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US5527766A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for epitaxial lift-off for oxide films utilizing superconductor release layers

Assignee: Clearday Inc
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Filing: 1993-12-13
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Granted: 1996-06-18
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Expires: 2013-12-13
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Abstract

Abstract Novel structures and methods utilize layered copper oxide release materials to separate oxide films from growth substrates. Generally, the method comprises the steps of: first, forming a layered copper oxide sacrificial release material on a growth substrate, in the preferred embodiment being the high temperature superconductor YBCO grown on a compatible substrate such as LaAlO3, second, forming an oxide film on the layered copper oxide release material, in the preferred embodiment, a ferroelectric, an optical material or a oxide film compatible with further high temperature superconductor growth, such as SrTiO3 or CeO2, and third, etching the layered copper oxide release material so as to separate the oxide film from the growth substrate. Optionally, additional layers may be grown on the oxide film prior to etching. In the preferred embodiment, when high temperature superconducting devices are formed, the oxide films would be a material such as SrTiO3 or CeO2, upon which yet another high temperature superconducting film would be grown. After patterning and protecting the etched film, the structure may be etched. Generally, any of the layered copper oxide films, such as YBCO, TlCaBaCuO, LaSrCuOx and BiSrCaCuOx can be used. Oxide films having a substantially lower etch rate than the layered copper oxide materials incompatible with growth on the layered copper oxide materials may be utilized.

Inventors

  • 👤 Michael M. Eddy

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 04:04
CPC Classifications
C; C04; C04B; C04B35/00; C04B35/01; C04B35/45; C04B35/622; C04B35/62218; H; H10; H10N; H10N60/00; H10N60/01; H10N60/0268; H10N60/0296; G; G02; G02F; G02F1/00; G02F1/0009; G02F1/0018; G02F1/0027; Y; Y10; Y10S; Y10S117/00; Y10S117/915

Claims Analysis

Total Claims: 29
Claim 1
Independent Claim 85 words
A method for forming oxide films comprising the steps of: (a) forming a layered copper oxide release material on a growth substrate wherein the layered copper oxide release material is chosen from the following group: the YBaCuO, the TlCaBaCuO, the LaSrCuO, and the BiSrCaCuOx families of superconductors, (b) forming a first oxide film on the release material, (c) etching away the release material to separate said first oxide film from the growth substrate, and (d) attaching said first oxide film to a planar support member.
Claim 2
Independent Claim 85 words
A method for forming oxide films comprising the steps of: (a) forming a layered copper oxide release material on a growth substrate wherein the layered copper oxide release material is chosen from the following group: the YBaCuO, the TlCaBaCuO, the LaSrCuO, and the BiSrCaCuOx families of superconductors, (b) forming a first oxide film on the release material, (c) etching away the release material to separate said first oxide film from the growth substrate, and (d) attaching said first oxide film to a planar support member.
Claim 3
Dependent Claim 18 words
The method for forming oxide films of claim 1 wherein the planar support member comprises a second substrate.
Claim 4
Dependent Claim 16 words
The method of claim 1 wherein a second oxide is formed on the first oxide film.
Claim 5
Dependent Claim 18 words
The method claim 3 wherein the oxide film is separated from the second oxide film by a dielectric.
Claim 6
Dependent Claim 12 words
The method of claim 4 wherein the dielectric is an organic dielectric.
Claim 7
Dependent Claim 17 words
The method of claim 4 wherein the dielectric has a thickness from 0.5 microns to 100 microns.
Claim 8
Dependent Claim 13 words
The method of claim 2 wherein the second substrate is a support substrate.
Claim 9
Dependent Claim 23 words
The method of claim 7 wherein the support substrate is attached to the first oxide layer prior to the etch of step c.
Claim 10
Dependent Claim 17 words
The method of claim 8 wherein the support substrate is attached to the oxide with a wax.
Claim 11
Dependent Claim 19 words
The method of claim 9 wherein the wax is selected from the group consisting of: organic glues or Apiezon.
Claim 12
Dependent Claim 31 words
The method for forming oxide films of claim 1 wherein after the growth substrate is released from the oxide film, the growth substrate is reused for formation of another oxide film.
Claim 13
Dependent Claim 15 words
The method of claim 1 wherein the layered copper oxide is a high temperature superconductor.
Claim 14
Dependent Claim 17 words
The method of claim 1 wherein the release material is from 50 Å to 0.5 microns thick.
Claim 15
Dependent Claim 21 words
The method of claim 1 where the growth substrate includes a buffer layer disposed adjacent the layered copper oxide release material.
Claim 16
Independent Claim 14 words
The method of claims 2 or 3 wherein the layered copper oxide is YBaCuO.
Claim 17
Dependent Claim 12 words
The method of claim 1 wherein the oxide film is a ferroelectric.
Claim 18
Dependent Claim 13 words
The method of claim 1 wherein the oxide film is an optical material.
Claim 19
Dependent Claim 14 words
The method of claim 17 wherein the optical material is a non-linear optical material.
Claim 20
Dependent Claim 15 words
The method of claim 1 where the oxide film is compatible with high temperature superconductor.
Claim 21
Dependent Claim 20 words
The method of claim 19 further including the step of forming a high temperature superconducting structure on the oxide layer.
Claim 22
Dependent Claim 21 words
The method of claim 20 further including the step of patterning and etching the high temperature superconductor on the oxide layer.
Claim 23
Dependent Claim 42 words
The method of claim 1 wherein the oxide film is chosen from the group of SrTiO 3 , SrAl 0 .5 Ta 0 .5 O 3 , LaAlO 3 , BaTiO 3 , NdGaO 3 , NdAlO 3 or CeO 2 .
Claim 24
Dependent Claim 22 words
The method of claim 1 wherein the etching uses acid chosen from the following group: hydrochloric acid, phosphoric acid and nitric acid.
Claim 25
Dependent Claim 20 words
The method of claim 23 wherein the hydrochloric acid etch is in the range from 2:1 to 100:1 by volume.
Claim 26
Dependent Claim 28 words
The method of claim 1 wherein the etch rate of the release layer is at least 10 5 times greater than the etch rate for the oxide layer.
Claim 27
Dependent Claim 16 words
The method of claim 1 wherein the etching occurs partially through vias in the growth substrate.
Claim 28
Independent Claim 63 words
A method for forming oxide films comprising the steps of: (a) forming a layered copper oxide release material made of YBaCuO on a growth substrate. (b) forming a first oxide film on the release material, (c) etching away the release material to separate said first oxide film from the growth substrate, and (d) attaching said first oxide film to a planar support member.
Claim 29
Independent Claim 63 words
A method for forming oxide films comprising the steps of: (a) forming a layered copper oxide release material made of YBaCuO on a growth substrate. (b) forming a first oxide film on the release material, (c) etching away the release material to separate said first oxide film from the growth substrate, and (d) attaching said first oxide film to a planar support member.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-06-18 1999-12-18 2000-06-18 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-06-18 2003-12-18 2004-06-18 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-06-18 2007-12-18 2008-06-18 $7700.00 Window Closed / Lapsed

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