Drain bias multiplexing for multiple bit flash cell

Claim 2

A memory device comprising: a first memory cell; a first comparator including a first terminal and a second terminal; a first read path circuit coupled between the first memory cell and the first terminal of the first comparator; a second memory cell; a second comparator including a first terminal and a second terminal; a second read path circuit coupled between the second memory cell and the first terminal of the second comparator; a switching circuit coupled to the first terminals of the first and second comparators and coupled to receive a control signal, the switching circuit for coupling the first terminal of the first comparator to the first terminal of the second comparator and for disabling the second read path circuit when the control signal is active such that the first terminals of the first and second comparators are both coupled to the first read path circuit.

Claim 3

The memory device of claim 1, wherein the memory device further comprises: a first reference circuit coupled to the second terminal of the first comparator for generating a first reference voltage; and a second reference circuit coupled to the second terminal of the second comparator for generating a second reference voltage.

Claim 4

The memory device of claim 2, wherein the second read path circuit includes: a drain bias circuit coupled to the second memory cell; a column load circuit coupled to the drain bias circuit, wherein the first terminal of the second comparator is coupled to a node defined between the column load circuit and the drain bias circuit.

Claim 5

The memory device of claim 3, wherein the drain bias circuit includes: a first field effect transistor (FET) having a drain coupled to the column load circuit and a source coupled to the second memory cell, wherein the first FET is disabled in response to the active control signal.

Claim 6

The memory device of claim 4, wherein the column load circuit comprises: a second FET coupled as a resistor between a supply voltage and the drain of the first FET when the control signal is inactive, wherein the second FET is disabled when the control signal is active.

Claim 7

The memory device of claim 5, wherein the second memory cell comprises: a third FET having a select gate coupled to a biasing voltage, a floating gate for storing a first amount of charge, a source coupled to system ground, and a drain coupled to the drain bias circuit, wherein the first amount of charge determines a node voltage at the node when the control signal is inactive such that the second comparator compares the node voltage to the second reference voltage and outputs a result.

Claim 8

The memory device of claim 2, wherein the first read path circuit includes: a drain bias circuit coupled to the first memory cell; a column load circuit coupled to the drain bias circuit, wherein the first terminal of the first comparator is coupled to a node defined between the column load circuit and the drain bias circuit.

Claim 9

The memory device of claim 7, wherein the drain bias circuit includes: a first field effect transistor (FET) having a drain coupled to the column load circuit and a source coupled to the first memory cell, wherein the first FET is enabled when the control signal is active.

Claim 10

The memory device of claim 8, wherein the column load circuit comprises: a second FET coupled as a resistor between a supply voltage and the drain of the first FET, wherein the second FET is enabled when the control signal is active.

Claim 11

The memory device of claim 9, wherein the first memory cell comprises: a third FET having a select gate coupled to a biasing voltage, a floating gate for storing a first amount of charge, a source coupled to system ground, and a drain coupled to the drain bias circuit, wherein the first amount of charge determines a node voltage at the node, the first comparator for comparing the node voltage to the first reference voltage, the second comparator for comparing the node voltage to the second reference voltage when the control signal is active.

Claim 12

The memory device of claim 10, wherein the second reference circuit is coupled to an output of the first comparator, the second reference circuit for generating the second reference voltage in response to the output of the first comparator.

Claim 13

The memory device of claim 10, wherein the first amount of charge corresponds to one of m possible states, where m is greater than 2.

Claim 14

The memory device of claim 10, wherein the first and second comparators perform a binary search read operation when the control signal is active.

Claim 15

A memory device comprising: a first memory cell; a first comparator including a first positive terminal and a first negative terminal; a first read path circuit coupled between the first memory cell and the first negative terminal; a second memory cell; a second comparator including a second positive terminal and a second negative terminal; a second read path circuit coupled between the second memory cell and the second negative terminal; a switching circuit coupled to the first and second negative terminals and coupled to receive a control signal, the switching circuit for coupling the first negative terminal to the second negative terminal and for disabling the second read path circuit when the control signal is active such that the first and second negative terminals are both coupled to the first read path circuit.

Claim 16

A memory device comprising: a first memory cell; a first comparator including a first positive terminal and a first negative terminal; a first read path circuit coupled between the first memory cell and the first negative terminal; a second memory cell; a second comparator including a second positive terminal and a second negative terminal; a second read path circuit coupled between the second memory cell and the second negative terminal; a switching circuit coupled to the first and second negative terminals and coupled to receive a control signal, the switching circuit for coupling the first negative terminal to the second negative terminal and for disabling the second read path circuit when the control signal is active such that the first and second negative terminals are both coupled to the first read path circuit.

Claim 17

The memory device of claim 14, wherein the memory device further comprises: a first reference circuit coupled to the first positive terminal for generating a first reference voltage; and a second reference circuit coupled to the second positive terminal for generating a second reference voltage.

Claim 18

The memory device of claim 15, wherein the second read path circuit includes: a drain bias circuit coupled to the second memory cell; a column load circuit coupled to the drain bias circuit, wherein the second negative terminal is coupled to a node defined between the column load circuit and the drain bias circuit.

Claim 19

The memory device of claim 16, wherein the drain bias circuit includes: a first field effect transistor (FET) having a drain coupled to the column load circuit and a source coupled to the second memory cell, wherein the first FET is disabled in response to the active control signal.

Claim 20

The memory device of claim 17, wherein the column load circuit comprises: a second FET coupled as a resistor between a supply voltage and the drain of the first FET when the control signal is inactive, wherein the second FET is disabled when the control signal is active.

Claim 21

The memory device of claim 18, wherein the second memory cell comprises: a third FET having a select gate coupled to a biasing voltage, a floating gate for storing a first amount of charge, a source coupled to system ground, and a drain coupled to the drain bias circuit, wherein the first amount of charge determines a node voltage at the node when the control signal is inactive such that the second comparator compares the node voltage to the second reference voltage and outputs a result.

Claim 22

The memory device of claim 15, wherein the first read path circuit includes: a drain bias circuit coupled to the first memory cell; a column load circuit coupled to the drain bias circuit, wherein the first negative terminal is coupled to a node defined between the column load circuit and the drain bias circuit.

Claim 23

the memory device of claim 20, wherein the drain bias circuit includes: a first field effect transistor (FET) having a drain coupled to the column load circuit and a source coupled to the first memory cell, wherien the first FET is enabled when the control signal is active.

Claim 24

The memory device of claim 21, wherein the column load circuit comprises: a second FET coupled as a resistor between a supply voltage and the drain of the first FET, wherein the second FET is enabled when the control signal is active.

Claim 25

The memory device of claim 22, wherein the first memory cell comprises: a third FET having a select gate coupled to a biasing voltage, a floating gate for storing a first amount of charge, a source coupled to system ground, and a drain coupled to the drain bias circuit, wherein the first amount of charge determines a node voltage at the node, the first comparator for comparing the node voltage to the first reference voltage, the second comparator for comparing the node voltage to the second reference voltage when the control signal is active.

Claim 26

The memory device of claim 23, wherein the second reference circuit is coupled to an output of the first comparator, the second reference circuit for generating the second reference voltage in response to the output of the first comparator.

Claim 27

The memory device of claim 23, wherein the first amount of charge corresponds to one of m possible states, where m is greater than 2.

Claim 28

The memory device of claim 23, wherein the first and second comparators perform a binary search read operation when the control signal is active.

Claim 29

A computer system comprising: a processor; and a memory device coupled to the processor, the memory device comprising: a first memory cell; a first comparator including a first terminal and a second terminal; a first read path circuit coupled between the first memory cell and the first terminal of the first comparator; a second memory cell; a second comparator including a first terminal and a second terminal; a second read path circuit coupled between the second memory cell and the first terminal of the second comparator; a switching circuit coupled to the first terminals of the first and second comparators and coupled to receive a control signal, the switching circuit for coupling the first terminal of the first comparator to the first terminal of the second comparator and for disabling the second read path circuit when the control signal is active such that the first terminals of the first and second comparators are both coupled to the first read path circuit.

Claim 30

A computer system comprising: a processor; and a memory device coupled to the processor, the memory device comprising: a first memory cell; a first comparator including a first terminal and a second terminal; a first read path circuit coupled between the first memory cell and the first terminal of the first comparator; a second memory cell; a second comparator including a first terminal and a second terminal; a second read path circuit coupled between the second memory cell and the first terminal of the second comparator; a switching circuit coupled to the first terminals of the first and second comparators and coupled to receive a control signal, the switching circuit for coupling the first terminal of the first comparator to the first terminal of the second comparator and for disabling the second read path circuit when the control signal is active such that the first terminals of the first and second comparators are both coupled to the first read path circuit.

Claim 31

The computer system of claim 27, wherein the memory device further comprises: a first reference circuit coupled to the second terminal of the first comparator for generating a first reference voltage; and a second reference circuit coupled to the second terminal of the second comparator for generating a second reference voltage.

Claim 32

The computer system of claim 28, wherein the second read path circuit includes: a drain bias circuit coupled to the second memory cell; a column load circuit coupled to the drain bias circuit, wherein the first terminal of the second comparator is coupled to a node defined between the column load circuit and the drain bias circuit.

Claim 33

The computer system of claim 29, wherein the drain bias circuit includes: a first field effect transistor (FET) having a drain coupled to the column load circuit and a source coupled to the second memory cell, wherein the first FET is disabled in response to the active control signal.

Claim 34

The computer system of claim 30, wherein the column load circuit comprises: a second FET coupled as a resistor between a supply voltage and the drain of the first FET when the control signal is inactive, wherein the second FET is disabled when the control signal is active.

Claim 35

The computer system of claim 31, wherein the second memory cell comprises: a third FET having a select gate coupled to a biasing voltage, a floating gate for storing a first amount of charge, a source coupled to system ground, and a drain coupled to the drain bias circuit, wherein the first amount of charge determines a node voltage at the node when the control signal is inactive such that the second comparator compares the node voltage to the second reference voltage and outputs a result.

Claim 36

The computer system of claim 28, wherein the first read path circuit includes: a drain bias circuit coupled to the first memory cell; a column load circuit coupled to the drain bias circuit, wherein the first terminal of the first comparator is coupled to a node defined between the column load circuit and the drain bias circuit.

Claim 37

The computer system of claim 33, wherein the drain bias circuit includes: a first field effect transistor (FET) having a drain coupled to the column load circuit and a source coupled to the first memory cell, wherein the first FET is enabled wehn the control signal is active.

Claim 38

The computer system of claim 34, wherein the column load circuit comprises: a second FET coupled as a resistor between a supply voltage and the drain of the first FET, wherein the second FET is enabled when the control signal is active.

Claim 39

The computer system of claim 35, wherein the first memory cell comprises: a third FET having a select gate coupled to a biasing voltage, a floating gate for storing a first amount of charge, a source coupled to system ground, and a drain coupled to the drain bias circuit, wherein the first amount of charge determines a node voltage at the node, the first comparator for comparing the node voltage to the first reference voltage, the second comparator for comparing the node voltage to the second reference voltage when the control signal is active.

Claim 40

The computer system of claim 36, wherein the second reference circuit is coupled to an output of the first comparator, the second reference circuit for generating the second reference voltage in response to the output of the first comparator.

Claim 41

The computer system of claim 36, wherein the first amount of charge corresponds to one of m possible states, where m is greater than 2.

Claim 42

The computer system of claim 36, wherein the first and second comparators perform a binary search read operation when the control signal is active.

Claim 43

The computer system of claim 27, wherein the computer system further includes a solid state hard drive which includes the memory device.

Claim 44

The computer system of claim 27, wherein the computer system further includes a memory card which includes the memory device.

Claim 45

In a memory device, a method for switching between a single-bit read mode and a multiple-bit read mode, the method comprising the steps of: selecting a first memory cell and a second memory cell; generating a control signal; if the control signal is inactive: sensing a first cell voltage of the first memory cell using a first read path circuit; comparing the first cell voltage to a first reference voltage using a first comparator coupled to the first read path circuit; outputting a first result of comparing the first cell voltage to the first reference voltage; sensing a second cell voltage of the second memory cell using a second read path circuit; comparing the second cell voltage to a second reference voltage using a second comparator coupled to the second read path circuit; and outputting a second result of comparing the second cell voltage to the second reference voltage if the control signal is active: disabling the second read path circuit; coupling the second comparator to the first read path circuit; comparing the first cell voltage to the first reference voltage using the first comparator; outputting a first result; selecting a third reference voltage in response to the first result; comparing the first cell voltage to the third reference voltage using the second comparator; outputting a third result of comparing the first cell voltage to the third reference voltage.

Claim 46

In a memory device, a method for switching between a single-bit read mode and a multiple-bit read mode, the method comprising the steps of: selecting a first memory cell and a second memory cell; generating a control signal; if the control signal is inactive: sensing a first cell voltage of the first memory cell using a first read path circuit; comparing the first cell voltage to a first reference voltage using a first comparator coupled to the first read path circuit; outputting a first result of comparing the first cell voltage to the first reference voltage; sensing a second cell voltage of the second memory cell using a second read path circuit; comparing the second cell voltage to a second reference voltage using a second comparator coupled to the second read path circuit; and outputting a second result of comparing the second cell voltage to the second reference voltage if the control signal is active: disabling the second read path circuit; coupling the second comparator to the first read path circuit; comparing the first cell voltage to the first reference voltage using the first comparator; outputting a first result; selecting a third reference voltage in response to the first result; comparing the first cell voltage to the third reference voltage using the second comparator; outputting a third result of comparing the first cell voltage to the third reference voltage.

Claim 47

A memory device comprising: a first memory cell; a first sense amplifier coupled to sense a state of the first memory cell; a second memory cell; a second sense amplifier coupled to sense a state of the second memory cell; and a switching circuit coupled to the first and second sense amplifiers and coupled to receive a control signal, the switching circuit for coupling the first memory cell to the second sense amplifier and decoupling the second memory cell from the second sense amplifier when the control signal is active such that the first and second sense amplifiers are both coupled to sense the state of the first memory cell.

Claim 48

A memory device comprising: a first memory cell; a first sense amplifier coupled to sense a state of the first memory cell; a second memory cell; a second sense amplifier coupled to sense a state of the second memory cell; and a switching circuit coupled to the first and second sense amplifiers and coupled to receive a control signal, the switching circuit for coupling the first memory cell to the second sense amplifier and decoupling the second memory cell from the second sense amplifier when the control signal is active such that the first and second sense amplifiers are both coupled to sense the state of the first memory cell.