Patent US5518957A successfully refreshed from Google Patents.
US5518957A
Expired / Lapsed
US
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Method for making a thin profile semiconductor package
Assignee: Samsung Electronics Co Ltd
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Filing: 1994-03-28
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Granted: 1996-05-21
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Expires: 2014-03-28
Abstract
Abstract A process for manufacturing a thin profile semiconductor package by means of TAB (tape automated bonding). A barrier metal layer is formed on bonding pads formed on portions of a chip covered with insulating layers. A photoresist layer is formed on the resultant structure, and patterned so as to expose the barrier metal layer, and then bumps are formed on the barrier metal layer as high as the photoresist layer. The semiconductor package is completed by bonding the bumps and inner lead portions of the TAB tape. The photoresist remains on the completed package as a permanent protective layer.
Inventors
- 👤 Gu S. Kim
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 11:12
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/40; H10W70/453; H10W72/00; H10W72/071; H10W72/077; H10W72/701; H10W72/90; H10W72/072; H10W72/07251; H10W72/20; H10W72/251; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49121
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
222 words
A method for making a semiconductor package, comprising the steps of: forming a plurality of bonding pads on portions of a semiconductor substrate; forming an insulating layer on said substrate; forming contact holes in said insulating layer to expose said bonding pads; forming a barrier metal layer on said bonding pads; forming a photoresist layer on said insulating layer, said photoresist layer having a lower surface in contact with said insulating layer, and an upper surface; forming contact holes in said photoresist layer to thereby expose said barrier metal layer; forming bumps on said barrier metal layer; providing a tape substrate having lower and upper surfaces, and a plurality of leads having end portions with an upper surface attached to said lower surface of said tape substrate and a lower surface; bonding said lower surface of said end portions of said leads to said bumps, without removing said photoresist layer; wherein said photoresist layer is not removed, and thereby serves as both a mask for facilitating deposition of said bumps on said barrier metal layer, and as a permanent protective layer; and wherein said upper surface of said photoresist layer lies in a plane disposed below a first plane defined by said upper surface of said tape substrate, but above a second plane defined by said lower surface of said tape substrate.
Claim 2
Independent Claim
222 words
A method for making a semiconductor package, comprising the steps of: forming a plurality of bonding pads on portions of a semiconductor substrate; forming an insulating layer on said substrate; forming contact holes in said insulating layer to expose said bonding pads; forming a barrier metal layer on said bonding pads; forming a photoresist layer on said insulating layer, said photoresist layer having a lower surface in contact with said insulating layer, and an upper surface; forming contact holes in said photoresist layer to thereby expose said barrier metal layer; forming bumps on said barrier metal layer; providing a tape substrate having lower and upper surfaces, and a plurality of leads having end portions with an upper surface attached to said lower surface of said tape substrate and a lower surface; bonding said lower surface of said end portions of said leads to said bumps, without removing said photoresist layer; wherein said photoresist layer is not removed, and thereby serves as both a mask for facilitating deposition of said bumps on said barrier metal layer, and as a permanent protective layer; and wherein said upper surface of said photoresist layer lies in a plane disposed below a first plane defined by said upper surface of said tape substrate, but above a second plane defined by said lower surface of said tape substrate.
Claim 3
Dependent Claim
21 words
The method as set forth in claim 1, wherein said bonding step is carried out by means of a thermocompression process.
Claim 4
Dependent Claim
21 words
The method as set forth in claim 1, wherein said bonding step is carried out by means of a reflow process.
Claim 5
Dependent Claim
32 words
The method as set forth in claim 1, wherein said forming bumps step is carried out by forming said bumps to be substantially coplanar with said upper surface of said photoresist layer.
Claim 6
Dependent Claim
22 words
The method as set forth in claim 1, wherein said forming bumps step is carried out by means of an electroplating method.
Claim 7
Dependent Claim
17 words
The method as set forth in claim 1, wherein said photoresist layer is made of photosensitive polyimide.
Claim 8
Dependent Claim
28 words
The method as set forth in claim 1, wherein said bumps are made of a material selected from a group consisting of Au, Cu, Au/Cu, Pb/Sn, and Pb/Sn/Ag.
Claim 9
Dependent Claim
29 words
The method as set forth in claim 1, wherein said barrier metal layer is made of a material selected from a group consisting of Cr, Cu, Ti, and TiW.
Claim 10
Dependent Claim
16 words
The method as set forth in claim 1, wherein said bonding pads are made of aluminum.
Claim 11
Dependent Claim
15 words
The method as set forth in claim 1, wherein said tape substrate comprises TAB tape.
Claim 12
Dependent Claim
15 words
The method as set forth in claim 2, wherein said tape substrate comprises polyimide tape.
Claim 13
Dependent Claim
22 words
The package as set forth in claim 1, wherein said photoresist layer does not contact said upper surface of said tape substrate.
Claim 14
Dependent Claim
23 words
The method as set forth in claim 1, wherein said photoresist layer does not project beyond said upper surface of said tape substrate.
Claim 15
Independent Claim
211 words
A method for making a semiconductor package, comprising the steps of: forming a plurality of bonding pads on portions of a semiconductor substrate; forming an insulating layer on said substrate; forming contact holes in said insulating layer to expose said bonding pads; forming a barrier metal layer on said bonding pads; forming a photoresist layer on said insulating layer, said photoresist layer having a lower surface in contact with said insulating layer, and an upper surface; forming contact holes in said photoresist layer to thereby expose said barrier metal layer; forming bumps on said barrier metal layer; providing a tape substrate having lower and upper surfaces, and a plurality of leads having end portions with an upper surface attached to said lower surface of said tape substrate and a lower surface; bonding said lower surface of said end portions of said leads to said bumps; wherein said photoresist layer serves as both a mask for facilitating deposition of said bumps on said barrier metal layer, and as a protective layer; and, wherein said upper surface of said photoresist layer lies in a plane disposed below a first plane defined by said upper surface of said tape substrate, but above a second plane defined by said lower surface of said tape substrate.
Claim 16
Independent Claim
211 words
A method for making a semiconductor package, comprising the steps of: forming a plurality of bonding pads on portions of a semiconductor substrate; forming an insulating layer on said substrate; forming contact holes in said insulating layer to expose said bonding pads; forming a barrier metal layer on said bonding pads; forming a photoresist layer on said insulating layer, said photoresist layer having a lower surface in contact with said insulating layer, and an upper surface; forming contact holes in said photoresist layer to thereby expose said barrier metal layer; forming bumps on said barrier metal layer; providing a tape substrate having lower and upper surfaces, and a plurality of leads having end portions with an upper surface attached to said lower surface of said tape substrate and a lower surface; bonding said lower surface of said end portions of said leads to said bumps; wherein said photoresist layer serves as both a mask for facilitating deposition of said bumps on said barrier metal layer, and as a protective layer; and, wherein said upper surface of said photoresist layer lies in a plane disposed below a first plane defined by said upper surface of said tape substrate, but above a second plane defined by said lower surface of said tape substrate.
References Cited (Backward Citations)
US3537175A
Cited
US3711625A
Cited
US3868724A
Cited
JPS5240973A
Cited
US4328262A
Cited
JPS5932161A
Cited
JPS6288348A
Cited
JPS62136049A
Cited
JPS62232147A
Cited
US4908689A
Cited
JPS63142663A
Cited
JPS63245942A
Cited
JPS63263748A
Cited
JPS6447038A
Cited
JPH01179334A
Cited
JPH02128453A
Cited
US5136367A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-05-21 | 1999-11-20 | 2000-05-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-05-21 | 2003-11-20 | 2004-05-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-05-21 | 2007-11-20 | 2008-05-21 | $7700.00 | Window Closed / Lapsed |