Off-line test circuit of a semiconnector integrated logic circuit

Claim 1

A semiconductor integrated logic circuit including: a functional macro circuit as an off-line test unit; first and second external input pins; first and second buffer circuits for an input interface, connected to said first and second external input pins, respectively; a third buffer circuit connected to said second buffer circuit; first and second external output pins; fourth and fifth buffer circuits for an output interface, connected to said first and second external output pins, respectively; a random logic circuit which receives signals from said first and second external input pins and supplies output signals through said fourth and fifth buffer circuits from said first and second external output pins; a test operation mode setting input pin for receiving a mode setting signal for an off-line test; a sixth buffer circuit for the input interface, connected to said test operation mode setting input pin; a first supply circuit which receives a signal from said second external input pin through said second buffer circuit and supplies the received signal to said random logic circuit; a second supply circuit for supplying an output signal of said functional macro circuit to said random logic circuit; a first selection circuit which receives the signal from said second external input pin through said second and third buffer circuits and also receives an output signal of said random logic circuit, said first selection circuit operating to select the output signal of said random logic circuit so as to supply the output signal of said random logic circuit to said functional macro circuit, when said mode setting signal indicates a normal operation mode, said first selection circuit also operating to select the signal of said second external input pin and to output the signal of said second external input pin to said functional macro circuit when said mode setting signal indicates a test operation mode; a second selection circuit which receives an output signal of said functional macro circuit through a seventh buffer circuit and also receives an output signal of said random logic circuit, said second selection circuit operating to select the output signal of said random logic circuit and to output the output signal of said random logic circuit to said second external output pin through said fifth buffer circuit when said mode setting signal indicates the normal operation mode, said second selection circuit operating to select an output signal of said functional macro circuit and to output the output signal of said functional macro circuit to said second external output pin when the mode setting signal indicates the test operation mode; wherein said first supply circuit comprises a first latch circuit for latching an output of said second buffer circuit just before a mode switching to the test operation mode is made valid in accordance with the mode setting signal, and said first latch circuit supplying a latched signal to said random logic circuit, and said second supply circuit comprises a second latch circuit for latching the output signal of said functional macro circuit just before a mode switching to the test operation mode in accordance with the mode setting signal, and said second latch circuit supplying a latched signal to said random logic circuit.