Multiple step trench etching process

Claim 2

A process for etching trenches with rounded corners in a semiconductor substrate comprising the sequence of steps of: performing a first etch using NF 3 and CHF 3 etch species at a first DC etch bias, to form a preliminary trench having sharp top corners and sharp bottom corners; performing a second etch using NF 3 and CHF 3 as etch species at a second DC etch bias higher than said first DC etch bias, to etch the sharp corners of the trench into rounded top corners; and performing a third etch using only NF 3 as etch species, to further extend the depth of the trench while forming rounded bottom corners.

Claim 3

The process of claim 1 wherein the three etch steps are all performed in the same piece of equipment.

Claim 4

The process of claim 1 wherein the etch steps all have a chemical mechanism at work and a physical mechanism at work, and in the first and third etch steps the chemical mechanism predominates and in the second etch step the physical mechanism predominates.

Claim 5

The process of claim 1 wherein the first etch step is anisotropic and the second etch step is isotropic.

Claim 6

The process of claim 1 wherein the semiconductor substrate is silicon and a silicon dioxide masking layer is present over the surface of the semiconductor substrate prior to the first etch.

Claim 7

The process of claim 1 wherein the etching occurs within an etcher having variable DC bias, and the absolute DC bias of the second etch step is greater than the absolute DC bias of the first and third steps.

Claim 8

The process of claim 1 wherein the first etch step uses NF 3 and CHF 3 as etch species at a DC bias voltage of from about -210 to -250 volts, the second etch step uses NF 3 and CHF 3 as etch species at a DC bias voltage of -300 to -400 volts and the third etch step uses only NF 3 as etch species at a power of about 400 W.

Claim 9

The process of claim 1 wherein the first etch anisotropically etches the preliminary trench approximately 85 to 90% the depth of the finished trench.

Claim 10

A process for plasma etching trenches in a semiconductor substrate comprising the steps of: forming a masking layer over a surface of the semiconductor substrate; forming an opening in the masking layer to expose a selected portion of the semiconductor substrate surface; performing a first plasma etch using NF 3 and CHF 3 as etch species at a first DC etch bias, of the semiconductor substrate through the opening anisotropically forming a preliminary trench having sharp top corners and sharp bottom corners; performing a second plasma etch using NF 3 and CHF 3 as etch species at a second DC etch bias higher than said first DC bias, of the semiconductor substrate to etch the top corners of the preliminary trench providing rounded top corners; and performing a third plasma etch using only NF 3 as species of the semiconductor substrate further extending the depth of the trench while forming rounded bottom corners providing a finished trench profile having rounded corners.

Claim 11

A process for plasma etching trenches in a semiconductor substrate comprising the steps of: forming a masking layer over a surface of the semiconductor substrate; forming an opening in the masking layer to expose a selected portion of the semiconductor substrate surface; performing a first plasma etch using NF 3 and CHF 3 as etch species at a first DC etch bias, of the semiconductor substrate through the opening anisotropically forming a preliminary trench having sharp top corners and sharp bottom corners; performing a second plasma etch using NF 3 and CHF 3 as etch species at a second DC etch bias higher than said first DC bias, of the semiconductor substrate to etch the top corners of the preliminary trench providing rounded top corners; and performing a third plasma etch using only NF 3 as species of the semiconductor substrate further extending the depth of the trench while forming rounded bottom corners providing a finished trench profile having rounded corners.

Claim 12

The process of claim 9 wherein the semiconductor substrate is silicon and the masking layer is silicon oxide.

Claim 13

The process of claim 9 wherein the etching occurs within an etcher having variable DC bias, and the first etch step has a first DC bias, the second etch step has a second DC bias and the third etch step has a third DC bias wherein the second DC bias is greater than the first DC bias and the third DC bias is approximately equal to the first DC bias.

Claim 14

The process of claim 9 wherein the first etch step uses NF 3 and CHF 3 as etch species at a DC bias voltage of from about -210 to -250 volts, the second etch step uses NF 3 and CHF 3 as etch species at a DC bias voltage of -300 to -400 volts and the third etch step uses only NF 3 etch species at a power of about 400 W.

Claim 15

The process of claim 9 wherein the first plasma etch anisotropically etches the preliminary trench approximately 85 to 90% the depth of the finished trench.

Claim 16

A process for plasma etching trenches having rounded corners in a silicon substrate comprising the steps of: forming a top masking layer of a photoresist material and a bottom masking layer of silicon dioxide over a surface of the silicon substrate; forming an opening in the top masking layer and bottom masking layer to expose a selected portion of the silicon substrate surface; performing a long first plasma etch of the silicon substrate through the opening anisotropically using NF 3 and CHF 3 as etch species at a first DC bias voltage, forming a preliminary trench having sharp top corners and sharp bottom corners and a depth of from 85 to 95% of the depth of the finished trench, and removing the top masking layer; performing a short second plasma etch of the silicon substrate using NF 3 and CHF 3 as etch species at a second DC bias voltage higher than said first DC bias voltage to etch away edges of the bottom mask layer while etching the top corners of the preliminary trench providing a rounded profile; and performing a short third plasma etch of the silicon substrate using NF 3 only as etch species at a third DC bias voltage lower than said second DC bias voltage, further extending the depth of the trench while forming rounded bottom corners providing a finished trench profile having rounded corners.

Claim 17

A process for plasma etching trenches having rounded corners in a silicon substrate comprising the steps of: forming a top masking layer of a photoresist material and a bottom masking layer of silicon dioxide over a surface of the silicon substrate; forming an opening in the top masking layer and bottom masking layer to expose a selected portion of the silicon substrate surface; performing a long first plasma etch of the silicon substrate through the opening anisotropically using NF 3 and CHF 3 as etch species at a first DC bias voltage, forming a preliminary trench having sharp top corners and sharp bottom corners and a depth of from 85 to 95% of the depth of the finished trench, and removing the top masking layer; performing a short second plasma etch of the silicon substrate using NF 3 and CHF 3 as etch species at a second DC bias voltage higher than said first DC bias voltage to etch away edges of the bottom mask layer while etching the top corners of the preliminary trench providing a rounded profile; and performing a short third plasma etch of the silicon substrate using NF 3 only as etch species at a third DC bias voltage lower than said second DC bias voltage, further extending the depth of the trench while forming rounded bottom corners providing a finished trench profile having rounded corners.

Claim 18

The process of claim 14 wherein the DC bias voltage of the first etch step is between about -210 and -250 volts, the DC bias voltage of the second etch step is between about -300 and -400 volts and the power of the third etch step is about 400 W.