Patent US2551537A successfully refreshed from Google Patents.
Patent US5578518A successfully refreshed from Google Patents.
US5578518A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a trench isolation having round corners
Assignee: Toshiba Corp
•
Filing: 1994-12-15
•
Granted: 1996-11-26
•
Expires: 2014-12-15
Abstract
Abstract A semiconductor device comprises a semiconductor substrate having a major surface, a trench device isolation region having a trench selectively formed to define at least one island region in the major surface of the semiconductor substrate and a filler insulatively formed within the trench, an elongated gate electrode insulatively formed over a central portion of the island region so that each of its both ends which are opposed to each other in the direction of its length overlaps the trench device isolation region, and source and drain regions formed within the island region on the both sides of the gate electrode. The surface of the trench device isolation region is formed lower than the major surface of the semiconductor substrate. Those portions of the major surface of the semiconductor substrate that are located under the gate electrode at the boundary with the trench device isolation region are rounded, and the radius of curvature of these portions of the major surface of the semiconductor substrate is selected to be not less than 50 nm.
Inventors
- 👤 Hidetoshi Koike
- 👤 Kazunari Ishimaru
- 👤 Hiroshi Gojohbori
- 👤 Fumitomo Matsuoka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 17:17
CPC Classifications
H; H10; H10P; H10P58/00; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/0145; H10W10/10; H10W10/17; Y; Y10; Y10S; Y10S148/00; Y10S148/05; Y10S148/161; Y10S438/00; Y10S438/911
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
147 words
A method of forming a trench device isolation region in a surface of a semiconductor substrate, the method comprising the steps of: forming a first oxide layer on the surface of said semiconductor substrate; forming a polycrystalline silicon layer on said first oxide layer; removing portions of said polycrystalline silicon layer and said first oxide layer to form an opening in said layers to expose a selected portion of the surface of said semiconductor substrate; etching said semiconductor substrate through said opening to form a trench in said semiconductor substrate; subjecting said first oxide layer to side etching through said opening to expose an edge of said semiconductor substrate at a boundary with said trench; and forming a second oxide layer over substantially all exposed surfaces including an inside of said trench, such that said edge of said semiconductor substrate exposed by said side etching is rounded.
Claim 2
Independent Claim
147 words
A method of forming a trench device isolation region in a surface of a semiconductor substrate, the method comprising the steps of: forming a first oxide layer on the surface of said semiconductor substrate; forming a polycrystalline silicon layer on said first oxide layer; removing portions of said polycrystalline silicon layer and said first oxide layer to form an opening in said layers to expose a selected portion of the surface of said semiconductor substrate; etching said semiconductor substrate through said opening to form a trench in said semiconductor substrate; subjecting said first oxide layer to side etching through said opening to expose an edge of said semiconductor substrate at a boundary with said trench; and forming a second oxide layer over substantially all exposed surfaces including an inside of said trench, such that said edge of said semiconductor substrate exposed by said side etching is rounded.
Claim 3
Dependent Claim
35 words
The method according to claim 1, further comprising, after the step of subjecting said first oxide layer to side etching, the step of performing isotropic etching to thereby round said edge of said semiconductor substrate.
Claim 4
Dependent Claim
32 words
The method according to claim 1, in which said second oxide layer is formed by means of thermal oxidation, and said edge of said semiconductor substrate is rounded by said thermal oxidation.
Claim 5
Independent Claim
169 words
A method of forming a trench device isolation region in a surface of a semiconductor substrate, the method comprising the steps of: forming a first oxide layer on the surface of said semiconductor substrate; forming a polycrystalline silicon layer on said first oxide layer; removing portions of said polycrystalline silicon layer and said first oxide layer to form an opening in said layers to expose a selected portion of the surface of said semiconductor substrate; subjecting said first oxide layer to side etching through said opening; etching said semiconductor substrate through said opening to form a trench in said semiconductor substrate after said step of subjecting said first oxide layer to side etching, such that an edge of said semiconductor substrate at a boundary with said trench is exposed as a result of said prior side etching of said first oxide layer; and forming a second oxide layer over substantially all exposed surfaces including an inside of said trench, such that said edge of said semiconductor substrate is rounded.
Claim 6
Independent Claim
169 words
A method of forming a trench device isolation region in a surface of a semiconductor substrate, the method comprising the steps of: forming a first oxide layer on the surface of said semiconductor substrate; forming a polycrystalline silicon layer on said first oxide layer; removing portions of said polycrystalline silicon layer and said first oxide layer to form an opening in said layers to expose a selected portion of the surface of said semiconductor substrate; subjecting said first oxide layer to side etching through said opening; etching said semiconductor substrate through said opening to form a trench in said semiconductor substrate after said step of subjecting said first oxide layer to side etching, such that an edge of said semiconductor substrate at a boundary with said trench is exposed as a result of said prior side etching of said first oxide layer; and forming a second oxide layer over substantially all exposed surfaces including an inside of said trench, such that said edge of said semiconductor substrate is rounded.
Claim 7
Dependent Claim
31 words
The method according to claim 4, further comprising, after the step of etching said semiconductor substrate, the step of performing isotropic etching to thereby round said edge of said semiconductor substrate.
Claim 8
Dependent Claim
32 words
The method according to claim 4, in which said second oxide layer is formed by means of thermal oxidation, and said edge of said semiconductor substrate is rounded by said thermal oxidation.
Claim 9
Dependent Claim
73 words
The method according to claim 3, wherein said step of subjecting said first oxide layer to side etching creates a recess in said first oxide layer, a volume expansion of said polycrystalline silicon layer by said thermal oxidation fills said recess with said second oxide layer, and said edge of said semiconductor substrate is further rounded by said volume expansion of said polycrystalline silicon layer filling said recess with said second oxide layer.
Claim 10
Dependent Claim
24 words
The method according to claim 7, wherein a radius of curvature of said edge of said semiconductor substrate is at least about 50 nm.
Claim 11
Dependent Claim
22 words
The method according to claim 3, wherein said thermal oxidation is performed for at least about an hour at about 1000° C.
Claim 12
Dependent Claim
73 words
The method according to claim 6, wherein said step of subjecting said first oxide layer to side etching creates a recess in said first oxide layer, a volume expansion of said polycrystalline silicon layer by said thermal oxidation fills said recess with said second oxide layer, and said edge of said semiconductor substrate is further rounded by said volume expansion of said polycrystalline silicon layer filling said recess with said second oxide layer.
Claim 13
Dependent Claim
24 words
The method according to claim 10, wherein a radius of curvature of said edge of said semiconductor substrate is at least about 50 nm.
Claim 14
Dependent Claim
22 words
The method according to claim 6, wherein said thermal oxidation is performed for at least about an hour at about 1000° C.
References Cited (Backward Citations)
US4563227A
Cited
US4663832A
Cited
JPS61154144A
Cited
JPS63287024A
Cited
US4916086A
Cited
US4871685A
Cited
US5258332A
Cited
US4931409A
Cited
JPH01241129A
Cited
JPH034541A
Cited
US5332683A
Cited
US5084408A
Cited
JPH0430557A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-11-26 | 2000-05-27 | 2000-11-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-11-26 | 2004-05-27 | 2004-11-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-11-26 | 2008-05-27 | 2008-11-26 | $7700.00 | Window Closed / Lapsed |