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Semiconductor device having a p-type ohmic electrode structure

Assignee: Mitsubishi Chemical Corp
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Filing: 1996-02-27
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Granted: 1997-07-01
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Expires: 2016-02-27
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Abstract

Abstract A p-type ohmic metal electrode for use with a group II-VI semiconductor device. The p-type ohmic metal electrode is made of a group II-IV p-type semiconductor layer having a group II element other than zinc dispersed in that layer disposed on the group II-IV semiconductor device, and a metal electrode layer disposed on the group II-IV semiconductor layer including the group II element other than zinc. Also disclosed is a group II-IV semiconductor device including a p-type group II-IV semiconductor containing zinc and selenium and the above ohmic metal electrode disposed on the group II-IV semiconductor device. Additionally, a group II-IV semiconductor device including a p-type group II-IV semiconductor containing zinc and selenium, a layer of a group II element other than zinc disposed on the group II-IV semiconductor device, and a metal electrode layer disposed on the layer of the group II element other than zinc is disclosed.

Inventors

  • 👤 Hideki Goto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 20:09
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/83; H10H20/832; H10D; H10D64/00; H10D64/01; H10D64/011; H10H20/81; H10H20/822; H10H20/823

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 53 words
A group II-IV semiconductor device comprising: a first layer of a p-type group II-IV semiconductor containing zinc and selenium; a second layer of an ohmic electrode disposed on said first layer containing: (a) zinc and selenium, and (b) a group II element other than zinc; and a third layer of a metal electrode.
Claim 2
Dependent Claim 53 words
A group II-IV semiconductor device comprising: a first layer of a p-type group II-IV semiconductor containing zinc and selenium; a second layer of an ohmic electrode disposed on said first layer containing: (a) zinc and selenium, and (b) a group II element other than zinc; and a third layer of a metal electrode.
Claim 3
Dependent Claim 35 words
A group II-IV semiconductor device as claimed in claim 1, wherein a fourth layer of metal, having a melting point of at least 2000° C., is interposed between said second layer and said third layer.
Claim 4
Dependent Claim 20 words
A group II-IV semiconductor device as claimed in claim 1, wherein the group II element other than zinc is mercury.
Claim 5
Dependent Claim 34 words
A group II-IV semiconductor device as claimed in claim 1, wherein the zinc content of said second layer gradually increases from the side contacting said first layer to the side contacting said third layer.

References Cited (Backward Citations)

US4629820A Cited
US4910154A Cited
US5187116A Cited
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US5215929A Cited
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US5294833A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-06-30 2000-12-30 2001-07-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-06-30 2004-12-30 2005-07-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-06-30 2008-12-30 2009-07-01 $7700.00 Window Closed / Lapsed

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