Apparatus and method for automatic test generation and fault simulation of electronic circuits, based on programmable logic circuits

Claim 2

A programmable automatic test pattern generation and fault simulation (TGFS) apparatus comprising: (a) a plurality of I/O/F messaging buses, (b) a plurality of data storage devices, (c) a plurality of data buffers, (d) a plurality of programmable logic devices, (e) a plurality of test vector generators, (f) a plurality of multi-bit comparators, Said I/O/F messaging buses serving as a memory means and time delay processor for, and located substantially between, said plurality of data storage devices, said plurality of data buffers, said plurality of programmable logic devices and said test vector generators.

Claim 3

The apparatus of claim 1 wherein said permanent data storage device further comprises a design data base of a circuit, and a test data base of said circuit.

Claim 4

The apparatus of claim 1 or 2 wherein said design data base further comprises information on said circuit design connectivity, said circuit initialization, said circuit control, said circuit behavior, and said circuit timing.

Claim 5

The apparatus of claim 1 or 2 wherein said test data base further comprises information on said test circuit related to a master list of faults, and recording of results of test generation stored specific to each of said faults.

Claim 6

The apparatus of claim 1 wherein said data buffers further comprises a plurality of look-up tables.

Claim 7

The apparatus of claim 1 wherein said test vector generators further comprises any random or non-random counter type.

Claim 8

The apparatus of claim 1 where in said plurality of programmable logic devices further comprises a plurality of field programmable gate arrays.

Claim 9

The apparatus of claim 1 or 7 further comprises said plurality of programmable logic devices being programmed with identical partitions of a plurality of sub-circuits of said circuit, said programmable logic devices being divided into a first group and a second group, said first group being a fault free sub-circuit group and said second group reserved for a single fault sub-circuits, where at least one fault free sub-circuit is connected in parallel to a plurality of single fault sub-circuits, each fault read from a test database.

Claim 10

The apparatus of claim 1 wherein said I/O/F messaging buses further comprises: (a) a plurality of receiver circuits, (b) a plurality of transmitter circuits, (c) a plurality of data queues, (d) a plurality of function queues, (e) a plurality of status interpreters, where data and function instructions enter through said plurality of receiver circuits first, then to any combination of said plurality of data queues, said plurality of function queues or said plurality of status interpreters second, and said plurality of transmitter circuits third.

Claim 11

The apparatus of claim 1 or 9 wherein said I/O/F messaging buses further comprises: (a) a means for directing test data and function instructions to and from said plurality of programmable logic devices, said test vector generators and said data storage devices, (b) a means for receiving test data and instructions on function to execute with said test data, said transmitter circuits being capable of transmitting test results and instructions on function to execute on said test results, (c) a means to delay processing of test data from said single fault sub-circuits and said fault free sub-circuits, where said function queues receive and buffer instructions on what function to perform with corresponding said test data, said status interpreter starts and stops execution on said test data, (d) a means for switching of function between said plurality of multi-bit comparators permitting each said multi-bit comparator to pass data and trigger other said PLDs to execute a new function, (e) a means to record values of said input and output test vectors along with the type of function being executed and a fault identifier, (f) a means to transmit said input and output vectors, functionality requests and fault identifiers to said plurality of multi-bit comparators, said multi-bit comparators performing analysis of each said functionality request, (g) means to receive messages from other said sub-circuits providing said input and said output test vectors, said functionality request and said fault identifier, (h) said plurality of data queues and said plurality of function queues, queue data and function instructions for execution by said multi-bit comparators, (i) status interpreter system tracks status of execution.

Claim 12

The apparatus of claim 1 further comprising a means for tracking valid and invalid states supplied from said design database, comparing said valid and invalid states with actual logic states within said test circuit, reversing said test vector generators to restore original valid states when states are found invalid, skipping invalid test vector, and proceeding to next test vector.

Claim 13

The apparatus of claim 1 further comprises a means for implementing a fault producing scheme used to configure a plurality of single fault sub-circuits connected in parallel to a plurality of fault free sub-circuits.

Claim 14

The apparatus of claim 1 further comprises a means to successfully determine input test sequences for discovering a fault inside said single fault sub-circuit for said circuit, by applying all possible input pin combinations for said circuit and identifying those input pin combinations that show a difference between said fault free sub-circuit and said single fault sub circuit and to save said input test sequences and corresponding output test vector sequences of said fault free sub circuit and of the single fault sub circuit to said test database.

Claim 15

The apparatus of claim 1 further comprises a means to act as fault simulation system by introducing one said fault, then connecting all said multi-bit comparators together that make up said circuit, such that all said fault free sub-circuits are connected together as per said design and one copy of said single fault sub-circuit are connected together, without any parallel connections between the inputs and outputs of each said fault free sub-circuit and said single fault sub-circuit and applying input test vectors to said circuit and observing the outputs of said fault free sub-circuits and said single fault sub-circuits, comparing outputs for differences, and updating said test data base.

Claim 20

The method of claim 16 wherein step (a) comprises the generation of artificial faults by simulating said artificial faults and recording said artificial faults in a test data base.

Claim 21

The method of claim 16 wherein step (b) comprises the programming of said artificial faults into said plurality of programmable logic devices, said plurality of programmable logic devices being divided into a first group and a second group, said artificial faults being programmed into said second group of programmable logic devices.

Claim 22

The method of claim 16 wherein step (c) comprises inputting said test vectors into said first group of programmable logic devices and said second group of programmable logic devices end obtaining output signals from said first group and said second group of programmable logic devices.

Claim 23

The method of claim 16 wherein step (d) comprises compiling said test data base of said output signals.

Claim 24

The method of claim 16 wherein step (e) comprises statistical analysis of said test pattern for fault simulation.