US5258332A
Expired / Lapsed
US
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Method of manufacturing semiconductor devices including rounding of corner portions by etching
Assignee: Toshiba Corp
•
Filing: 1993-03-08
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Granted: 1993-11-02
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Expires: 2013-03-08
Abstract
Abstract A method for rounding the corners of trench formed on the silicon substrate with metal, metal silicide or polycrystalline silicon thin film or the step portions of lead layers is provided. The steps of rounding are performed by chemical dry etching using a gas mixture of fluorine and oxygen. The abundance ratio of oxygen is determined to be one or more with respect to the fluorine. This method contributes significantly to the prevention of leakage current and the enhancement of insulating effect in the case of forming trench capacitors or the like.
Inventors
- 👤 Keiji Horioka
- 👤 Haruo Okano
- 👤 Hirotaka Nishino
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 16:33
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/01; H10D1/045; H10D1/047; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10P50/69; H10P50/691; Y; Y10; Y10S; Y10S438/00; Y10S438/978
Claims Analysis
Total Claims: 29
Claim 1
Independent Claim
85 words
A method of manufacturing a semiconductor device comprising the steps of: anisotropically etching a surface of a silicon substrate to produce a shape therein having angular corner portions; and rounding the corner portions by chemically dry etching the corner portions of the substrate while forming a fill of silicon oxy-fluoride on the surface of the silicon substrate with a gas mixture including oxygen and fluorine, with atoms of the oxygen having a content ratio of greater than one with respect to atoms of the fluorine.
Claim 2
Independent Claim
85 words
A method of manufacturing a semiconductor device comprising the steps of: anisotropically etching a surface of a silicon substrate to produce a shape therein having angular corner portions; and rounding the corner portions by chemically dry etching the corner portions of the substrate while forming a fill of silicon oxy-fluoride on the surface of the silicon substrate with a gas mixture including oxygen and fluorine, with atoms of the oxygen having a content ratio of greater than one with respect to atoms of the fluorine.
Claim 3
Dependent Claim
35 words
The method of claim 1 also including the step of doping an impurity having either an n-type or a p-type conductivity into the silicon substrate prior to the anisotropically etching the surface of the substrate.
Claim 4
Dependent Claim
19 words
The method of claim 1, also including the step of forming a lead having step portions of the substrate.
Claim 5
Dependent Claim
24 words
The method of claim 3, wherein the step of forming the lead includes anisotropic etching a thin polycrystalline silicon film formed on the substrate.
Claim 6
Dependent Claim
55 words
The method of claim 4, further comprising the step of chemical dry etching step portions of the lead with a gas mixture including oxygen and fluorine, with atoms of the oxygen having a content ratio of 1.2 or more with respect to atoms of the fluorine for rounding the angular corner portions of the lead.
Claim 7
Dependent Claim
38 words
The method of claim 5 further comprising the step of eliminating a naturally oxididzed film on the lead between the step of forming the lead and the step of chemically dry etching the step portions of the lead.
Claim 8
Dependent Claim
33 words
The method of claim 6, also including the step of doping an impurity of either an n-type or a p-type conductivity into the lead prior to anisotropically etching the surface of the substrate.
Claim 9
Dependent Claim
26 words
The method of claim 3, further comprising the step of covering the lead with an insulating film and forming a second lead on the insulating film.
Claim 10
Dependent Claim
25 words
The method of claim 3, wherein said lead is formed of a material selected from the group consisting of metal, metal silicide and polycrystalline silicon.
Claim 11
Dependent Claim
37 words
The method of claim 3, further comprising the step of eliminating a naturally oxidized film formed on the lead between said step of forming the lead and said step of etching the step portions of the lead.
Claim 12
Dependent Claim
33 words
The method of claim 10 also including the step of doping an impurity having either an n-type or a p-type conductivity into the lead prior to anisotropically etching the surface of the substrate.
Claim 13
Dependent Claim
32 words
The method of claim 3 also including the step of doping an impurity having either an n-type or a p-type conductivity into the lead prior to anisotropic etching to form the trench.
Claim 14
Dependent Claim
39 words
The method of claim 1, wherein said chemically dry-etching is performed by providing electric discharge of a gas for reaction with the corner portions of the substrate at a location spaced apart from a location of the silicon substrate.
Claim 15
Independent Claim
113 words
A method of manufacturing a semiconductor device comprising the steps of: forming a trench having angular corners and a surface portion on a silicon substrate by anisotropic etching; rounding the corners by chemically dry etching the corners of the trench formed on the substrate while forming a film of silicon oxy-fluoride on the surface of the substrate with a gas mixture including at least fluorine and oxygen, with atoms of the oxygen having a content ratio of greater than one with respect to atoms of the fluorine; forming an insulating film on the surface portion of the trench; and forming an electrode at least partially in the trench and on the insulating film.
Claim 16
Independent Claim
113 words
A method of manufacturing a semiconductor device comprising the steps of: forming a trench having angular corners and a surface portion on a silicon substrate by anisotropic etching; rounding the corners by chemically dry etching the corners of the trench formed on the substrate while forming a film of silicon oxy-fluoride on the surface of the substrate with a gas mixture including at least fluorine and oxygen, with atoms of the oxygen having a content ratio of greater than one with respect to atoms of the fluorine; forming an insulating film on the surface portion of the trench; and forming an electrode at least partially in the trench and on the insulating film.
Claim 17
Dependent Claim
37 words
The method of claim 14, further comprising the step of eliminating a naturally oxidized film formed on an inner wall of the trench between said forming the trench and a etching the angular corners of the trench.
Claim 18
Dependent Claim
21 words
The method of claim 15, wherein said step of eliminating said naturally oxidized film is effected by contact with hydrogen fluoride.
Claim 19
Dependent Claim
31 words
The method of claim 14 also including the step of doping an impurity having either an n-type or a p-type conductivity into the silicon substrate prior to said forming the trench.
Claim 20
Dependent Claim
33 words
The method of claim 14, further comprising the step of masking the substrate except a portion thereof where the trench is to be formed with an etching mask prior to forming the trench.
Claim 21
Dependent Claim
32 words
The method of claim 18, further comprising chemically eliminating the etching mask covering the angular corners of the trench prior to said step of dry etching the angular corners of the trench.
Claim 22
Dependent Claim
22 words
The method of claim 19, wherein the step of masking includes the step of depositing a mask of a material including oxygen.
Claim 23
Dependent Claim
21 words
The method of claim 14, wherein an interior surface including sidewalls of the trench are smoothened by the chemically dry etching.
Claim 24
Independent Claim
98 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a trench on a silicon substrate by anisotropic etching; chemically dry etching angular corner portions of the trench formed on the substrate with a gas mixture including at least fluorine and oxygen while forming a film of silicon oxy-fluoride on the surface of the substrate, with atoms of the oxygen having a content ratio of greater than one with respect to to atoms of the fluorine for rounding the angular corner portions; and burying an insulating film in the trench for forming an element isolation region.
Claim 25
Independent Claim
98 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a trench on a silicon substrate by anisotropic etching; chemically dry etching angular corner portions of the trench formed on the substrate with a gas mixture including at least fluorine and oxygen while forming a film of silicon oxy-fluoride on the surface of the substrate, with atoms of the oxygen having a content ratio of greater than one with respect to to atoms of the fluorine for rounding the angular corner portions; and burying an insulating film in the trench for forming an element isolation region.
Claim 26
Dependent Claim
37 words
The method of claim 22, further comprising the step of eliminating a naturally oxidized film formed on the inner wall of the trench between said forming the trench and said etching the corner portions of the trench.
Claim 27
Dependent Claim
74 words
The method of claim 22, further comprising the step of masking the substrate except for a portion thereof where the trench is to be formed with an etching mask prior to forming the trench, and a step of eliminating the etching mask covering the angular corner portions of the trench after said step of forming the trench and prior to said as step of chemically dry etching the angular corner portions of the trench.
Claim 28
Dependent Claim
22 words
The method of claim 24, wherein the step of masking includes the step of depositing a mask of a material including oxygen.
Claim 29
Dependent Claim
41 words
The method of claim 22 also including the step of doping an impurity having either an n-type or a p-type conductivity into the silicon substrate prior to the anisotropic etching to produce the shape of the surface of the silicon substrate.
References Cited (Backward Citations)
JPS5314472A
Cited
JPS5923522A
Cited
JPS59141232A
Cited
US4475982A
Cited
US4645564A
Cited
US4735824A
Cited
US4718973A
Cited
US4693781A
Cited
US4729815A
Cited
US4857477A
Cited
US4717448A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-11-01 | 1997-05-03 | 1997-11-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-11-01 | 2001-05-03 | 2001-11-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-11-01 | 2005-05-03 | 2005-11-02 | $7700.00 | Window Closed / Lapsed |