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US5392237A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory device with EEPROM in trench with polysilicon/metal contacting to source and drain in virtual ground type array

Assignee: Rohm Co Ltd
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Filing: 1993-07-27
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Granted: 1995-02-21
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Expires: 2013-07-27
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Abstract

Abstract Provided is a semiconductor memory device wherein nonvolatile memory elements are arranged in a matrix configuration, each of the memory elements having a field effect transistor including a floating gate, an interlayer insulating film and a control gate electrode which are stacked on an insulating film covering a semiconductor substrate, and a source region and a drain region which are respectively formed in the semiconductor substrate on both sides of the gate electrode, the floating gate, interlayer insulating film and control gate electrode being formed in a recess provided in the semiconductor substrate. The semiconductor device of such a structure is reduced in size and highly integrated with its high-performance characteristics maintained.

Inventors

  • 👤 Kunio Iida

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 14:50
CPC Classifications
H; H10; H10B; H10B69/00; G; G11; G11C; G11C16/00; G11C16/02; G11C16/04; G11C16/0408; G11C16/0416

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 122 words
A semiconductor memory device comprising: a plurality of nonvolatile memory elements arranged in a matrix configuration, each of the memory elements having a field effect transistor including a floating gate, an interlayer insulating film and a control gate electrode which are sequentially stacked on an insulating film covering a semiconductor substrate; a plurality of pairs of source and drain regions respectively formed in the semiconductor substrate on both sides of the gate electrode; polysilicon lines formed on the substrate, said polysilicon lines electrically connect the source regions; and polysilicon electrodes formed on the drain regions upon which metal lines are connected, wherein the floating gate, interlayer insulating film and control gate electrode being formed in a recess provided in the semiconductor substrate.
Claim 2
Dependent Claim 122 words
A semiconductor memory device comprising: a plurality of nonvolatile memory elements arranged in a matrix configuration, each of the memory elements having a field effect transistor including a floating gate, an interlayer insulating film and a control gate electrode which are sequentially stacked on an insulating film covering a semiconductor substrate; a plurality of pairs of source and drain regions respectively formed in the semiconductor substrate on both sides of the gate electrode; polysilicon lines formed on the substrate, said polysilicon lines electrically connect the source regions; and polysilicon electrodes formed on the drain regions upon which metal lines are connected, wherein the floating gate, interlayer insulating film and control gate electrode being formed in a recess provided in the semiconductor substrate.
Claim 3
Dependent Claim 77 words
The semiconductor memory device of claim 1, further comprising a plurality of three-layered polysilicon structures, each having a first polysilicon film forming a source line, from one of the polysilicon lines, arranged vertically or transversely, a second polysilicon film forming said floating gate of each of said memory elements, and a third polysilicon film forming a word line through which the control gate electrodes of the memory elements arranged vertically or transversely are connected with one another.
Claim 4
Dependent Claim 23 words
The semiconductor memory device of claim 2, wherein said first and/or third polysilicon films are of a three-layered structure of doped polysilicon-tungsten silicide-polysilicon.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-02-20 1998-08-22 1999-02-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-02-20 2002-08-22 2003-02-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-02-20 2006-08-22 2007-02-21 $7700.00 Window Closed / Lapsed

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