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US5597764A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of contact formation and planarization for semiconductor processes

Assignee: Vanguard International Semiconductor Corp
•
Filing: 1996-07-15
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Granted: 1997-01-28
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Expires: 2016-07-15
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Abstract

Abstract A new method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device is described. Semiconductor device structures are formed in and on a semiconductor substrate. A dielectric layer is deposited overlying the semiconductor device structures. The dielectric layer is covered with a photoresist mask and partially etched into to form first openings of a first width wherein the first openings do not contact the underlying semiconductor device structures. An oxide layer is deposited over the dielectric layer and within the first openings whereby second openings are formed having a second width smaller than the first width. The oxide layer is etched away whereby the second openings are extended through the dielectric layer to the underlying semiconductor device structures to form small contact openings having the second width and whereby the dielectric layer is planarized. A conducting layer is deposited and patterned to complete the formation of the small contacts and planarized dielectric layer in the fabrication of an integrated circuit device.

Inventors

  • 👤 Chao-Ming Koh
  • 👤 Yeh-Sen Lin
  • 👤 Rong-Wu Chien

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 22:37
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/011; H10P; H10P95/00; H10P95/06; H10P95/062; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081; H10W20/092

Claims Analysis

Total Claims: 28
Claim 1
Independent Claim 176 words
A method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device comprising: forming semiconductor device structures in and on a semiconductor substrate; depositing a first dielectric layer overlying said semiconductor device structures; covering said first dielectric layer with a photoresist mask and partially etching into said first dielectric layer to form first openings of a first width wherein said first openings do not contact said underlying semiconductor device structures; depositing a second dielectric layer over said first dielectric layer and within said first openings whereby second openings are formed having a second width smaller than said first width; etching away said second dielectric layer whereby said second openings are extended downward through said first dielectric layer to said underlying semiconductor device structures to form small contact openings having said second width and whereby said first dielectric layer is planarized; and depositing and patterning a conducting layer to complete the formation of said small contacts and said planarized dielectric layer in the fabrication of said integrated circuit device.
Claim 2
Independent Claim 176 words
A method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device comprising: forming semiconductor device structures in and on a semiconductor substrate; depositing a first dielectric layer overlying said semiconductor device structures; covering said first dielectric layer with a photoresist mask and partially etching into said first dielectric layer to form first openings of a first width wherein said first openings do not contact said underlying semiconductor device structures; depositing a second dielectric layer over said first dielectric layer and within said first openings whereby second openings are formed having a second width smaller than said first width; etching away said second dielectric layer whereby said second openings are extended downward through said first dielectric layer to said underlying semiconductor device structures to form small contact openings having said second width and whereby said first dielectric layer is planarized; and depositing and patterning a conducting layer to complete the formation of said small contacts and said planarized dielectric layer in the fabrication of said integrated circuit device.
Claim 3
Dependent Claim 24 words
The method according to claim 1 wherein said semiconductor device structures include polysilicon gate electrodes and interconnection lines and associated source and drain regions.
Claim 4
Dependent Claim 32 words
The method according to claim 1 wherein said semiconductor device structures include polysilicon gate electrodes and interconnection lines and associated source and drain regions, an overlying insulating layer, and overlying conducting lines.
Claim 5
Dependent Claim 33 words
The method according to claim 1 wherein said first dielectric layer comprises one of the group containing borophosphosilicate glass and phosphosilicate glass and has a thickness of between about 4000 to 15,000 Angstroms.
Claim 6
Dependent Claim 20 words
The method according to claim 4 wherein said first dielectric layer is locally planarized by reflow after it is deposited.
Claim 7
Dependent Claim 38 words
The method according to claim 1 wherein said first dielectric layer comprises one of the group containing borophosphosilicate glass, phosphosilicate glass, spin-on-glass, tetraethoxysilane oxide, and silicon nitride and has a thickness of between about 4000 to 15,000 Angstroms.
Claim 8
Dependent Claim 20 words
The method according to claim 6 wherein said first dielectric layer is locally planarized by etchback after it is deposited.
Claim 9
Dependent Claim 22 words
The method according to claim 6 wherein said first dielectric layer is locally planarized by chemical mechanical polishing after it is deposited.
Claim 10
Dependent Claim 53 words
The method according to claim 1 wherein said first dielectric layer comprises: a first layer comprising one of the group containing silicon oxide and silicon nitride and having a thickness of between about 4000 to 15,000 Angstroms; and a second layer of spin-on-glass having a thickness of between about 2000 to 6000 Angstroms.
Claim 11
Dependent Claim 39 words
The method according to claim 1 wherein said second dielectric layer comprises on the of group containing silicon oxide and silicon nitride and is deposited by chemical vapor deposition to a thickness of between about 500 to 2000 Angstroms.
Claim 12
Dependent Claim 20 words
The method according to claim 1 wherein said small contacts have a width of between about 0.1 to 0.5 microns.
Claim 13
Independent Claim 200 words
A method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device comprising: forming semiconductor device structures in and on a semiconductor substrate wherein said semiconductor device structures include polysilicon gate electrodes and interconnection lines and associated source and drain regions; depositing a first dielectric layer overlying said semiconductor device structures; locally planarizing said first dielectric layer; covering said first dielectric layer with a photoresist mask and partially etching into said first dielectric layer to form first openings of a first width wherein said first openings do not contact said underlying semiconductor device structures; depositing a second dielectric layer over said first dielectric layer and within said first openings whereby second openings are formed having a second width smaller than said first width; etching away said second dielectric layer whereby said second openings are extended downward through said first dielectric layer to said underlying semiconductor device structures to form small contact openings having said second width and whereby said first dielectric layer is planarized; and depositing and patterning a conducting layer to complete the formation of said small contacts and said planarized dielectric layer in the fabrication of said integrated circuit device.
Claim 14
Independent Claim 200 words
A method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device comprising: forming semiconductor device structures in and on a semiconductor substrate wherein said semiconductor device structures include polysilicon gate electrodes and interconnection lines and associated source and drain regions; depositing a first dielectric layer overlying said semiconductor device structures; locally planarizing said first dielectric layer; covering said first dielectric layer with a photoresist mask and partially etching into said first dielectric layer to form first openings of a first width wherein said first openings do not contact said underlying semiconductor device structures; depositing a second dielectric layer over said first dielectric layer and within said first openings whereby second openings are formed having a second width smaller than said first width; etching away said second dielectric layer whereby said second openings are extended downward through said first dielectric layer to said underlying semiconductor device structures to form small contact openings having said second width and whereby said first dielectric layer is planarized; and depositing and patterning a conducting layer to complete the formation of said small contacts and said planarized dielectric layer in the fabrication of said integrated circuit device.
Claim 15
Dependent Claim 44 words
The method according to claim 12 wherein said first dielectric layer comprises one of the group containing borophosphosilicate glass and phosphosilicate glass and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by reflow.
Claim 16
Dependent Claim 45 words
The method according to claim 12 wherein said first dielectric layer comprises one of the group containing borophosphosilicate glass, phosphosilicate glass and spin-on-glass and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by etchback.
Claim 17
Dependent Claim 51 words
The method according to claim 12 wherein said first dielectric layer comprises one of the group containing borophosphosilicate glass, phosphosilicate glass, spin-on-glass, tetraethoxysilane oxide, and silicon nitride and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by chemical mechanical polishing.
Claim 18
Dependent Claim 61 words
The method according to claim 12 wherein said first dielectric layer comprises one of the group containing silicon oxide and silicon nitride and has a thickness of between about 4000 to 15,000 Angstroms and wherein said dielectric layer is locally planarized by coating said dielectric layer with a layer of spin-on-glass having a thickness of between about 2000 to 6000 Angstroms.
Claim 19
Dependent Claim 39 words
The method according to claim 12 wherein said second dielectric layer comprises one of the group containing silicon oxide and silicon nitride and is deposited by chemical vapor deposition to a thickness of between about 500 to 2000 Angstroms.
Claim 20
Dependent Claim 20 words
The method according to claim 12 wherein said small contacts have a width of between about 0.1 to 0.5 microns.
Claim 21
Independent Claim 224 words
A method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device comprising: forming semiconductor device structures in and on a semiconductor substrate wherein said semiconductor device structures include polysilicon gate electrodes and interconnection lines and associated source and drain regions; covering said semiconductor device structures with an insulating layer; depositing a conducting layer overlying said insulating layer and patterning said conducting layer to form conducting lines; depositing a first dielectric layer overlying said conducting lines; locally planarizing said first dielectric layer; covering said first dielectric layer with a photoresist mask and partially etching into said first dielectric layer to form first openings of a first width wherein said first openings do not contact said underlying conducting lines; depositing a second dielectric layer over said first dielectric layer and within said first openings whereby second openings are formed having a second width smaller than said first width; etching away said second dielectric layer whereby said second openings are extended downward through said first dielectric layer to said underlying conducting lines to form small contact openings having said second width and whereby said first dielectric layer is planarized; and depositing and patterning a second conducting layer to complete the formation of said small contacts and said planarized dielectric layer in the fabrication of said integrated circuit device.
Claim 22
Independent Claim 224 words
A method for forming small contacts and for planarizing the dielectric layer in the fabrication of an integrated circuit device comprising: forming semiconductor device structures in and on a semiconductor substrate wherein said semiconductor device structures include polysilicon gate electrodes and interconnection lines and associated source and drain regions; covering said semiconductor device structures with an insulating layer; depositing a conducting layer overlying said insulating layer and patterning said conducting layer to form conducting lines; depositing a first dielectric layer overlying said conducting lines; locally planarizing said first dielectric layer; covering said first dielectric layer with a photoresist mask and partially etching into said first dielectric layer to form first openings of a first width wherein said first openings do not contact said underlying conducting lines; depositing a second dielectric layer over said first dielectric layer and within said first openings whereby second openings are formed having a second width smaller than said first width; etching away said second dielectric layer whereby said second openings are extended downward through said first dielectric layer to said underlying conducting lines to form small contact openings having said second width and whereby said first dielectric layer is planarized; and depositing and patterning a second conducting layer to complete the formation of said small contacts and said planarized dielectric layer in the fabrication of said integrated circuit device.
Claim 23
Dependent Claim 44 words
The method according to claim 19 wherein said first dielectric layer comprises one of the group containing borophosphosilicate glass and phosphosilicate glass and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by reflow.
Claim 24
Dependent Claim 44 words
The method according to claim 19 wherein said dielectric layer comprises one of the group containing borophosphosilicate glass, phosphosilicate glass, and spin-on-glass and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by etchback.
Claim 25
Dependent Claim 50 words
The method according to claim 19 wherein said dielectric layer comprises one of the group containing borophosphosilicate glass, phosphosilicate glass, spin-on-glass, tetraethoxysilane oxide, and silicon nitride and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by chemical mechanical polishing.
Claim 26
Dependent Claim 66 words
The method according to claim 19 wherein said dielectric layer comprises one of the group containing borophosphosilicate glass, phosphosilicate glass, tetraethoxysilane oxide, and silicon nitride and has a thickness of between about 4000 to 15,000 Angstroms and wherein said first dielectric layer is locally planarized by coating said first dielectric layer with a layer of spin-on-glass having a thickness of between about 2000 to 6000 Angstroms.
Claim 27
Dependent Claim 39 words
The method according to claim 19 wherein said second dielectric layer comprises one of the group containing silicon oxide and silicon nitride and is deposited by chemical vapor deposition to a thickness of between about 500 to 2000 Angstroms.
Claim 28
Dependent Claim 20 words
The method according to claim 19 wherein said small contacts have a width of between about 0.1 to 0.5 microns.

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-01-28 2000-07-29 2001-01-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-01-28 2004-07-29 2005-01-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-01-28 2008-07-29 2009-01-28 $7700.00 Window Closed / Lapsed

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