Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
173 words
A semiconductor memory device comprising: a memory cell array having memory cells arranged in a matrix of rows and columns; row lines connected to the memory cells belonging to the same rows; column lines connected the memory cells belonging to the same columns; precharge means for precharging the column lines, the precharge means including column line potential setting transistors provided between a potential supply terminal and the column lines, the column line potential setting transistors for setting potentials of the column lines to a predetermined value during a precharge operation; and control signal generator means for providing signals to gates of the column line potential setting transistors, wherein after completion of the precharge operation, the control signal generator means provides a first signal to the gates of the column line potential setting transistors of a level which is lower than a signal level provided to the gates of the column line potential setting transistors during the precharge operation, wherein the level of the first signal turns off the column line potential setting transistors.
Claim 2
Dependent Claim
173 words
A semiconductor memory device comprising: a memory cell array having memory cells arranged in a matrix of rows and columns; row lines connected to the memory cells belonging to the same rows; column lines connected the memory cells belonging to the same columns; precharge means for precharging the column lines, the precharge means including column line potential setting transistors provided between a potential supply terminal and the column lines, the column line potential setting transistors for setting potentials of the column lines to a predetermined value during a precharge operation; and control signal generator means for providing signals to gates of the column line potential setting transistors, wherein after completion of the precharge operation, the control signal generator means provides a first signal to the gates of the column line potential setting transistors of a level which is lower than a signal level provided to the gates of the column line potential setting transistors during the precharge operation, wherein the level of the first signal turns off the column line potential setting transistors.
Claim 3
Dependent Claim
22 words
The semiconductor memory device as set forth in claim 1, wherein an column line potential setting transistors are of the enhancement type.
Claim 4
Dependent Claim
17 words
The semiconductor memory as set forth in claim 1, wherein neighboring column lines have alternate precharge periods.
Claim 5
Dependent Claim
339 words
A semiconductor memory device comprising: a memory cell array having memory cells arranged in a matrix of rows and columns; row lines connected to the memory cells belonging to the same rows; column lines connected to the memory cells belonging to the same columns; precharge means for precharging the column lines, the precharge means including first column line potential setting transistors and second column line potential setting transistors, the first column line potential setting transistors provided between a potential supply terminal and the column lines of odd columns and adapted to set potentials of the odd column lines to a predetermined value in response to a first control signal when the odd column lines are precharged, the second column line potential setting transistors provided between the potential supply terminal and the column lines of even columns and adapted to set potentials of the even column lines to the predetermined value in response to a second control signal when the even column lines are precharged; and control signal generator means for providing signals to gates of the first and second column line potential setting transistors, wherein after completion of the precharge of the odd column lines, the control signal generator means provides a first signal to the gates of the first column line potential setting transistors of a first level which is lower than a signal level provided to the gates of the first column line potential setting transistors when the odd columns are precharged, wherein the first level of the first signal turns off the first column line potential setting transistors, and wherein after completion of the precharge of the even column lines, the control signal generator means provides a second signal to the gates of the second column line potential setting transistors of a second level which is lower than a signal level provided to the gates of the second column line potential setting transistors when the even columns are precharged, wherein the second level of the second signal turns off the second column line potential setting transistors.
Claim 6
Dependent Claim
339 words
A semiconductor memory device comprising: a memory cell array having memory cells arranged in a matrix of rows and columns; row lines connected to the memory cells belonging to the same rows; column lines connected to the memory cells belonging to the same columns; precharge means for precharging the column lines, the precharge means including first column line potential setting transistors and second column line potential setting transistors, the first column line potential setting transistors provided between a potential supply terminal and the column lines of odd columns and adapted to set potentials of the odd column lines to a predetermined value in response to a first control signal when the odd column lines are precharged, the second column line potential setting transistors provided between the potential supply terminal and the column lines of even columns and adapted to set potentials of the even column lines to the predetermined value in response to a second control signal when the even column lines are precharged; and control signal generator means for providing signals to gates of the first and second column line potential setting transistors, wherein after completion of the precharge of the odd column lines, the control signal generator means provides a first signal to the gates of the first column line potential setting transistors of a first level which is lower than a signal level provided to the gates of the first column line potential setting transistors when the odd columns are precharged, wherein the first level of the first signal turns off the first column line potential setting transistors, and wherein after completion of the precharge of the even column lines, the control signal generator means provides a second signal to the gates of the second column line potential setting transistors of a second level which is lower than a signal level provided to the gates of the second column line potential setting transistors when the even columns are precharged, wherein the second level of the second signal turns off the second column line potential setting transistors.
Claim 7
Dependent Claim
22 words
The semiconductor memory device as set forth in claim 4, wherein the column line potential setting transistors are of an enhancement type.
Claim 8
Dependent Claim
17 words
The semiconductor memory as set forth in claim 4, wherein neighboring column lines have alternate precharge periods.
Claim 9
Dependent Claim
50 words
The invention of claim 1 wherein the level of the first signal provided to the gates of the column line potential setting transistors and the signal level applied provided to the gates of the column line potential setting transistors during the precharge operation both correspond to a logic "1" level.
Claim 10
Dependent Claim
52 words
The invention of claim 1 wherein the level of the first signal provided to the gates of the first column line potential setting transistors and the signal level applied provided to the gates of the first column line potential setting transistors during the precharge operation both correspond to a logic "1" level.