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US5488235A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor light-emitting element and method for manufacturing therefor

Assignee: Toshiba Corp
•
Filing: 1995-06-01
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Granted: 1996-01-30
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Expires: 2015-06-01
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Abstract

Abstract A semiconductor light-emitting element has a crystal layer formed from aluminum of a high mol ratio of 60% or greater on the light producing surface. In the semiconductor light-emitting element, a conductive crystal with aluminum of a mol ratio of 50% or less, or a conductive crystal containing no aluminum is formed on the high aluminum crystal layer.

Inventors

  • 👤 Hideki Nozaki
  • 👤 Kazumi Unno

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 08:30
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/84; H10H20/81; H10H20/816; H10H20/822; H10H20/824

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 73 words
A semiconductor light-emitting element comprising: an active layer; a high aluminum crystal layer formed on said active layer and formed from aluminum of a high mol ratio ≧60%; and a conductive crystal layer formed on a light producing surface of said high aluminum crystal layer, said conductive crystal layer containing aluminum of a mol ratio ≦50%, wherein said conductive crystal layer fully covers the light producing surface of said high aluminum crystal layer.
Claim 2
Dependent Claim 73 words
A semiconductor light-emitting element comprising: an active layer; a high aluminum crystal layer formed on said active layer and formed from aluminum of a high mol ratio ≧60%; and a conductive crystal layer formed on a light producing surface of said high aluminum crystal layer, said conductive crystal layer containing aluminum of a mol ratio ≦50%, wherein said conductive crystal layer fully covers the light producing surface of said high aluminum crystal layer.
Claim 3
Dependent Claim 50 words
A semiconductor light-emitting element as claimed in claim 1, wherein In 0 .5 (Ga l-x Al x ) 0 .5 P (where 0≦x≦1) is used as said conductive crystal layer that fully covers the light producing surface of said high aluminum crystal layer with aluminum of a mol ratio ≦50%.
Claim 4
Dependent Claim 82 words
A semiconductor light-emitting element as claimed in claim 1, wherein In 0 .5 (Ga 1-x Al x ) 0 .5 p (where 0≦x≦1) is used as said conductive crystal layer that fully covers the light producing surface of said high aluminum crystal layer with aluminum of a mol ratio ≦50%; and the film thickness of said conductive crystal layer that fully covers this light producing surface of said high aluminum crystal layer with aluminum of a mol ratio ≦50% is ≦0.01 μm.
Claim 5
Dependent Claim 105 words
A semiconductor light-emitting element as claimed in claim 1, wherein In 0 .5 (Ga 1-x Al x ) 0 .5 p (where 0≦x≦1) is used as said conductive crystal layer with aluminum of a mol ratio ≦50%; and in the case where a forbidden band width of said active crystal layer with aluminum of a mol ratio ≦50% is smaller than a forbidden band width of said active layer, the film thickness of said conductive crystal layer In 0 .5 (Ga 1-x Al x ) 0 .5 P with aluminum of a mol ratio ≦50% is within the range of 0.01 μm to 2 μm.
Claim 6
Dependent Claim 31 words
A semiconductor light-emitting element as claimed in claim 1, wherein Ga 1-x Al x As (where 0≦x≦0.5) is used as said conductive crystal layer with aluminum of a mol ratio ≦50%.
Claim 7
Dependent Claim 50 words
A semiconductor light-emitting element as claimed in claim 5, wherein Ga 1-x Al x As (where 0≦x≦0.5) is used as said conductive crystal layer with aluminum of a mol ratio ≦50%; and the film thickness of said conductive crystal layer with aluminum of a mol ratio ≦50% is ≧0.01 μm.
Claim 8
Dependent Claim 73 words
A semiconductor light-emitting element as claimed in claim 5, wherein, in the cage where a forbidden band width of said conductive crystal layer with aluminum of a mol ratio ≦50% is smaller than a forbidden band width of said active layer, the film thickness of said conductive crystal layer Ga 1-x Al x As (where 0≦x≦0.5) with aluminum of a mol ratio ≦50% is within the range of 0.01 μm to 2 μm.
Claim 9
Dependent Claim 29 words
A semiconductor light-emitting element as claimed in claim 1, wherein said active layer, said high aluminum crystal layer and said conductive crystal layer are formed on a GaAs substrate.
Claim 10
Dependent Claim 72 words
A semiconductor light-emitting element comprising: an active layer; a high aluminum crystal layer formed from aluminum of a high mol ratio ≧60% ; and A conductive crystal layer formed on a light producing surface of said high aluminum crystal layer, said conductive crystal layer containing no aluminum is formed on the high aluminum crystal layer, wherein said conductive crystal layer fully covers the light producing surface of said high aluminum crystal layer.
Claim 11
Dependent Claim 72 words
A semiconductor light-emitting element comprising: an active layer; a high aluminum crystal layer formed from aluminum of a high mol ratio ≧60% ; and A conductive crystal layer formed on a light producing surface of said high aluminum crystal layer, said conductive crystal layer containing no aluminum is formed on the high aluminum crystal layer, wherein said conductive crystal layer fully covers the light producing surface of said high aluminum crystal layer.
Claim 12
Dependent Claim 89 words
A semiconductor light-emitting element comprising: a n-type GaAs substrate; a n-type InGaAlP clad layer formed on said GaAs substrate; a n-type InGaAlP active layer having a light emitting region formed on said n-type InGaAlP clad layer; a p-type InGaAlP clad layer formed on said n-type InGaAlP active layer; a p-type GaAlAs current diffusion layer formed on said p-type InGaAlP clad layer; and a p-type InGaP protective layer formed on said p-type GaAlAs current diffusion layer, wherein said p-type InGaP protective layer fully covers said p-type GaAlAs current diffusion layer.
Claim 13
Dependent Claim 89 words
A semiconductor light-emitting element comprising: a n-type GaAs substrate; a n-type InGaAlP clad layer formed on said GaAs substrate; a n-type InGaAlP active layer having a light emitting region formed on said n-type InGaAlP clad layer; a p-type InGaAlP clad layer formed on said n-type InGaAlP active layer; a p-type GaAlAs current diffusion layer formed on said p-type InGaAlP clad layer; and a p-type InGaP protective layer formed on said p-type GaAlAs current diffusion layer, wherein said p-type InGaP protective layer fully covers said p-type GaAlAs current diffusion layer.

References Cited (Backward Citations)

US4368098A Cited
JPS61102786A Cited
JPS62130572A Cited
US4910571A Cited
JPS63299381A Cited
JPS63314875A Cited
JPH02298083A Cited
US5048035A Cited
US5103271A Cited
JPH05153889A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-01-29 1999-07-31 2000-01-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-01-29 2003-07-31 2004-01-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-01-29 2007-07-31 2008-01-30 $7700.00 Window Closed / Lapsed

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