a field oxide layer thereby at least partially filling said second trench, and said field oxide layer pushing up said ends of said nitride spacers reducing a rate of oxidation of said substrate at said bottom of said second trench; said spacers having a length greater than 50% of the width of said field oxide region.
Claim 3
Dependent Claim
30 words
The method of claim 1 which further includes filling said second trench with a planarizing layer to at least the level of the substrate surface and planarizing said planarizing layer.
Claim 4
Dependent Claim
21 words
The method of claim 1 wherein said first opening having width in a range of between about 0.25 and 0.5 μm.
Claim 5
Dependent Claim
26 words
The method of claim 1 wherein said first trench has a depth from the substrate surface in a range of between about 0.15 and 0.3 μm.
Claim 6
Dependent Claim
22 words
The method of claim 1 wherein said nitride spacers have a width in a range of between about 300 and 600 Å.
Claim 7
Dependent Claim
28 words
The method of claim 1 wherein said second trench has a depth from the surface of said substrate in a range of between about 1.0 and 6.0 μm.
Claim 8
Dependent Claim
28 words
The method of claim 1 which further includes after step (g), liquid shallow etching the exposed substrate surface in said second trench thereby removing any ion induced defects.
Claim 9
Independent Claim
246 words
A method of fabrication of a narrow deep trench isolation on a semiconductor substrate, comprising the steps of: a) forming a pad oxide layer over a semiconductor substrate; b) forming a first barrier nitride layer over said pad oxide layer; c) patterning said first barrier nitride layer and said pad oxide layer forming a first opening; d) etching said substrate through said first opening forming a first trench in said substrate; said first trench having sidewalls and a bottom; e) growing a thin oxide film over said substrate in said bottom and sidewalls of said first trench; f) forming nitride spacers over said sidewalls of said first trench and over said thin oxide layer on said sidewalls of said first trench; said nitride spacers having ends; g) etching a portion of said thin oxide film on said bottom of said first trench and etching said substrate in said bottom of said first trench forming a second trench, the etch exposing portions of said substrate on the bottom of said second trench; and h) oxidizing the bottom of said second trench forming an isolation oxide layer thereby at least partially filling said second trench; and said field oxide layer pushing up said ends of said nitride spacers from said sidewalls so that said nitride spacers meet thereby reducing a rate of oxidation of said substrate; and said nitride spacers have a length of about greater than or equal to 50% of a width said field oxide region.
Claim 10
Independent Claim
246 words
A method of fabrication of a narrow deep trench isolation on a semiconductor substrate, comprising the steps of: a) forming a pad oxide layer over a semiconductor substrate; b) forming a first barrier nitride layer over said pad oxide layer; c) patterning said first barrier nitride layer and said pad oxide layer forming a first opening; d) etching said substrate through said first opening forming a first trench in said substrate; said first trench having sidewalls and a bottom; e) growing a thin oxide film over said substrate in said bottom and sidewalls of said first trench; f) forming nitride spacers over said sidewalls of said first trench and over said thin oxide layer on said sidewalls of said first trench; said nitride spacers having ends; g) etching a portion of said thin oxide film on said bottom of said first trench and etching said substrate in said bottom of said first trench forming a second trench, the etch exposing portions of said substrate on the bottom of said second trench; and h) oxidizing the bottom of said second trench forming an isolation oxide layer thereby at least partially filling said second trench; and said field oxide layer pushing up said ends of said nitride spacers from said sidewalls so that said nitride spacers meet thereby reducing a rate of oxidation of said substrate; and said nitride spacers have a length of about greater than or equal to 50% of a width said field oxide region.
Claim 11
Dependent Claim
30 words
The method of claim 8 which further includes filling said second trench with an planarizing layer to at least the level of the substrate surface and planarizing said planarizing layer.
Claim 12
Dependent Claim
21 words
The method of claim 8 wherein said first opening has width in a range of between about 0.25 and 0.5 μm.
Claim 13
Dependent Claim
26 words
The method of claim 8 wherein said first trench has a depth from the substrate surface in a range of between about 0.15 and 0.3 μm.
Claim 14
Dependent Claim
22 words
The method of claim 8 wherein said nitride spacer has a width in a range of between about 300 and 600 Å.
Claim 15
Dependent Claim
28 words
The method of claim 8 which further includes after step (g), liquid shallow etching the exposed substrate surface in said second trench thereby removing any ion induced defects.
Claim 16
Dependent Claim
27 words
The method of claim 1 wherein said nitride spacers have a length of about greater than or equal to 50% of the width said field oxide region.
Claim 17
Dependent Claim
46 words
The method of claim 1 wherein step (h) further includes: said field oxide layer pushing up said ends of said silicon nitride spacers away from said sidewalls so that said ends meet thereby stopping the oxidation of said substrate on said bottom of said second trench.
Claim 18
Dependent Claim
42 words
The method of claim 1 wherein step (h) further includes the oxidation of said bottom of said second trench performed using a thermal oxidation process in a wet environment at a temperature in a range of between about 950° and 1100° C.
Claim 19
Dependent Claim
46 words
The method of claim 8 wherein step (h) further includes: said field oxide layer pushing up said ends of said silicon nitride spacers away from said sidewalls so that said ends meet thereby stopping the oxidation of said substrate on said bottom of said second trench.
Claim 20
Dependent Claim
42 words
The method of claim 8 wherein step (h) further includes the oxidation of said bottom of said second trench performed using a thermal oxidation process in a wet environment at a temperature in a range of between about 950° and 1100° C.
Claim 21
Independent Claim
293 words
A method of fabrication of a narrow deep trench isolation on a semiconductor substrate, comprising the steps of: a) forming a pad oxide layer over a semiconductor substrate; b) forming a first barrier nitride layer over said pad oxide layer; c) patterning said first barrier nitride layer and said pad oxide layer forming a first opening; d) etching said substrate through said first opening forming a first trench in said substrate; said first trench having sidewalls and a bottom; e) growing a thin oxide film over said substrate in said bottom and sidewalls of said first trench; f) forming a nitride spacers over said sidewalls of said first trench and over said thin oxide layer on said sidewalls of said first trench; said nitride spacers have a length between about 95% and 105% of the depth of said first trench; said nitride spacers having an end; g) etching a portion of said thin oxide film on said bottom of said first trench and etching said substrate in said bottom of said first trench forming a second trench, the etch exposing portions of said substrate on the bottom of said second trench; and h) oxidizing the bottom of said second trench forming an isolation oxide layer thereby at least partially filling said second trench; and said field oxide layer pushing up said ends of said silicon nitride spacers so that said ends met thereby stopping the oxidation of said substrate; and said nitride spacers have a length of about greater than or equal to 50% of a width said field oxide region; and the oxidation of said bottom of said second trench performed using a thermal oxidation process in a wet environment at a temperature in a range of between about 950°and 1100° C.
Claim 22
Independent Claim
293 words
A method of fabrication of a narrow deep trench isolation on a semiconductor substrate, comprising the steps of: a) forming a pad oxide layer over a semiconductor substrate; b) forming a first barrier nitride layer over said pad oxide layer; c) patterning said first barrier nitride layer and said pad oxide layer forming a first opening; d) etching said substrate through said first opening forming a first trench in said substrate; said first trench having sidewalls and a bottom; e) growing a thin oxide film over said substrate in said bottom and sidewalls of said first trench; f) forming a nitride spacers over said sidewalls of said first trench and over said thin oxide layer on said sidewalls of said first trench; said nitride spacers have a length between about 95% and 105% of the depth of said first trench; said nitride spacers having an end; g) etching a portion of said thin oxide film on said bottom of said first trench and etching said substrate in said bottom of said first trench forming a second trench, the etch exposing portions of said substrate on the bottom of said second trench; and h) oxidizing the bottom of said second trench forming an isolation oxide layer thereby at least partially filling said second trench; and said field oxide layer pushing up said ends of said silicon nitride spacers so that said ends met thereby stopping the oxidation of said substrate; and said nitride spacers have a length of about greater than or equal to 50% of a width said field oxide region; and the oxidation of said bottom of said second trench performed using a thermal oxidation process in a wet environment at a temperature in a range of between about 950°and 1100° C.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-02-23 | 2001-08-25 | 2002-02-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-02-23 | 2005-08-25 | 2006-02-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-02-23 | 2009-08-25 | 2010-02-24 | $7700.00 | Window Closed / Lapsed |