US5470764A
Expired / Lapsed
US
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Method of manufacturing a semiconductor device with hydrogen ion intercepting layer
Assignee: Renesas Electronics Corp
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Filing: 1994-05-23
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Granted: 1995-11-28
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Expires: 2014-05-23
Abstract
Abstract To manufacture a semiconductor device a first insulating oxide film and a second thicker insulating oxide film, which continues to the first insulating oxide film, are formed on a semiconductor substrate. The first and second insulating oxide films are covered by a polysilicon film selectively formed on a patterned nitride layer or formed over the semiconductor substrate. In the second case, a silicon nitride film is formed in the lowermost layer portion of the polysilicon film by implanting nitrogen ions and then applying a heat treatment. The polysilicon and silicon nitride films are patterned for forming first and second polysilicon resistance films on the first and second insulating oxide films, respectively. A first electrode is connected to the first polysilicon resistance film and a second electrode is connected to the second polysilicon resistance film. An insulating protection film formed over the semiconductor substrate covers the first and second polysilicon resistance films and the first and second electrodes.
Inventors
- 👤 Masaaki Ikegami
- 👤 Tetsuo Higuchi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 10:03
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/47; H10D84/00; H10D84/201; H10D84/204; H10D84/209
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
185 words
A manufacturing method of a semiconductor device comprising the steps of: forming a first insulating oxide film and a second insulating oxide film, which continues to said first insulating oxide film and has a thickness larger than that of said first insulating oxide film, on a semiconductor substrate; forming a polysilicon film, which covers said first and second insulating oxide film, on said semiconductor substrate; forming a silicon nitride layer in a lowermost layer portion of said polysilicon film by implanting nitrogen ions into said lowermost layer portion of said polysilicon film and then applying a heat treatment thereto; patterning said polysilicon film and said silicon nitride layer, for forming a first polysilicon resistance film and a second polysilicon resistance film on said first insulating oxide film and said second insulating oxide film, respectively; forming a first electrode connected to said first polysilicon resistance film and a second electrode connected to said second polysilicon resistance film; and forming an insulating protection film, which covers said first polysilicon resistance film, said second polysilicon resistance film, said first electrode and said second electrode, over said semiconductor substrate.
Claim 2
Dependent Claim
185 words
A manufacturing method of a semiconductor device comprising the steps of: forming a first insulating oxide film and a second insulating oxide film, which continues to said first insulating oxide film and has a thickness larger than that of said first insulating oxide film, on a semiconductor substrate; forming a polysilicon film, which covers said first and second insulating oxide film, on said semiconductor substrate; forming a silicon nitride layer in a lowermost layer portion of said polysilicon film by implanting nitrogen ions into said lowermost layer portion of said polysilicon film and then applying a heat treatment thereto; patterning said polysilicon film and said silicon nitride layer, for forming a first polysilicon resistance film and a second polysilicon resistance film on said first insulating oxide film and said second insulating oxide film, respectively; forming a first electrode connected to said first polysilicon resistance film and a second electrode connected to said second polysilicon resistance film; and forming an insulating protection film, which covers said first polysilicon resistance film, said second polysilicon resistance film, said first electrode and said second electrode, over said semiconductor substrate.
Claim 3
Dependent Claim
59 words
A method according to claim 1, wherein said step of forming said first polysilicon resistance film and said second polysilicon resistance film includes the steps of selectively etching said polysilicon film, using SF 4 gas plasma or CCl 4 gas plasma, and selectively etching said silicon nitride layer by mixed gas plasma using CF 4 and O 2 .
Claim 4
Dependent Claim
20 words
A method of manufacturing a semiconductor device according to claim 1, wherein said silicon nitride layer is approximately 30-100 nm.
Claim 5
Dependent Claim
27 words
A method of manufacturing a semiconductor device according to claim 1, further comprising implanting impurities in the polysilicon film to control the resistance of the polysilicon film.
Claim 6
Dependent Claim
34 words
A method of manufacturing a semiconductor device according to claim 1, wherein said nitrogen ions are implanted at 500 keV to 5 MeV and said heat treatment is applied at between 500-850 degrees centigrade.
Claim 7
Dependent Claim
34 words
A method of manufacturing a semiconductor device according to claim 1, wherein a bond is formed at an interface between said polysilicon film and said silicon nitride layer without impurities disposed at said interface.
Claim 8
Dependent Claim
180 words
A manufacturing method of a semiconductor device comprising the steps of: forming a first insulating oxide film and a second insulating oxide film, which continues to said first insulating oxide film and has a thickness larger than that of said first insulating oxide film, on a semiconductor substrate; forming a pattern of a first silicon nitride film and a pattern of a second silicon nitride film on said first insulating oxide film and said second insulating oxide film, respectively; growing a polysilicon film on each of said pattern of said first silicon nitride film and said pattern of said second silicon nitride film, thereby forming a first polysilicon resistance film and a second polysilicon resistance film over said first insulating oxide film and said second insulating oxide film, respectively; forming a first electrode connected to said first polysilicon resistance film and a second electrode connected to said second polysilicon resistance film; and forming an insulating protection film, which covers said first polysilicon resistance film, said second polysilicon resistance film, said first electrode and said second electrode, over said semiconductor substrate.
Claim 9
Dependent Claim
180 words
A manufacturing method of a semiconductor device comprising the steps of: forming a first insulating oxide film and a second insulating oxide film, which continues to said first insulating oxide film and has a thickness larger than that of said first insulating oxide film, on a semiconductor substrate; forming a pattern of a first silicon nitride film and a pattern of a second silicon nitride film on said first insulating oxide film and said second insulating oxide film, respectively; growing a polysilicon film on each of said pattern of said first silicon nitride film and said pattern of said second silicon nitride film, thereby forming a first polysilicon resistance film and a second polysilicon resistance film over said first insulating oxide film and said second insulating oxide film, respectively; forming a first electrode connected to said first polysilicon resistance film and a second electrode connected to said second polysilicon resistance film; and forming an insulating protection film, which covers said first polysilicon resistance film, said second polysilicon resistance film, said first electrode and said second electrode, over said semiconductor substrate.
Claim 10
Dependent Claim
53 words
A method of manufacturing a semiconductor device according to claim 7, wherein forming said pattern of said first silicon nitride film and said pattern of said second silicon nitride film includes the steps of subjecting said first and second silicon nitride films to photolithography, and etching said first and second silicon nitride films.
Claim 11
Dependent Claim
25 words
A method of manufacturing a semiconductor device according to claim 7, wherein polysilicon film is selectively grown using a silicon material containing a halogen element.
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