US5480816A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating a bipolar transistor having a link base
Assignee: Mitsubishi Electric Corp
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Filing: 1994-07-12
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Granted: 1996-01-02
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Expires: 2014-07-12
Abstract
Abstract On an epitaxial layer (4) serving as a collector layer are formed an emitter layer (10), an intrinsic base layer (9) surrounding the emitter layer (10) while permitting the surface of the emitter layer (10) to be exposed, external base layers (8) and link base layers (7) lying between the intrinsic base layer (9) and external base layers (8). The intrinsic base layer between the emitter layer and the epitaxial layer serving as the collector layer has a relatively high impurity concentration, so that a collector-emitter breakdown voltage is not decreased. The link base layers between the intrinsic base layer and external base layers has a relatively low impurity concentration to suppress decrease in emitter-base junction breakdown voltage.
Inventors
- 👤 Kimiharu Uga
- 👤 Hiroki Honda
- 👤 Masahiro Ishida
- 👤 Yoshiyuki Ishigaki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 20:23
CPC Classifications
H; H10; H10D; H10D10/00; H10D10/01; H10D10/051; H10D10/40; H10D10/421; H10D62/00; H10D62/10; H10D62/17; H10D62/177
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
148 words
A method of fabricating a semiconductor device, comprising the steps of: (a) providing a semiconductor layer of a first conductivity type; (b) selectively forming an intrinsic base layer of a second conductivity type in an upper surface of said semiconductor layer; (c) forming a link base layer of the second conductivity type surrounding said intrinsic base layer in the upper surface of said semiconductor layer, the impurity concentration of said link base layer being lower than the impurity concentration of said intrinsic base layer; (d) forming an external base layer of the second conductivity type surrounding said link base layer in the upper surface of said semiconductor layer, the impurity concentration of said external base layer being higher than said impurity concentration of said intrinsic base layer; and (e) selectively forming an emitter layer of the first conductivity type in an upper surface of said intrinsic base layer.
Claim 2
Independent Claim
148 words
A method of fabricating a semiconductor device, comprising the steps of: (a) providing a semiconductor layer of a first conductivity type; (b) selectively forming an intrinsic base layer of a second conductivity type in an upper surface of said semiconductor layer; (c) forming a link base layer of the second conductivity type surrounding said intrinsic base layer in the upper surface of said semiconductor layer, the impurity concentration of said link base layer being lower than the impurity concentration of said intrinsic base layer; (d) forming an external base layer of the second conductivity type surrounding said link base layer in the upper surface of said semiconductor layer, the impurity concentration of said external base layer being higher than said impurity concentration of said intrinsic base layer; and (e) selectively forming an emitter layer of the first conductivity type in an upper surface of said intrinsic base layer.
Claim 3
Dependent Claim
81 words
The method of claim 1, wherein said step (d) includes the steps of: (d-1) selectively forming a first polycrystalline semiconductor layer having a first impurity of the second conductivity type on said semiconductor layer; (d-2) forming an opening in said first polycrystalline semiconductor layer, the remaining first polycrystalline semiconductor layer serving as an external base electrode; and (d-3) diffusing said first impurity from said external base electrode into the upper surface of said semiconductor layer to form said external base layer.
Claim 4
Dependent Claim
47 words
The method of claim 2, wherein said step (c) includes the steps of: (c-1) introducing a second impurity of the second conductivity type into the upper surface of said semiconductor layer exposed by said opening; and (c-2) diffusing said second impurity to form said link base layer.
Claim 5
Dependent Claim
48 words
The method of claim 3, wherein said step (c-1) includes the steps of: (c-1-1) forming a first oxide film on the upper surface of said semiconductor layer exposed by said opening; and (c-1-2) implanting ions of said second impurity into said semiconductor layer through said first oxide film.
Claim 6
Dependent Claim
75 words
The method of claim 4, wherein said step (b) includes the steps of: (b-1) forming a side wall on an end face of said external base electrode provided by said opening; (b-2) introducing a third impurity of the second conductivity type into an upper surface of said link base layer permitted to be exposed by said side wall and said external base electrode; and (b-3) diffusing said third impurity to form said intrinsic base layer.
Claim 7
Dependent Claim
32 words
The method of claim 5, wherein the formation of said side wall is accompanied by heat treatment, and wherein said steps (d-3) and (c-2) are carried out simultaneously by said heat treatment.
Claim 8
Dependent Claim
28 words
The method of claim 6, wherein said step (b-2) includes the step of (b-2-1) implanting ions of said third impurity at a dose larger than said second impurity.
Claim 9
Dependent Claim
58 words
The method of claim 7, wherein said step (e) includes the steps of: (e-1) forming a second polycrystalline semiconductor layer having a fourth impurity of the first conductivity type on said intrinsic base layer permitted to be exposed by said side wall and said external base electrode; and (e-2) diffusing said fourth impurity to form said emitter layer.
Claim 10
Dependent Claim
88 words
The method of claim 2, wherein said step (b) includes the steps of: (b-1) forming a side wall made from an insulating layer having a second impurity of the second conductivity type on an end face of said external base electrode provided by said opening; (b-2) introducing a third impurity of the second conductivity type into the upper surface of said semiconductor layer permitted to be exposed by said side wall and said external base electrode; and (b-3) diffusing said third impurity to form said intrinsic base layer.
Claim 11
Dependent Claim
32 words
The method of claim 9, wherein said step (c) includes the step of (c-1) diffusing said second impurity into the upper surface of said semiconductor layer to form said link base layer.
Claim 12
Dependent Claim
57 words
The method of claim 10, wherein said step (e) includes the steps of: (e-1) forming a second polycrystalline semiconductor layer having a fourth impurity of the first conductivity type on said semiconductor layer permitted to be exposed by said side wall and said external base electrode; and (e-2) diffusing said fourth impurity to form said emitter layer.
Claim 13
Dependent Claim
20 words
The method of claim 11, wherein said steps (d-3), (b-3), (c-1) and (e-2) are carried out simultaneously by heat treatment.
Claim 14
Dependent Claim
27 words
The method of claim 12, wherein said step (a) includes the step of (a-1) forming said semiconductor layer on a semiconductor substrate of the second conductivity type.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-01-01 | 1999-07-03 | 2000-01-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-01-01 | 2003-07-03 | 2004-01-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-01-01 | 2007-07-03 | 2008-01-02 | $7700.00 | Window Closed / Lapsed |