US5599724A
Expired / Lapsed
US
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FET having part of active region formed in semiconductor layer in through hole formed in gate electrode and method for manufacturing the same
Assignee: Toshiba Corp
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Filing: 1995-08-24
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Granted: 1997-02-04
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Expires: 2015-08-24
Abstract
Abstract An N-type source (or drain) region is formed in the surface area of a P-type silicon substrate. A first insulation film is formed on the silicon substrate and a gate electrode is formed on the first insulation film. A second insulation film is formed on the first insulation film and gate electrode. A through hole is formed in those portions of the second insulation film, gate electrode and first insulation film which lie on the source region. A gate oxide film is formed on the side wall of the through hole. A P-type silicon layer serving as a channel region is formed on that portion of the source region which lies inside the through hole by the selective epitaxial growth. An N-type drain (or source) region is formed in the upper portion of the silicon layer. A third insulation film is formed on the resultant structure. A first contact hole is formed in portions of the third, second and first insulation films which lie on the source region, a second contact hole is formed in portions of the third and second insulation films which lie on the gate electrode, and a third contact hole is formed in a portion of the third insulation film which lies on the drain region by use of the RIE method. Wiring layers are formed inside the first to third contact holes and on part of the third insulation film.
Inventors
- 👤 Takeshi Yoshida
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 11:25
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/012; H10D30/021; H10D30/025; H10D30/051; H10D30/0512; H10D30/0515; H10D30/061; H10D30/202; H10D30/60; H10D30/63; H10D30/80; H10D30/83; H10D30/831; H10D30/87; H10D30/871; H10D62/00; H10D62/80; H10D62/83
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
245 words
A method of manufacturing a semiconductor device, the method comprising: forming a first semiconductor region of a first conductivity type in a main surface of a semiconductor substrate; forming a first insulation film on said main surface of said semiconductor substrate; forming a conductive layer on said first insulation film; patterning said conductive layer to at least partially overlie said first semiconductor region; forming a second insulation film on said conductive layer; forming a first through hole to pass through said second insulation film, said conductive layer and said first insulation film to reach said first semiconductor region; filling said first through hole with a semiconductor material of said first conductivity type to form a second semiconductor region of said first conductivity type on a part of said first semiconductor region inside said first through hole so that said second semiconductor region has an impurity concentration lower than that of said first semiconductor region; forming a third semiconductor region of said first conductivity type on said second semiconductor region; forming a second through hole to pass through said second insulation film to reach said conductive layer; doping impurities of said second conductivity type into said conductive layer through said second through hole; and heating to diffuse said impurities of said second conductivity type into said second semiconductor region to form a fourth semiconductor region of said second conductivity type in said second semiconductor region, wherein said fourth semiconductor region is adjacent to said conductive layer.
Claim 2
Independent Claim
245 words
A method of manufacturing a semiconductor device, the method comprising: forming a first semiconductor region of a first conductivity type in a main surface of a semiconductor substrate; forming a first insulation film on said main surface of said semiconductor substrate; forming a conductive layer on said first insulation film; patterning said conductive layer to at least partially overlie said first semiconductor region; forming a second insulation film on said conductive layer; forming a first through hole to pass through said second insulation film, said conductive layer and said first insulation film to reach said first semiconductor region; filling said first through hole with a semiconductor material of said first conductivity type to form a second semiconductor region of said first conductivity type on a part of said first semiconductor region inside said first through hole so that said second semiconductor region has an impurity concentration lower than that of said first semiconductor region; forming a third semiconductor region of said first conductivity type on said second semiconductor region; forming a second through hole to pass through said second insulation film to reach said conductive layer; doping impurities of said second conductivity type into said conductive layer through said second through hole; and heating to diffuse said impurities of said second conductivity type into said second semiconductor region to form a fourth semiconductor region of said second conductivity type in said second semiconductor region, wherein said fourth semiconductor region is adjacent to said conductive layer.
Claim 3
Dependent Claim
58 words
The method of claim 1, wherein said filling said first through hole with said semiconductor material of said first conductivity type includes growing said semiconductor material of said first conductivity type using selective epitaxial growth with said part of said first semiconductor region inside said first through hole used as a seed crystal for said selective epitaxial growth.
Claim 4
Dependent Claim
67 words
The method of claim 2, wherein said filling said first through hole with said semiconductor material of said first conductivity type includes changing a concentration of an amount of an impurity bas, in reactive gases used in said growing said semiconductor material of said first conductivity type using selective epitaxial growth, in accordance with a target thickness of said second semiconductor region, during said selective epitaxial growth.
Claim 5
Dependent Claim
43 words
The method of claim 1, wherein said semiconductor substrate includes a material selected from the group consisting of silicon of said second conductivity type and gallium arsenide, and said conductive layer includes a material selected from the group consisting of molybdenum and tungsten.
Claim 6
Dependent Claim
53 words
The method of claim 4, wherein said doping impurities of said second conductivity type into said conductive layer through said second through hole includes ion-implanting said impurities of said second conductivity type, and said heating to diffuse said impurities of said second conductivity type includes annealing at a temperature of about 900° C.
Claim 7
Dependent Claim
24 words
The method of claim 1, wherein said forming said first through hole and said forming said second through hole each include reactive ion etching.
Claim 8
Dependent Claim
36 words
The method of claim 1, wherein said forming said conductive layer includes forming said conductive layer to a thickness of about several hundreds of angstroms so that said semiconductor device operates as a state induction transistor.
Claim 9
Independent Claim
271 words
A method of manufacturing a semiconductor device, the method comprising: forming a first semiconductor region of a first conductivity type in a main surface of a semiconductor substrate; forming a first insulation film on said main surface of said semiconductor substrate; forming a conductive layer on said first insulation film; patterning said conductive layer to at least partially overlie said first semiconductor region; forming a second insulation film on said conductive layer; forming a first through hole to pass through said second insulation film, said conductive layer and said first insulation film to reach said first semiconductor region; filling said first through hole with a semiconductor material of said first conductivity type to form a second semiconductor region of said first conductivity type on a part of said first semiconductor region inside said first through hole so that said second semiconductor region has an impurity concentration lower than that Of said first semiconductor region; forming a third semiconductor region of said first conductivity type on said second semiconductor region: forming a second through hole to pass through said second insulation film to reach said conductive layer; doping impurities of a said second conductivity type into said conductive layer through said second through hole; and heating to diffuse said impurities of said second conductivity type into said second semiconductor region to form a fourth semiconductor region of said second conductivity type in said second semiconductor region, wherein said fourth semiconductor region is adjacent to said conductive layer and wherein said first conductivity type is N-type, said second conductivity type is P-type, and said impurities of said second conductivity type are boron atoms.
Claim 10
Independent Claim
271 words
A method of manufacturing a semiconductor device, the method comprising: forming a first semiconductor region of a first conductivity type in a main surface of a semiconductor substrate; forming a first insulation film on said main surface of said semiconductor substrate; forming a conductive layer on said first insulation film; patterning said conductive layer to at least partially overlie said first semiconductor region; forming a second insulation film on said conductive layer; forming a first through hole to pass through said second insulation film, said conductive layer and said first insulation film to reach said first semiconductor region; filling said first through hole with a semiconductor material of said first conductivity type to form a second semiconductor region of said first conductivity type on a part of said first semiconductor region inside said first through hole so that said second semiconductor region has an impurity concentration lower than that Of said first semiconductor region; forming a third semiconductor region of said first conductivity type on said second semiconductor region: forming a second through hole to pass through said second insulation film to reach said conductive layer; doping impurities of a said second conductivity type into said conductive layer through said second through hole; and heating to diffuse said impurities of said second conductivity type into said second semiconductor region to form a fourth semiconductor region of said second conductivity type in said second semiconductor region, wherein said fourth semiconductor region is adjacent to said conductive layer and wherein said first conductivity type is N-type, said second conductivity type is P-type, and said impurities of said second conductivity type are boron atoms.
Claim 11
Dependent Claim
58 words
The method of claim 8, wherein said filling said first through hole with said semiconductor material of said first conductivity type includes growing said semiconductor material of said first conductivity type using selective epitaxial growth with said part of said first semiconductor region inside said first through hole used as a seed crystal for said selective epitaxial growth.
Claim 12
Dependent Claim
67 words
The method of claim 9, wherein said filling said first through hole with said semiconductor material of said first conductivity type includes changing a concentration of an amount of an impurity gas, in reactive gases used in said growing said semiconductor material of said first conductivity type using selective epitaxial growth, in accordance with a target thickness of said second semiconductor region, during said selective epitaxial growth.
Claim 13
Dependent Claim
43 words
The method of claim 8, wherein said semiconductor substrate includes a material selected from the group consisting of silicon of said second conductivity type and gallium arsenide, and said conductive layer includes a material selected from the group consisting of molybdenum and tungsten.
Claim 14
Dependent Claim
53 words
The method of claim 11, wherein said doping impurities of said second conductivity type into said conductive layer through said second through hole includes ion-implanting said impurities of said second conductivity type, and said heating to diffuse said impurities of said second conductivity type includes annealing at a temperature of about 900° C.
Claim 15
Dependent Claim
24 words
The method of claim 8, wherein said forming said first through hole and said forming said second through hole each include reactive ion etching.
Claim 16
Independent Claim
261 words
A method of manufacturing a semiconductor device, the method comprising the steps of: forming a first semiconductor region of a first conductivity type in a main surface area of a semiconductor substrate of a second conductivity type; forming a first insulation film on said main surface of said semiconductor substrate; forming a conductive layer on said first insulation film; patterning said conductive layer to at least partially overlie said first semiconductor region; forming a second insulation film on said conductive layer and said first insulation film; forming a first through hole to pass through said second insulation film, said conductive layer and said first insulation film to reach said first semiconductor region; filling said first through hole with a semiconductor material of said first conductivity type to form a second semiconductor region of said first conductivity type on a part of said first semiconductor region inside said first through hole so that said second semiconductor region has an impurity concentration lower than that of said first semiconductor region; forming a third semiconductor region of said first conductivity type on said second semiconductor region inside said first through hole; forming a second through hole to pass through said second insulation film and reach said conductive layer; doping an impurity into said conductive layer via said second through hole; and heating to diffuse said impurity doped into said conductive layer so as to form an impurity diffusion layer of a second conductivity type in a part of said second semiconductor region near a junction between said conductive layer and said first through hole.
Claim 17
Independent Claim
261 words
A method of manufacturing a semiconductor device, the method comprising the steps of: forming a first semiconductor region of a first conductivity type in a main surface area of a semiconductor substrate of a second conductivity type; forming a first insulation film on said main surface of said semiconductor substrate; forming a conductive layer on said first insulation film; patterning said conductive layer to at least partially overlie said first semiconductor region; forming a second insulation film on said conductive layer and said first insulation film; forming a first through hole to pass through said second insulation film, said conductive layer and said first insulation film to reach said first semiconductor region; filling said first through hole with a semiconductor material of said first conductivity type to form a second semiconductor region of said first conductivity type on a part of said first semiconductor region inside said first through hole so that said second semiconductor region has an impurity concentration lower than that of said first semiconductor region; forming a third semiconductor region of said first conductivity type on said second semiconductor region inside said first through hole; forming a second through hole to pass through said second insulation film and reach said conductive layer; doping an impurity into said conductive layer via said second through hole; and heating to diffuse said impurity doped into said conductive layer so as to form an impurity diffusion layer of a second conductivity type in a part of said second semiconductor region near a junction between said conductive layer and said first through hole.
Claim 18
Dependent Claim
58 words
The method of claim 14, wherein said filling said first through hole with said semiconductor material of said first conductivity type includes growing said semiconductor material of said first conductivity type using selective epitaxial growth with said part of said first semiconductor region inside said first through hole used as a seed crystal for said selective epitaxial growth.
Claim 19
Dependent Claim
67 words
The method of claim 15, wherein said filling said first through hole with said semiconductor material of said first conductivity type includes changing a concentration of an amount of an impurity gas, in reactive gases used in said growing said semiconductor material of said first conductivity type using selective epitaxial growth, in accordance with a target thickness of said second semiconductor region, during said selective epitaxial growth.
Claim 20
Dependent Claim
43 words
The method of claim 14, wherein said semiconductor substrate of said second conductivity type includes a material selected from the group consisting of silicon and gallium arsenide, and said conductive layer includes a material selected from the group consisting of molybdenum and tungsten.
Claim 21
Dependent Claim
48 words
The method of claim 17, wherein said doping said impurity into said conductive layer via said second through hole includes ion-implanting said impurity into said conductive layer, and said heating to diffuse said impurity doped into said conductive layer includes annealing at a temperature of about 900° C.
Claim 22
Dependent Claim
24 words
The method of claim 14, wherein said forming said first through hole and said forming said second through hole each include reactive ion etching.
Claim 23
Dependent Claim
36 words
The method of claim 14, wherein said forming said conductive layer includes forming said conductive layer to a thickness of about several hundreds of angstroms so that said semiconductor device operates as a state induction transistor.
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