Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
303 words
A process for fabricating an array of memory cells in a substrate, comprising the steps of: a) forming a raised isolation region on said substrate, said forming step including the steps of: growing a first thermal oxide layer over an active region of said substrate, depositing a first conductive layer over said first thermal oxide used to form floating gates, and depositing a layer of nitride over said first conductive layer; b) masking and etching said first conductive layer and said nitride layer to form a plurality of spaced, elongated stacks extending in a first direction; c) implanting impurities having a conductivity type opposite that of said substrate into the array active area between said stacks to form continuous, elongated diffusion rails extending in said first direction and having a substantially flat contour, said diffusion rails forming spaced bit column lines; d) growing a second thermal oxide layer over said diffusion rails and the edges of said first conductive layer; e) depositing a second conductive layer over said second thermal oxide layer used to form auxiliary gates; f) planarizing said second conductive layer so that it is substantially flush with said nitride layer; g) growing a third thermal oxide layer over said second conductive layer; h) selectively etching said nitride layer to remove portions thereof covering said first conductive layer so as to expose said first conductive layer; i) forming a first dielectric layer over said exposed first conductive layer; j) depositing a third conductive layer over said first dielectric layer; k) depositing a second dielectric layer over said third conductive layer; l) patterning said third conductive layer and said second dielectric layer to form word lines; and m) selectively etching said first conductive layer to substantially align said first conductive layer with said third conductive layer and to form field isolation regions.
Claim 2
Dependent Claim
303 words
A process for fabricating an array of memory cells in a substrate, comprising the steps of: a) forming a raised isolation region on said substrate, said forming step including the steps of: growing a first thermal oxide layer over an active region of said substrate, depositing a first conductive layer over said first thermal oxide used to form floating gates, and depositing a layer of nitride over said first conductive layer; b) masking and etching said first conductive layer and said nitride layer to form a plurality of spaced, elongated stacks extending in a first direction; c) implanting impurities having a conductivity type opposite that of said substrate into the array active area between said stacks to form continuous, elongated diffusion rails extending in said first direction and having a substantially flat contour, said diffusion rails forming spaced bit column lines; d) growing a second thermal oxide layer over said diffusion rails and the edges of said first conductive layer; e) depositing a second conductive layer over said second thermal oxide layer used to form auxiliary gates; f) planarizing said second conductive layer so that it is substantially flush with said nitride layer; g) growing a third thermal oxide layer over said second conductive layer; h) selectively etching said nitride layer to remove portions thereof covering said first conductive layer so as to expose said first conductive layer; i) forming a first dielectric layer over said exposed first conductive layer; j) depositing a third conductive layer over said first dielectric layer; k) depositing a second dielectric layer over said third conductive layer; l) patterning said third conductive layer and said second dielectric layer to form word lines; and m) selectively etching said first conductive layer to substantially align said first conductive layer with said third conductive layer and to form field isolation regions.
Claim 3
Dependent Claim
38 words
The process of claim 1 further including the steps of: implanting an impurity into said field isolation regions; forming an oxide layer over said field isolation regions; and depositing a third dielectric layer over said field isolation regions.
Claim 4
Dependent Claim
14 words
The process of claim 1 wherein said first conductive layer is doped with phosphorous.
Claim 5
Dependent Claim
12 words
The process of claim 1 wherein said first conductive layer is polysilicon.
Claim 6
Dependent Claim
13 words
The process of claim 1 wherein said substrate is a p-type silicon substrate.
Claim 7
Dependent Claim
16 words
The process of claim 5 wherein in said implanting step (e), said impurities are n-type impurities.
Claim 8
Dependent Claim
12 words
The process of claim 1 wherein said second conductive layer is polysilicon.
Claim 9
Dependent Claim
29 words
The process of claim 1 wherein each bit-column line defines a source region and a drain region of each pair of adjacent array cells associated with the bit-column line.
Claim 10
Dependent Claim
14 words
The process of claim 1 wherein said second conductive layer is doped with phosphorous.
Claim 11
Dependent Claim
16 words
The process of claim 1 wherein said first dielectric layer comprises an ONO interpoly dielectric layer.
Claim 12
Dependent Claim
12 words
The process of claim 1 wherein said third conductive layer is polysilicon.
Claim 13
Dependent Claim
15 words
The process of claim 2 wherein said third dielectric layer is comprised of phosphosilicate glass.