← Back to Patent Explorer
US5517312A Expired / Lapsed US ⏱️ 0.0 years remaining

Device for measuring the thickness of thin films

Assignee: Nova Ltd
•
Filing: 1994-04-01
•
Granted: 1996-05-14
•
Expires: 2014-04-01
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A thin film thickness measuring device is disclosed. The device includes an illuminator, a receiver and a beam deflector. The illuminator provides a collimated input light beam along an input axis. The receiver includes a lens and a diaphragm having a pinhole located at a focal point of the lens and receives a collimated output light beam along an output axis parallel to the input axis. The beam deflector is translatable at least along a scanning axis parallel to the input axis. The beam deflector directs the input light beam towards a sample and the output light beam from the sample towards the receiver.

Inventors

  • 👤 Moshe Finarov

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 22:07
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/02; G01B11/06; G01B11/0616; G01B11/0641; G01B11/065

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 121 words
A thickness measuring device for measuring the thickness of thin films on a sample, the device comprising: a stationary illuminator for providing a collimated input light beam along an input axis; a beam deflector for directing said input light beam towards said sample and for directing and collimating an output light beam from said sample, said beam deflector comprising a collimating lens which receives at least said output light beam and two-dimensional translation means for translating said beam deflector along a first scanning axis parallel to said input axis and along a second scanning axis perpendicular to said first scanning axis; and a stationary receiver for receiving said collimated output light beam along an output axis parallel to said input axis.
Claim 2
Dependent Claim 121 words
A thickness measuring device for measuring the thickness of thin films on a sample, the device comprising: a stationary illuminator for providing a collimated input light beam along an input axis; a beam deflector for directing said input light beam towards said sample and for directing and collimating an output light beam from said sample, said beam deflector comprising a collimating lens which receives at least said output light beam and two-dimensional translation means for translating said beam deflector along a first scanning axis parallel to said input axis and along a second scanning axis perpendicular to said first scanning axis; and a stationary receiver for receiving said collimated output light beam along an output axis parallel to said input axis.
Claim 3
Dependent Claim 76 words
A device according to claim 1 and wherein said beam deflector additionally comprises a first beam deflecting element for deflecting said input light beam at an angle of incidence towards said sample and a second beam deflecting element, different from said first beam deflecting element, for deflecting a light beam reflected at an angle from said sample along said output axis, wherein said objective lens receives said output light beam from said second beam deflecting element.
Claim 4
Dependent Claim 83 words
A device according to claim 1 and wherein said beam deflector additionally comprises a first mirror for deflecting said input light beam from said input axis to said second scanning axis, a second mirror for deflecting said input light beam from said second scanning axis to said sample, a third mirror deflecting a reflected light beam from said sample to said second scanning axis, and a fourth mirror for deflecting said reflected light beam from said second scanning axis to said output axis.
Claim 5
Dependent Claim 17 words
A device according to claim 2 and wherein said first and second beam deflecting elements are mirrors.
Claim 6
Dependent Claim 26 words
A device according to claim 2 and wherein said first beam deflecting element is a beam splitter and said second beam deflecting element is a mirror.
Claim 7
Dependent Claim 27 words
A device according to claim 5 wherein said receiver additionally comprises a spectrophotometer and wherein said collimating lens additionally focusses said input light beam on said sample.
Claim 8
Dependent Claim 38 words
A device according to claim 2 wherein said device is an ellipsometer, wherein said illuminator comprises a light source, a polarizer and a compensator, wherein said receiver comprises an analyzer, and wherein said polarizer and analyzer are rotatable.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-05-14 1999-11-13 2000-05-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-05-14 2003-11-13 2004-05-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-05-14 2007-11-13 2008-05-14 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag